Proceedings: [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA]
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Washington, D.C.
International Test Conference
2001
Piscataway, NJ IEEE |
| Schlagworte: | |
| Beschreibung: | Includes bibliographic references and author index. - Also available via the World Wide Web |
| Beschreibung: | xiv, 1201 p. ill. : 28 cm |
| ISBN: | 0780371690 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV014528031 | ||
| 003 | DE-604 | ||
| 005 | 20050513 | ||
| 007 | t | ||
| 008 | 020612s2001 xxua||| |||| 10||| eng d | ||
| 010 | |a 2002265994 | ||
| 020 | |a 0780371690 |9 0-7803-7169-0 | ||
| 035 | |a (OCoLC)634385368 | ||
| 035 | |a (DE-599)BVBBV014528031 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-29T |a DE-83 | ||
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 111 | 2 | |a International Test Conference |d 2001 |c Baltimore, Md. |j Verfasser |0 (DE-588)5536593-0 |4 aut | |
| 245 | 1 | 0 | |a Proceedings |b [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] |c International Test Conference 2001 |
| 246 | 1 | 3 | |a 2001 IEEE International Test Conference |
| 264 | 1 | |a Washington, D.C. |b International Test Conference |c 2001 | |
| 264 | 1 | |a Piscataway, NJ |b IEEE | |
| 300 | |a xiv, 1201 p. |b ill. : 28 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Includes bibliographic references and author index. - Also available via the World Wide Web | ||
| 650 | 0 | 7 | |a Medizin |0 (DE-588)4038243-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Computerunterstütztes Verfahren |0 (DE-588)4139030-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Entwurf |0 (DE-588)4121208-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Telekommunikation |0 (DE-588)4059360-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Datenverarbeitungssystem |0 (DE-588)4125229-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Bildverstehen |0 (DE-588)4202022-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Computersimulation |0 (DE-588)4148259-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mustererkennung |0 (DE-588)4040936-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2001 |z Baltimore Md. |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 1 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 2 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 2 | |8 1\p |5 DE-604 | |
| 689 | 3 | 0 | |a Datenverarbeitungssystem |0 (DE-588)4125229-9 |D s |
| 689 | 3 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
| 689 | 3 | |8 2\p |5 DE-604 | |
| 689 | 4 | 0 | |a Telekommunikation |0 (DE-588)4059360-5 |D s |
| 689 | 4 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
| 689 | 4 | |8 3\p |5 DE-604 | |
| 689 | 5 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 5 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 5 | |8 4\p |5 DE-604 | |
| 689 | 6 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 6 | 1 | |a Entwurf |0 (DE-588)4121208-3 |D s |
| 689 | 6 | |8 5\p |5 DE-604 | |
| 689 | 7 | 0 | |a Computerunterstütztes Verfahren |0 (DE-588)4139030-1 |D s |
| 689 | 7 | 1 | |a Medizin |0 (DE-588)4038243-6 |D s |
| 689 | 7 | |8 6\p |5 DE-604 | |
| 689 | 8 | 0 | |a Bildverstehen |0 (DE-588)4202022-0 |D s |
| 689 | 8 | 1 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |D s |
| 689 | 8 | |8 7\p |5 DE-604 | |
| 689 | 9 | 0 | |a Mustererkennung |0 (DE-588)4040936-3 |D s |
| 689 | 9 | 1 | |a Maschinelles Sehen |0 (DE-588)4129594-8 |D s |
| 689 | 9 | |8 8\p |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009888027 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 5\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 6\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 7\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 8\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804129320019427328 |
|---|---|
| any_adam_object | |
| author_corporate | International Test Conference Baltimore, Md |
| author_corporate_role | aut |
| author_facet | International Test Conference Baltimore, Md |
| author_sort | International Test Conference Baltimore, Md |
| building | Verbundindex |
| bvnumber | BV014528031 |
| classification_rvk | ZN 4030 |
| ctrlnum | (OCoLC)634385368 (DE-599)BVBBV014528031 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04270nam a2200973zc 4500</leader><controlfield tag="001">BV014528031</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20050513 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020612s2001 xxua||| |||| 10||| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2002265994</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780371690</subfield><subfield code="9">0-7803-7169-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634385368</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014528031</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="d">2001</subfield><subfield code="c">Baltimore, Md.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5536593-0</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">[October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA]</subfield><subfield code="c">International Test Conference 2001</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">2001 IEEE International Test Conference</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, D.C.</subfield><subfield code="b">International Test Conference</subfield><subfield code="c">2001</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 1201 p.</subfield><subfield code="b">ill. : 28 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographic references and author index. - Also available via the World Wide Web</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2001</subfield><subfield code="z">Baltimore Md.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2="1"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="7" ind2="0"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2="1"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="8" ind2="0"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="9" ind2="0"><subfield code="a">Mustererkennung</subfield><subfield code="0">(DE-588)4040936-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2=" "><subfield code="8">8\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009888027</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">8\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2001 Baltimore Md. gnd-content |
| genre_facet | Konferenzschrift 2001 Baltimore Md. |
| id | DE-604.BV014528031 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:03:15Z |
| institution | BVB |
| institution_GND | (DE-588)5536593-0 |
| isbn | 0780371690 |
| language | English |
| lccn | 2002265994 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009888027 |
| oclc_num | 634385368 |
| open_access_boolean | |
| owner | DE-29T DE-83 |
| owner_facet | DE-29T DE-83 |
| physical | xiv, 1201 p. ill. : 28 cm |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | International Test Conference IEEE |
| record_format | marc |
| spelling | International Test Conference 2001 Baltimore, Md. Verfasser (DE-588)5536593-0 aut Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] International Test Conference 2001 2001 IEEE International Test Conference Washington, D.C. International Test Conference 2001 Piscataway, NJ IEEE xiv, 1201 p. ill. : 28 cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographic references and author index. - Also available via the World Wide Web Medizin (DE-588)4038243-6 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2001 Baltimore Md. gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Testen (DE-588)4367264-4 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Elektronik (DE-588)4014346-6 s 4\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 5\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 6\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 7\p DE-604 Mustererkennung (DE-588)4040936-3 s 8\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] Medizin (DE-588)4038243-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd Testen (DE-588)4367264-4 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Elektronik (DE-588)4014346-6 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Mustererkennung (DE-588)4040936-3 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4038243-6 (DE-588)4139030-1 (DE-588)4121208-3 (DE-588)4059360-5 (DE-588)4125229-9 (DE-588)4027242-4 (DE-588)4047610-8 (DE-588)4367264-4 (DE-588)4129594-8 (DE-588)4014346-6 (DE-588)4202022-0 (DE-588)4117388-0 (DE-588)4148259-1 (DE-588)4040936-3 (DE-588)4039207-7 (DE-588)1071861417 |
| title | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] |
| title_alt | 2001 IEEE International Test Conference |
| title_auth | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] |
| title_exact_search | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] |
| title_full | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] International Test Conference 2001 |
| title_fullStr | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] International Test Conference 2001 |
| title_full_unstemmed | Proceedings [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] International Test Conference 2001 |
| title_short | Proceedings |
| title_sort | proceedings october 30 november 1 2001 baltimore convention center baltimore md usa |
| title_sub | [October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA] |
| topic | Medizin (DE-588)4038243-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Entwurf (DE-588)4121208-3 gnd Telekommunikation (DE-588)4059360-5 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd Testen (DE-588)4367264-4 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Elektronik (DE-588)4014346-6 gnd Bildverstehen (DE-588)4202022-0 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Mustererkennung (DE-588)4040936-3 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Medizin Computerunterstütztes Verfahren Entwurf Telekommunikation Datenverarbeitungssystem Integrierte Schaltung Prüftechnik Testen Maschinelles Sehen Elektronik Bildverstehen VLSI Computersimulation Mustererkennung Mikroelektronik Konferenzschrift 2001 Baltimore Md. |
| work_keys_str_mv | AT internationaltestconferencebaltimoremd proceedingsoctober30november12001baltimoreconventioncenterbaltimoremdusa AT internationaltestconferencebaltimoremd 2001ieeeinternationaltestconference |