Verfügbarkeit: Proceedings :: THWS Bibkatalog

Proceedings: [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

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Bibliographische Detailangaben
Körperschaft:	International Test Conference Atlantic City, NJ (VerfasserIn)
Format:	Tagungsbericht Buch
Sprache:	English
Veröffentlicht:	Washington D.C. ITC 2000
Schlagworte:	Integrated circuits > Testing > Congresses Very high speed integrated circuits > Testing > Congresses Mustererkennung Elektronik Computerunterstütztes Verfahren Maschinelles Sehen Telekommunikation Medizin Bildverstehen Testen VLSI Computersimulation Entwurf Datenverarbeitungssystem Integrierte Schaltung Mikroelektronik Prüftechnik Konferenzschrift > 2000 > Atlantic City NJ
Beschreibung:	Includes bibliographical references and index
Beschreibung:	xiv, 1158 p. ill. : 29 cm
ISBN:	078036547X 0780365461

Internformat

MARC


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Datensatz im Suchindex

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dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
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genre	(DE-588)1071861417 Konferenzschrift 2000 Atlantic City NJ gnd-content
genre_facet	Konferenzschrift 2000 Atlantic City NJ
id	DE-604.BV014461752
illustrated	Illustrated
indexdate	2024-07-09T19:02:55Z
institution	BVB
institution_GND	(DE-588)6027040-8
isbn	078036547X 0780365461
language	English
lccn	2001278058
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-009875581
oclc_num	48429286
open_access_boolean
owner	DE-210 DE-29T DE-83
owner_facet	DE-210 DE-29T DE-83
physical	xiv, 1158 p. ill. : 29 cm
publishDate	2000
publishDateSearch	2000
publishDateSort	2000
publisher	ITC
record_format	marc
spelling	International Test Conference 31 2000 Atlantic City, NJ Verfasser (DE-588)6027040-8 aut Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] International Test Conference 2000 Washington D.C. ITC 2000 xiv, 1158 p. ill. : 29 cm txt rdacontent n rdamedia nc rdacarrier Includes bibliographical references and index Integrated circuits Testing Congresses Very high speed integrated circuits Testing Congresses Mustererkennung (DE-588)4040936-3 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Atlantic City NJ gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 4\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 5\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 6\p DE-604 7\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 8\p DE-604 Mustererkennung (DE-588)4040936-3 s 9\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 9\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] Integrated circuits Testing Congresses Very high speed integrated circuits Testing Congresses Mustererkennung (DE-588)4040936-3 gnd Elektronik (DE-588)4014346-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Telekommunikation (DE-588)4059360-5 gnd Medizin (DE-588)4038243-6 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Entwurf (DE-588)4121208-3 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd
subject_GND	(DE-588)4040936-3 (DE-588)4014346-6 (DE-588)4139030-1 (DE-588)4129594-8 (DE-588)4059360-5 (DE-588)4038243-6 (DE-588)4202022-0 (DE-588)4367264-4 (DE-588)4117388-0 (DE-588)4148259-1 (DE-588)4121208-3 (DE-588)4125229-9 (DE-588)4027242-4 (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417
title	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
title_auth	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
title_exact_search	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
title_full	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] International Test Conference 2000
title_fullStr	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] International Test Conference 2000
title_full_unstemmed	Proceedings [October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] International Test Conference 2000
title_short	Proceedings
title_sort	proceedings october 3 5 2000 new atlantic city convention center atlantic city nj usa
title_sub	[October 3 - 5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]
topic	Integrated circuits Testing Congresses Very high speed integrated circuits Testing Congresses Mustererkennung (DE-588)4040936-3 gnd Elektronik (DE-588)4014346-6 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd Maschinelles Sehen (DE-588)4129594-8 gnd Telekommunikation (DE-588)4059360-5 gnd Medizin (DE-588)4038243-6 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd Computersimulation (DE-588)4148259-1 gnd Entwurf (DE-588)4121208-3 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd
topic_facet	Integrated circuits Testing Congresses Very high speed integrated circuits Testing Congresses Mustererkennung Elektronik Computerunterstütztes Verfahren Maschinelles Sehen Telekommunikation Medizin Bildverstehen Testen VLSI Computersimulation Entwurf Datenverarbeitungssystem Integrierte Schaltung Mikroelektronik Prüftechnik Konferenzschrift 2000 Atlantic City NJ
work_keys_str_mv	AT internationaltestconferenceatlanticcitynj proceedingsoctober352000newatlanticcityconventioncenteratlanticcitynjusa

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