Design, test, integration, and packaging of MEMS, MOEMS: 9 - 11 May 2000, Paris, France
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 2000
Series:Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 4019
Subjects:
Physical Description:xv, 596 p. ill. : 28 cm
ISBN:0819436453

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