Degradation and reliability of GaInP, AlGaInP quantum well lasers:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Aachen
Mainz
2002
|
| Ausgabe: | 1. Aufl. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Zugl.: Stuttgart, Univ., Diss., 2002 |
| Beschreibung: | III, 160 S. graph. Darst. : 21 cm |
| ISBN: | 3896539949 |
Internformat
MARC
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| 100 | 1 | |a Fu, Liwei |d 1966- |e Verfasser |0 (DE-588)124527868 |4 aut | |
| 245 | 1 | 0 | |a Degradation and reliability of GaInP, AlGaInP quantum well lasers |c Liwei Fu |
| 250 | |a 1. Aufl. | ||
| 264 | 1 | |a Aachen |b Mainz |c 2002 | |
| 300 | |a III, 160 S. |b graph. Darst. : 21 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Zugl.: Stuttgart, Univ., Diss., 2002 | ||
| 650 | 0 | 7 | |a Quantenwell-Laser |0 (DE-588)4300724-7 |2 gnd |9 rswk-swf |
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| 650 | 0 | 7 | |a Indiumphosphid |0 (DE-588)4161535-9 |2 gnd |9 rswk-swf |
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| 689 | 0 | 0 | |a Galliumphosphid |0 (DE-588)4155879-0 |D s |
| 689 | 0 | 1 | |a Indiumphosphid |0 (DE-588)4161535-9 |D s |
| 689 | 0 | 2 | |a Aluminiumphosphid |0 (DE-588)4356927-4 |D s |
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| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-010022264 | |
Datensatz im Suchindex
| _version_ | 1808045347667181568 |
|---|---|
| adam_text |
CONTENTS
ZUSAMMENFASSUNG
2
PUBLICATIONS
7
1
INTRODUCTION
9
2
BASIC
PROPERTIES
OF
GALNP
QUANTUM
WELL
LASERS
13
2.1
THE
GALNP/ALGALNP
MATERIAL
SYSTEM
.
13
2.2
EPITAXIAL
STRUCTURE
OF
GALNP/ALGALNP
QUANTUM
WELL
LASERS
15
2.3
BASIC
OPTICAL
AND
ELECTRICAL
PROPERTIES
OF
GALNP
/
ALGALNP
LDS
.
17
2.3.1
RECOMBINATION
AND
CARRIER
LIFETIME
.
17
2.3.2
THRESHOLD
CONDITION
AND
OUTPUT
CHARACTERISTICS
.
18
2.3.3
LASER
RATE
EQUATIONS
.
23
'
2.3.4
CURRENT-VOLTAGE
CHARACTERISTICS
.
24
2.4
OPTICAL
GAIN
.
26
2.4.1
VALENCE
BAND
STRUCTURES
.
26
2.4.2
OPTICAL
GAIN
AND
SPONTANEOUS
EMISSION
SPECTRA
.
30
II
CONTENTS
3
REALIZATION
OF
HIGHLY
REFLECTIVE
(HR)
AND
ANTIREFLECTIVE
(AR)
COATINGS
32
3.1
REFLECTIVITY
OF
DIELECTRIC
COATINGS
.
33
3.1.1
CALCULATED
AR
SPECTRA
.
34
3.1.2
CALCULATED
HR
SPECTRA
.
35
3.2
CHARACTERIZATION
METHODS
.
38
3.2.1
SINGLE
WAVELENGTH
ELLIPSOMETER
.
38
3.2.2
WHITE
LIGHT
INTERFEROMETER
.
39
3.2.3
HAKKI-PAOLI
METHOD
.
41
3.3
SINZ
FILMS
DEPOSITED
BY
ECR-PECVD
SYSTEM
.
43
3.3.1
INTRODUCTION
TO
ECR-PECVD
SYSTEM
.
44
3.3.2
CHARACTERIZATION
OF
SIN^
FILMS
DEPOSITED
BY
ECR
PECVD
SYSTEM
.
45
3.3.3
EXPERIMENTAL
RESULTS
OF
HR
AND
AR-COATINGS
.
.
53
3.4
FILMS
DEPOSITED
BY
ELECTRON
BEAM
EVAPORATION
METHOD
.
54
4
ASYMMETRIC
MIRROR
FACET
STRUCTURE
56
4.1
INTRODUCTION
.
56
4.2
THRESHOLD
CONSIDERATIONS
.
58
4.3
ASYMMETRIC
FACET
COATING
RESULTS
.
60
4.3.1
HR
COATED
LDS
.
60
4.3.2
AR
COATED
LDS
.
63
4.3.3
COMPARISON
BETWEEN
EXPERIMENTAL
RESULTS
AND
THEORETICAL
GAIN-CURRENT
RELATION
.
64
4.3.4
OPTIMIZATION
OF
LASERS
THROUGH
HR/AR-COATINGS
66
5
FAILURE
BEHAVIOUR
OF
GALNP
LASER
DIODES
AND
FACET
PAS
SIVATION
69
5.1
INTRODUCTION
.
69
5.1.1
CATASTROPHIC
OPTICAL
DAMAGE
.
70
6.3.1
AGING
TEST
RESULTS
.
124
6.3.2
DIFFUSION
OF
MG
.
125
6.3.3
CHANGE
IN
LASER
OPERATION
PARAMETERS
.
128
6.3.4
CHANGE
IN
SERIES
RESISTANCE
.
129
6.3.5
CHANGE
IN
LASING
WAVELENGTH
.
131
6.4
SUMMARY
.
131
A
EPITAXIAL
CRYSTAL
STRUCTURE
134
B
TRANSFER
MATRIX
METHOD
136
C
WORKING
PRINCIPLE
OF
NULLING
ELLIPSOMETER
141
D
DEVICE
FABRICATION
PROCEDURE
145
E
PARAMETERS
FOR
GALNP/ALGALNP
MATERIALS
148
REFERENCE
150
RESUME
159
THANKS
161
CONTENTS
III
5.1.2
FACET
RESISTANCE
.
72
5.2
FACET
FAILURE
OF
LASERS
WITHOUT
COATING
.
75
5.2.1
FAILURE
OF
LASERS
WITH
PERFECT
FACETS
.
76
5.2.2
FAILURE
OF
LASERS
WITH
NONPERFECT
FACETS
.
78
5.3
LASERS
FACET-COATED
WITH
AL
FILMS
.
80
5.3.1
WITHOUT
BUFFER
LAYER
BETWEEN
FACET
AND
AL
FILM
.
80
5.3.2
AL
AS
HR-COATING
WITH
A
BUFFER
LAYER
.
82
5.4
FACET-PASSIVATION
EFFECT
OF
AI2O3,
TIC 2
AND
SICH
FILMS
.
85
5.4.1
OUTPUT
CHARACTERISTICS
OF
FACET-COATED
LASERS
.
85
5.4.2
INFLUENCE
OF
PULSE
WIDTH
ON
P-I
CHARACTERISTICS
OF
FACET-COATED
LASERS
.
88
5.4.3
CALCULATION
OF
FACET
TEMPERATURE
.
90
5.5
LASERS
FACET-COATED
WITH
SIN
FILMS
.
92
5.5.1
PASSIVATION
OF
SURFACE
STATES
.
93
5.5.2
INFLUENCE
OF
ELECTRICAL
CHARACTERISTICS
OF
SIN^
FILMS
97
5.5.3
INFLUENCE
OF
FILM
STRESS
.
99
5.5.4
PLASMA
DAMAGE
.
101
5.6
SUMMARY
.
102
6
RELIABILITY
OF
GALNP
LASER
DIODES
104
6.1
INTRODUCTION
.
104
6.2
RELIABILITY
OF
670
NM
LASERS
.
106
6.2.1
AGING
TEST
RESULTS
IN
APC
MODE
.
106
6.2.2
CHANGE
IN
LASER
OPERATION
PARAMETERS
.
109
6.2.3
CHANGE
IN
CURRENT-VOLTAGE
CHARACTERISTICS
.
112
6.2.4
CHANGE
IN
SERIES
RESISTANCE
.
115
6.2.5
CHANGE
IN
LASING
WAVELENGTH
.
116
6.2.6
GRADUAL
DEGRADATION
.
121
6.3
RELIABILITY
OF
630
NM
LASERS
.
123 |
| any_adam_object | 1 |
| author | Fu, Liwei 1966- |
| author_GND | (DE-588)124527868 |
| author_facet | Fu, Liwei 1966- |
| author_role | aut |
| author_sort | Fu, Liwei 1966- |
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| bvnumber | BV014811663 |
| ctrlnum | (OCoLC)53020963 (DE-599)BVBBV014811663 |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV014811663 |
| illustrated | Illustrated |
| indexdate | 2024-08-22T00:26:50Z |
| institution | BVB |
| isbn | 3896539949 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010022264 |
| oclc_num | 53020963 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | III, 160 S. graph. Darst. : 21 cm |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Mainz |
| record_format | marc |
| spelling | Fu, Liwei 1966- Verfasser (DE-588)124527868 aut Degradation and reliability of GaInP, AlGaInP quantum well lasers Liwei Fu 1. Aufl. Aachen Mainz 2002 III, 160 S. graph. Darst. : 21 cm txt rdacontent n rdamedia nc rdacarrier Zugl.: Stuttgart, Univ., Diss., 2002 Quantenwell-Laser (DE-588)4300724-7 gnd rswk-swf Degradation Technik (DE-588)4206992-0 gnd rswk-swf Indiumphosphid (DE-588)4161535-9 gnd rswk-swf Galliumphosphid (DE-588)4155879-0 gnd rswk-swf Aluminiumphosphid (DE-588)4356927-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Galliumphosphid (DE-588)4155879-0 s Indiumphosphid (DE-588)4161535-9 s Aluminiumphosphid (DE-588)4356927-4 s Quantenwell-Laser (DE-588)4300724-7 s Degradation Technik (DE-588)4206992-0 s DE-604 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010022264&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Fu, Liwei 1966- Degradation and reliability of GaInP, AlGaInP quantum well lasers Quantenwell-Laser (DE-588)4300724-7 gnd Degradation Technik (DE-588)4206992-0 gnd Indiumphosphid (DE-588)4161535-9 gnd Galliumphosphid (DE-588)4155879-0 gnd Aluminiumphosphid (DE-588)4356927-4 gnd |
| subject_GND | (DE-588)4300724-7 (DE-588)4206992-0 (DE-588)4161535-9 (DE-588)4155879-0 (DE-588)4356927-4 (DE-588)4113937-9 |
| title | Degradation and reliability of GaInP, AlGaInP quantum well lasers |
| title_auth | Degradation and reliability of GaInP, AlGaInP quantum well lasers |
| title_exact_search | Degradation and reliability of GaInP, AlGaInP quantum well lasers |
| title_full | Degradation and reliability of GaInP, AlGaInP quantum well lasers Liwei Fu |
| title_fullStr | Degradation and reliability of GaInP, AlGaInP quantum well lasers Liwei Fu |
| title_full_unstemmed | Degradation and reliability of GaInP, AlGaInP quantum well lasers Liwei Fu |
| title_short | Degradation and reliability of GaInP, AlGaInP quantum well lasers |
| title_sort | degradation and reliability of gainp algainp quantum well lasers |
| topic | Quantenwell-Laser (DE-588)4300724-7 gnd Degradation Technik (DE-588)4206992-0 gnd Indiumphosphid (DE-588)4161535-9 gnd Galliumphosphid (DE-588)4155879-0 gnd Aluminiumphosphid (DE-588)4356927-4 gnd |
| topic_facet | Quantenwell-Laser Degradation Technik Indiumphosphid Galliumphosphid Aluminiumphosphid Hochschulschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010022264&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT fuliwei degradationandreliabilityofgainpalgainpquantumwelllasers |