Deterministic built-in self-test with guaranteed test quality and low overhead:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Düsseldorf
VDI-Verl.
2002
|
| Ausgabe: | Als Ms. gedr. |
| Schriftenreihe: | Fortschritt-Berichte VDI
Reihe 20, Rechnerunterstützte Verfahren ; 347 |
| Schlagworte: | |
| Beschreibung: | X, 127 S. graph. Darst. |
| ISBN: | 3183347202 |
Internformat
MARC
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| 100 | 1 | |a Kiefer, Gundolf |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Deterministic built-in self-test with guaranteed test quality and low overhead |c Gundolf Kiefer, Aachen |
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| 490 | 1 | |a Fortschritt-Berichte VDI : Reihe 20, Rechnerunterstützte Verfahren |v 347 | |
| 490 | 0 | |a Berichte der GI-GMM-ITG-Kooperationsgemeinschaft rechnergestützer Schaltungs- und Systementwurf | |
| 502 | |a Zugl.: Siegen, Univ., Diss. | ||
| 650 | 0 | 7 | |a Built-in self test |0 (DE-588)4516486-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testmustergenerator |0 (DE-588)4210166-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Logiksynthese |0 (DE-588)4348178-4 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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| author | Kiefer, Gundolf |
| author_facet | Kiefer, Gundolf |
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| bvnumber | BV014582519 |
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| edition | Als Ms. gedr. |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV014582519 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:03:53Z |
| institution | BVB |
| isbn | 3183347202 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009913529 |
| oclc_num | 248108867 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM DE-210 DE-83 DE-634 |
| owner_facet | DE-91G DE-BY-TUM DE-210 DE-83 DE-634 |
| physical | X, 127 S. graph. Darst. |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | VDI-Verl. |
| record_format | marc |
| series | Fortschritt-Berichte VDI |
| series2 | Fortschritt-Berichte VDI : Reihe 20, Rechnerunterstützte Verfahren Berichte der GI-GMM-ITG-Kooperationsgemeinschaft rechnergestützer Schaltungs- und Systementwurf |
| spelling | Kiefer, Gundolf Verfasser aut Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen Als Ms. gedr. Düsseldorf VDI-Verl. 2002 X, 127 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Fortschritt-Berichte VDI : Reihe 20, Rechnerunterstützte Verfahren 347 Berichte der GI-GMM-ITG-Kooperationsgemeinschaft rechnergestützer Schaltungs- und Systementwurf Zugl.: Siegen, Univ., Diss. Built-in self test (DE-588)4516486-1 gnd rswk-swf Testmustergenerator (DE-588)4210166-9 gnd rswk-swf Logiksynthese (DE-588)4348178-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Built-in self test (DE-588)4516486-1 s Logiksynthese (DE-588)4348178-4 s Testmustergenerator (DE-588)4210166-9 s DE-604 Fortschritt-Berichte VDI Reihe 20, Rechnerunterstützte Verfahren ; 347 (DE-604)BV021786833 347 |
| spellingShingle | Kiefer, Gundolf Deterministic built-in self-test with guaranteed test quality and low overhead Fortschritt-Berichte VDI Built-in self test (DE-588)4516486-1 gnd Testmustergenerator (DE-588)4210166-9 gnd Logiksynthese (DE-588)4348178-4 gnd |
| subject_GND | (DE-588)4516486-1 (DE-588)4210166-9 (DE-588)4348178-4 (DE-588)4113937-9 |
| title | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_auth | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_exact_search | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_full | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_fullStr | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_full_unstemmed | Deterministic built-in self-test with guaranteed test quality and low overhead Gundolf Kiefer, Aachen |
| title_short | Deterministic built-in self-test with guaranteed test quality and low overhead |
| title_sort | deterministic built in self test with guaranteed test quality and low overhead |
| topic | Built-in self test (DE-588)4516486-1 gnd Testmustergenerator (DE-588)4210166-9 gnd Logiksynthese (DE-588)4348178-4 gnd |
| topic_facet | Built-in self test Testmustergenerator Logiksynthese Hochschulschrift |
| volume_link | (DE-604)BV021786833 |
| work_keys_str_mv | AT kiefergundolf deterministicbuiltinselftestwithguaranteedtestqualityandlowoverhead |