Nanotribology: critical assessment and research needs
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Boston [u.a.]
Kluwer Academic Publishers
2003
|
Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | xi, 442 p. ill. : 25 cm |
ISBN: | 1402072988 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV014758182 | ||
003 | DE-604 | ||
005 | 20060912 | ||
007 | t | ||
008 | 020925s2003 xxua||| |||| 10||| eng d | ||
010 | |a 2002034092 | ||
020 | |a 1402072988 |9 1-4020-7298-8 | ||
035 | |a (OCoLC)50669510 | ||
035 | |a (DE-599)BVBBV014758182 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
044 | |a xxu |c US | ||
049 | |a DE-11 | ||
050 | 0 | |a TJ1075.A2 | |
082 | 0 | |a 621.8/9 |2 21 | |
084 | |a ZN 3700 |0 (DE-625)157333: |2 rvk | ||
084 | |a ZN 4980 |0 (DE-625)157428: |2 rvk | ||
245 | 1 | 0 | |a Nanotribology |b critical assessment and research needs |c ed. by Stephen M. Hsu ... |
264 | 1 | |a Boston [u.a.] |b Kluwer Academic Publishers |c 2003 | |
300 | |a xi, 442 p. |b ill. : 25 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Includes bibliographical references and index | ||
650 | 4 | |a Microelectromechanical systems |v Congresses | |
650 | 4 | |a Nanotechnology |v Congresses | |
650 | 4 | |a Tribology |v Congresses | |
650 | 0 | 7 | |a Mikromechanik |0 (DE-588)4205811-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Tribologie |0 (DE-588)4060847-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektromechanik |0 (DE-588)4151846-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Nanotechnologie |0 (DE-588)4327470-5 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2000 |z Gaithersburg Md. |2 gnd-content | |
689 | 0 | 0 | |a Mikromechanik |0 (DE-588)4205811-9 |D s |
689 | 0 | 1 | |a Elektromechanik |0 (DE-588)4151846-9 |D s |
689 | 0 | 2 | |a Nanotechnologie |0 (DE-588)4327470-5 |D s |
689 | 0 | 3 | |a Tribologie |0 (DE-588)4060847-5 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Hsu, Stephen M. |e Sonstige |4 oth | |
700 | 1 | |a Ying, Z. Charles |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009994100 |
Datensatz im Suchindex
_version_ | 1804129483231330304 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV014758182 |
callnumber-first | T - Technology |
callnumber-label | TJ1075 |
callnumber-raw | TJ1075.A2 |
callnumber-search | TJ1075.A2 |
callnumber-sort | TJ 41075 A2 |
callnumber-subject | TJ - Mechanical Engineering and Machinery |
classification_rvk | ZN 3700 ZN 4980 |
ctrlnum | (OCoLC)50669510 (DE-599)BVBBV014758182 |
dewey-full | 621.8/9 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.8/9 |
dewey-search | 621.8/9 |
dewey-sort | 3621.8 19 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01773nam a2200505zc 4500</leader><controlfield tag="001">BV014758182</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060912 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020925s2003 xxua||| |||| 10||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2002034092</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1402072988</subfield><subfield code="9">1-4020-7298-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)50669510</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014758182</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TJ1075.A2</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.8/9</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 3700</subfield><subfield code="0">(DE-625)157333:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4980</subfield><subfield code="0">(DE-625)157428:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Nanotribology</subfield><subfield code="b">critical assessment and research needs</subfield><subfield code="c">ed. by Stephen M. Hsu ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston [u.a.]</subfield><subfield code="b">Kluwer Academic Publishers</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xi, 442 p.</subfield><subfield code="b">ill. : 25 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectromechanical systems</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanotechnology</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Tribology</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikromechanik</subfield><subfield code="0">(DE-588)4205811-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Tribologie</subfield><subfield code="0">(DE-588)4060847-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektromechanik</subfield><subfield code="0">(DE-588)4151846-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanotechnologie</subfield><subfield code="0">(DE-588)4327470-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2000</subfield><subfield code="z">Gaithersburg Md.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikromechanik</subfield><subfield code="0">(DE-588)4205811-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektromechanik</subfield><subfield code="0">(DE-588)4151846-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Nanotechnologie</subfield><subfield code="0">(DE-588)4327470-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Tribologie</subfield><subfield code="0">(DE-588)4060847-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hsu, Stephen M.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ying, Z. Charles</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009994100</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 2000 Gaithersburg Md. gnd-content |
genre_facet | Konferenzschrift 2000 Gaithersburg Md. |
id | DE-604.BV014758182 |
illustrated | Illustrated |
indexdate | 2024-07-09T19:05:51Z |
institution | BVB |
isbn | 1402072988 |
language | English |
lccn | 2002034092 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009994100 |
oclc_num | 50669510 |
open_access_boolean | |
owner | DE-11 |
owner_facet | DE-11 |
physical | xi, 442 p. ill. : 25 cm |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Kluwer Academic Publishers |
record_format | marc |
spelling | Nanotribology critical assessment and research needs ed. by Stephen M. Hsu ... Boston [u.a.] Kluwer Academic Publishers 2003 xi, 442 p. ill. : 25 cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Microelectromechanical systems Congresses Nanotechnology Congresses Tribology Congresses Mikromechanik (DE-588)4205811-9 gnd rswk-swf Tribologie (DE-588)4060847-5 gnd rswk-swf Elektromechanik (DE-588)4151846-9 gnd rswk-swf Nanotechnologie (DE-588)4327470-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Gaithersburg Md. gnd-content Mikromechanik (DE-588)4205811-9 s Elektromechanik (DE-588)4151846-9 s Nanotechnologie (DE-588)4327470-5 s Tribologie (DE-588)4060847-5 s DE-604 Hsu, Stephen M. Sonstige oth Ying, Z. Charles Sonstige oth |
spellingShingle | Nanotribology critical assessment and research needs Microelectromechanical systems Congresses Nanotechnology Congresses Tribology Congresses Mikromechanik (DE-588)4205811-9 gnd Tribologie (DE-588)4060847-5 gnd Elektromechanik (DE-588)4151846-9 gnd Nanotechnologie (DE-588)4327470-5 gnd |
subject_GND | (DE-588)4205811-9 (DE-588)4060847-5 (DE-588)4151846-9 (DE-588)4327470-5 (DE-588)1071861417 |
title | Nanotribology critical assessment and research needs |
title_auth | Nanotribology critical assessment and research needs |
title_exact_search | Nanotribology critical assessment and research needs |
title_full | Nanotribology critical assessment and research needs ed. by Stephen M. Hsu ... |
title_fullStr | Nanotribology critical assessment and research needs ed. by Stephen M. Hsu ... |
title_full_unstemmed | Nanotribology critical assessment and research needs ed. by Stephen M. Hsu ... |
title_short | Nanotribology |
title_sort | nanotribology critical assessment and research needs |
title_sub | critical assessment and research needs |
topic | Microelectromechanical systems Congresses Nanotechnology Congresses Tribology Congresses Mikromechanik (DE-588)4205811-9 gnd Tribologie (DE-588)4060847-5 gnd Elektromechanik (DE-588)4151846-9 gnd Nanotechnologie (DE-588)4327470-5 gnd |
topic_facet | Microelectromechanical systems Congresses Nanotechnology Congresses Tribology Congresses Mikromechanik Tribologie Elektromechanik Nanotechnologie Konferenzschrift 2000 Gaithersburg Md. |
work_keys_str_mv | AT hsustephenm nanotribologycriticalassessmentandresearchneeds AT yingzcharles nanotribologycriticalassessmentandresearchneeds |