Scanning probe microscopy: [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000]
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Japanese Journal of Applied Physics
2001
|
| Schriftenreihe: | Japanese journal of applied physics / 1
40,6,2 |
| Schlagworte: | |
| Beschreibung: | Einzelaufn. eines Zs.-Heftes |
| Beschreibung: | S.4273 - 4429 Ill., graph. Darst. |
Internformat
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Datensatz im Suchindex
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| illustrated | Illustrated |
| indexdate | 2024-07-09T19:01:03Z |
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| language | English |
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| physical | S.4273 - 4429 Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Japanese Journal of Applied Physics |
| record_format | marc |
| series2 | Japanese journal of applied physics / 1 |
| spelling | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] ed. by Masamichi Yoshimura ... Tokyo Japanese Journal of Applied Physics 2001 S.4273 - 4429 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Japanese journal of applied physics / 1 40,6,2 Einzelaufn. eines Zs.-Heftes Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Shizuoka gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Yoshimura, Masamichi Sonstige oth International Colloquium on Scanning Probe Microscopy 8 2000 Higashiizu Sonstige (DE-588)5531124-6 oth |
| spellingShingle | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)1071861417 |
| title | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] |
| title_auth | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] |
| title_exact_search | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] |
| title_full | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] ed. by Masamichi Yoshimura ... |
| title_fullStr | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] ed. by Masamichi Yoshimura ... |
| title_full_unstemmed | Scanning probe microscopy [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] ed. by Masamichi Yoshimura ... |
| title_short | Scanning probe microscopy |
| title_sort | scanning probe microscopy 8th international colloquium on held at atagawa haitsu shizuoka from december 9 to 9 2000 |
| title_sub | [8th International Colloquium on ... held at Atagawa Haitsu, Shizuoka, from December 9 to 9, 2000] |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie Konferenzschrift 2000 Shizuoka |
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