Scanning probe microscopy: [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000]
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Tokyo Japanese Journal of Applied Physics 2001
Series:Japanese journal of applied physics / 1 40,6,2
Subjects:
Item Description:Einzelaufn. eines Zs.-Heftes
Physical Description:S.4273 - 4429 Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!