An introduction to surface analysis by XPS and AES:
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Chichester
Wiley
2003
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Schlagworte: | |
Beschreibung: | Angekündigt u.d.T.: Watts, John F.: An introduction to surface analysis by electron spectroscopy. - New ed. |
Beschreibung: | X, 212 S. Ill., graph. Darst. |
ISBN: | 0470847131 0470847123 |
Internformat
MARC
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245 | 1 | 0 | |a An introduction to surface analysis by XPS and AES |c John F. Watts ; John Wolstenholme |
246 | 1 | 3 | |a An introduction to surface analysis by electron spectroscopy |
264 | 1 | |a Chichester |b Wiley |c 2003 | |
300 | |a X, 212 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
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338 | |b nc |2 rdacarrier | ||
500 | |a Angekündigt u.d.T.: Watts, John F.: An introduction to surface analysis by electron spectroscopy. - New ed. | ||
650 | 4 | |a Electron spectroscopy | |
650 | 4 | |a Surfaces (Technology) |x Analysis | |
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Datensatz im Suchindex
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any_adam_object | |
author | Watts, John F. Wolstenholme, John |
author_facet | Watts, John F. Wolstenholme, John |
author_role | aut aut |
author_sort | Watts, John F. |
author_variant | j f w jf jfw j w jw |
building | Verbundindex |
bvnumber | BV014695407 |
callnumber-first | T - Technology |
callnumber-label | TP156 |
callnumber-raw | TP156.S95 |
callnumber-search | TP156.S95 |
callnumber-sort | TP 3156 S95 |
callnumber-subject | TP - Chemical Technology |
classification_rvk | UP 7500 UP 9000 VG 9700 |
classification_tum | PHY 160f PHY 116f WER 770f |
ctrlnum | (OCoLC)51053895 (DE-599)BVBBV014695407 |
dewey-full | 620/.44 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620/.44 |
dewey-search | 620/.44 |
dewey-sort | 3620 244 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Chemie / Pharmazie Physik Werkstoffwissenschaften |
format | Book |
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id | DE-604.BV014695407 |
illustrated | Illustrated |
indexdate | 2024-07-09T19:05:13Z |
institution | BVB |
isbn | 0470847131 0470847123 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009967342 |
oclc_num | 51053895 |
open_access_boolean | |
owner | DE-20 DE-703 DE-91G DE-BY-TUM DE-1043 DE-11 |
owner_facet | DE-20 DE-703 DE-91G DE-BY-TUM DE-1043 DE-11 |
physical | X, 212 S. Ill., graph. Darst. |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Wiley |
record_format | marc |
spelling | Watts, John F. Verfasser aut An introduction to surface analysis by XPS and AES John F. Watts ; John Wolstenholme An introduction to surface analysis by electron spectroscopy Chichester Wiley 2003 X, 212 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Angekündigt u.d.T.: Watts, John F.: An introduction to surface analysis by electron spectroscopy. - New ed. Electron spectroscopy Surfaces (Technology) Analysis Auger-Spektroskopie (DE-588)4122843-1 gnd rswk-swf Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Elektronenspektroskopie (DE-588)4014332-6 s DE-604 Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 s Auger-Spektroskopie (DE-588)4122843-1 s Wolstenholme, John Verfasser aut |
spellingShingle | Watts, John F. Wolstenholme, John An introduction to surface analysis by XPS and AES Electron spectroscopy Surfaces (Technology) Analysis Auger-Spektroskopie (DE-588)4122843-1 gnd Elektronenspektroskopie (DE-588)4014332-6 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
subject_GND | (DE-588)4122843-1 (DE-588)4014332-6 (DE-588)4076787-5 (DE-588)4172243-7 |
title | An introduction to surface analysis by XPS and AES |
title_alt | An introduction to surface analysis by electron spectroscopy |
title_auth | An introduction to surface analysis by XPS and AES |
title_exact_search | An introduction to surface analysis by XPS and AES |
title_full | An introduction to surface analysis by XPS and AES John F. Watts ; John Wolstenholme |
title_fullStr | An introduction to surface analysis by XPS and AES John F. Watts ; John Wolstenholme |
title_full_unstemmed | An introduction to surface analysis by XPS and AES John F. Watts ; John Wolstenholme |
title_short | An introduction to surface analysis by XPS and AES |
title_sort | an introduction to surface analysis by xps and aes |
topic | Electron spectroscopy Surfaces (Technology) Analysis Auger-Spektroskopie (DE-588)4122843-1 gnd Elektronenspektroskopie (DE-588)4014332-6 gnd Röntgen-Photoelektronenspektroskopie (DE-588)4076787-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
topic_facet | Electron spectroscopy Surfaces (Technology) Analysis Auger-Spektroskopie Elektronenspektroskopie Röntgen-Photoelektronenspektroskopie Oberflächenanalyse |
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