High-resolution electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2003
|
| Ausgabe: | 3. ed. |
| Schriftenreihe: | Monographs on the physics and chemistry of materials
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy |
| Beschreibung: | XVI, 401 S. Ill., graph. Darst. |
| ISBN: | 0198509154 |
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Datensatz im Suchindex
| _version_ | 1804129409526923264 |
|---|---|
| adam_text | HIGH-RESOLUTION ELECTRON MICROSCOPY THIRD EDITION JOHN C. H. SPENCE
DEPARTMENT OF PHYSICS AND ASTRONOMY ARIZONA STATE UNIVERSITY OXFORD
UNIVERSITY PRESS CONTENTS 1 PRELIMINARIES 1 1.1 ELEMENTARY PRINCIPLES OF
PHASE-CONTRAST MICROSCOPY 2 1.2 INSTRUMENTAL REQUIREMENTS AND
MODIFICATIONS FOR HIGH-RESOLUTION WORK 9 1.3 FIRST EXPERIMENTS 11
REFERENCES 14 ELECTRON OPTICS 15 2.1 THE ELECTRON WAVELENGTH AND
RELATIVITY 16 2.2 SIMPLE LENS PROPERTIES 18 2.3 THE PARAXIAL RAY
EQUATION 25 2.4 THE CONSTANT-FIELD APPROXIMATION 27 2.5 PROJECTOR LENSES
28 2.6 THE OBJECTIVE LENS 31 2.7 PRACTICAL LENS DESIGN 33 2.8
ABERRATIONS 36 2.9 THEPRE-FIELD 45 REFERENCES 46 3 WAVE OPTICS 48 3.1
PROPAGATION AND FRESNEL DIFFRACTION 49 3.2 LENS ACTION AND THE
DIFFRACTION LIMIT 52 3.3 WAVE AND RAY ABERRATIONS , 57 3.4 STRONG-PHASE
AND WEAK-PHASE OBJECTS 61 3.5 OPTICAL AND DIGITAL DIFFRACTOGRAMS 63
REFERENCES 65 COHERENCE AND FOURIER OPTICS 67 4.1 INDEPENDENT ELECTRONS
AND COMPUTED IMAGES 69 4.2 COHERENT AND INCOHERENT IMAGES AND THE
DAMPING ENVELOPES 71 4.3 THE CHARACTERIZATION OF COHERENCE 77 4.4
SPATIAL COHERENCE USING HOLLOW-CONE ILLUMINATION 80 4.5 THE EFFECT OF
SOURCE SIZE ON COHERENCE 82 4.6 COHERENCE REQUIREMENTS IN PRACTICE 84
REFERENCES 87 XIV CONTENTS 5 HIGH-RESOLUTION IMAGES OF CRYSTALS AND
THEIR DEFECTS 89 5.1 THE EFFECT OF LENS ABERRATIONS ON SIMPLE LATTICE
FRINGES 90 5.2 THE EFFECT OF BEAM DIVERGENCE ON DEPTH OF FIELD FOR
SIMPLE FRINGES 94 5.3 APPROXIMATIONS FOR THE DIFFRACTED AMPLITUDES 97
5.4 IMAGES OF CRYSTALS WITH VARIABLE SPACING*SPINODAL DECOMPOSITION AND
MODULATED STRUCTURES 104 5.5 ARE THE ATOM IMAGES BLACK OR WHITE? A
SIMPLE SYMMETRY ARGUMENT 106 5.6 THE MULTISLICE METHOD AND THE
POLYNOMIAL SOLUTION 107 5.7 BLOCH WAVE METHODS, BOUND STATES AND
SYMMETRY REDUCTION OF THE DISPERSION MATRIX 110 5.8 PARTIAL COHERENCE
EFFECTS IN DYNAMICAL COMPUTATIONS* BEYOND THE PRODUCT REPRESENTATION.
FOURIER IMAGES 116 5.9 ABSORPTION EFFECTS 118 5.10 DYNAMICAL FORBIDDEN
REFLECTIONS 121 5.11 COMPUTATIONAL ALGORITHMS AND THE RELATIONSHIP
BETWEEN THEM. SUPERCELLS AND IMAGE PATCHING 125 5.12 SIGN CONVENTIONS
130 5.13 TESTING IMAGE-SIMULATION PROGRAMS. THE ACCURACY OF ATOM
POSITION DETERMINATIONS 132 5.14 IMAGE INTERPRETATION IN GERMANIUM*A
CASE STUDY 134 5.15 IMAGES OF DEFECTS IN CRYSTALLINE SOLIDS. HREM
TOMOGRAPHY 139 REFERENCES 150 HREM IN BIOLOGY, ORGANIC CRYSTALS, AND
RADIATION DAMAGE 156 6.1 PHASE AND AMPLITUDE CONTRAST 156 6.2 SINGLE
ATOMS IN BRIGHT FIELD . 160 6.3 THE USE OF HIGHER ACCELERATING VOLTAGE
168 6.4 CONTRAST AND ATOMIC NUMBER 171 6.5 DARK-FIELD METHODS 173 6.6
INELASTIC SCATTERING 177 6.7 MOLECULAR IMAGE SIMULATION 181 6.8 NOISE,
INFORMATION AND THE ROSE EQUATION 182 6.9 MOLECULAR IMAGING IN THREE
DIMENSIONS*ELECTRON TOMOGRAPHY 186 6.10 ELECTRON CRYSTALLOGRAPHY OF
TWO-DIMENSIONAL MEMBRANE PROTEIN CRYSTALS 192 6.11 ORGANIC CRYSTALS 195
6.12 RADIATION DAMAGE. ORGANICS 196 6.13 RADIATION DAMAGE. INORGANICS
200 REFERENCES 201 CONTENTS 7 IMAGE PROCESSING AND SUPER-RESOLUTION
SCHEMES 207 7.1 THROUGH-FOCUS SERIES. COHERENT DETECTION. OPTIMIZATION.
ERROR METRICS 207 7.2 TILT SERIES, APERTURE SYNTHESIS 214 7.3 OFF-AXIS
ELECTRON HOLOGRAPHY FOR HREM 214 7.4 ABERRATION CORRECTION . 216 7.5
COMBINING DIFFRACTION AND IMAGE INFORMATION 221 7.6 PTYCHOGRAPHY,
RONCHIGRAMS, SHADOW IMAGING, AND IN-LINE HOLOGRAPHY 225 7.7 DIRECT
INVERSION FROM DIFFRACTION PATTERNS 230 7.8 ATOM LENSES 230 7.9 INTERNAL
SOURCE HOLOGRAPHY, HIO AND HOLOGRAPHIC ALCHEMI 231 REFERENCES 232 8 STEM
AND Z-CONTRAST 237 8.1 INTRODUCTION. LATTICE IMAGING IN STEM 237 8.2
COHERENCE FUNCTIONS IN STEM 245 8.3 DARK-FIELD STEM. INCOHERENT IMAGING.
RESOLUTION LIMITS 247 8.4 MULTIPLE ELASTIC SCATTERING IN STEM.
CHANNELLING 254 8.5 STEM Z-CONTRAST. TDS. 3-D STEM TOMOGRAPHY 256
REFERENCES 261 9 ELECTRON SOURCES AND DETECTORS 264 9.1 THE ILLUMINATION
SYSTEM 265 9.2 BRIGHTNESS MEASUREMENT 267 9.3 BIASING AND HIGH-VOLTAGE
STABILITY 270 9.4 HAIR-PIN FILAMENTS 273 9.5 LANTHANUM HEXABORIDE
SOURCES 274 9.6 FIELD-EMISSION SOURCES. DEGENERACY 275 9.7 DETECTORS.
THE CHARGED-COUPLED.DEVICE (CCD) CAMERA 277 9.8 IMAGE PLATES 280 9.9
FILM 282 9.10 VIDEO CAMERAS AND INTENSIFIERS 283 REFERENCES 284 10
MEASUREMENT OF ELECTRON-OPTICAL PARAMETERS 286 10.1 OBJECTIVE-LENS FOCUS
INCREMENTS 286 10.2 SPHERICAL ABERRATION CONSTANT 288 10.3 MAGNIFICATION
CALIBRATION 290 10.4 OBJECTIVE-LENS CURRENT MEASUREMENT 293 10.5
CHROMATIC ABERRATION CONSTANT 293 10.6 ASTIGMATIC DIFFERENCE. THREE-FOLD
ASTIGMATISM 294 10.7 DIFFRACTOGRAM MEASUREMENTS 295 XVI CONTENTS 10.8
LATERAL COHERENCE 298 10.9 ELECTRON WAVELENGTH AND CAMERA LENGTH 301
10.10 RESOLUTION 301 REFERENCES 305 11 INSTABILITIES AND THE MICROSCOPE
ENVIRONMENT . 307 11.1 MAGNETIC FIELDS 307 11.2 HIGH-VOLTAGE INSTABILITY
310 11.3 VIBRATION 311 11.4 SPECIMEN MOVEMENT 312 11.5 CONTAMINATION AND
THE VACUUM SYSTEM 314 11.6 PRESSURE, TEMPERATURE AND DRAFTS 316
REFERENCES 316 12 EXPERIMENTAL METHODS 318 12.1 ASTIGMATISM CORRECTION
319 12.2 TAKING THE PICTURE 320 12.3 FINDING AND RECORDING LATTICE
FRINGES*AN EXAMPLE 323 12.4 ADJUSTING THE CRYSTAL ORIENTATION USING
NON-EUCENTRIC SPECIMEN HOLDERS 330 12.5 FOCUSING TECHNIQUES AND
AUTO-TUNING 333 12.6 SUBSTRATE FILMS 336 12.7 PHOTOGRAPHIC TECHNIQUES
AND MICROGRAPH EXAMINATION 338 12.8 ANCILLARY INSTRUMENTATION FOR HREM .
340 12.9 A CHECKLIST FOR HIGH-RESOLUTION WORK 341 REFERENCES 342 13
ASSOCIATED TECHNIQUES 344 13.1 X-RAY MICROANALYSIS AND ALCHEMF 345 13.2
ELECTRON ENERGY LOSS SPECTROSCOPY (EELS) IN STEM 352 13.3 ELECTRON
MICRODIFFRACTION AND CBED 357 13.4 CATHODOLUMINESCENCE IN STEM 364 13.5
ENVIRONMENTAL HREM, HREM OF SURFACES, HOLOGRAPHY OF FIELDS AND IN-SITU
MANIPULATION 368 REFERENCES 372 APPENDICES 377 INDEX 394
|
| any_adam_object | 1 |
| author | Spence, John C. |
| author_facet | Spence, John C. |
| author_role | aut |
| author_sort | Spence, John C. |
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| building | Verbundindex |
| bvnumber | BV014651515 |
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| callnumber-search | QH212.T7 |
| callnumber-sort | QH 3212 T7 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)50323104 (DE-599)BVBBV014651515 |
| dewey-full | 502/.8/25 |
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| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
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| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 3. ed. |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T19:04:41Z |
| institution | BVB |
| isbn | 0198509154 |
| language | English |
| lccn | 2002030302 |
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| physical | XVI, 401 S. Ill., graph. Darst. |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series2 | Monographs on the physics and chemistry of materials |
| spelling | Spence, John C. Verfasser aut High-resolution electron microscopy John C. H. Spence 3. ed. Oxford [u.a.] Oxford Univ. Press 2003 XVI, 401 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy High resolution electron microscopy Festkörper (DE-588)4016918-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 Struktur (DE-588)4058125-1 s 2\p DE-604 Festkörper (DE-588)4016918-2 s 3\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 4\p DE-604 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009945435&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Spence, John C. High-resolution electron microscopy High resolution electron microscopy Festkörper (DE-588)4016918-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd |
| subject_GND | (DE-588)4016918-2 (DE-588)4014327-2 (DE-588)4287503-1 (DE-588)4215608-7 (DE-588)4058125-1 (DE-588)4151862-7 |
| title | High-resolution electron microscopy |
| title_auth | High-resolution electron microscopy |
| title_exact_search | High-resolution electron microscopy |
| title_full | High-resolution electron microscopy John C. H. Spence |
| title_fullStr | High-resolution electron microscopy John C. H. Spence |
| title_full_unstemmed | High-resolution electron microscopy John C. H. Spence |
| title_short | High-resolution electron microscopy |
| title_sort | high resolution electron microscopy |
| topic | High resolution electron microscopy Festkörper (DE-588)4016918-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Struktur (DE-588)4058125-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd |
| topic_facet | High resolution electron microscopy Festkörper Elektronenmikroskopie Hochauflösendes Verfahren Durchstrahlungselektronenmikroskopie Struktur Elektronenbeugung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009945435&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT spencejohnc highresolutionelectronmicroscopy |