APA (7th ed.) Citation

(2000). Microelectronic yield, reliability, and advanced packaging: 28-30 November 2000, Singapore. SPIE.

Chicago Style (17th ed.) Citation

Microelectronic Yield, Reliability, and Advanced Packaging: 28-30 November 2000, Singapore. Bellingham, Wash: SPIE, 2000.

MLA (9th ed.) Citation

Microelectronic Yield, Reliability, and Advanced Packaging: 28-30 November 2000, Singapore. SPIE, 2000.

Warning: These citations may not always be 100% accurate.