Proceedings: October 18 - 23, 1998, Washington, D.C., USA
Gespeichert in:
Format: | Elektronisch Tagungsbericht Software E-Book |
---|---|
Sprache: | English |
Veröffentlicht: |
Piscataway, NJ
IEEE
1998
|
Schlagworte: | |
Beschreibung: | 1 CD-ROM 12 cm. - 12 cm |
ISBN: | 0780350952 |
Internformat
MARC
LEADER | 00000nmm a2200000 c 4500 | ||
---|---|---|---|
001 | BV014274419 | ||
003 | DE-604 | ||
005 | 20020426 | ||
006 | a |||| 10||| | ||
007 | co|uuu---uuuuu | ||
008 | 020426s1998 |||| q||u| ||||||eng d | ||
020 | |a 0780350952 |9 0-7803-5095-2 | ||
035 | |a (OCoLC)632892675 | ||
035 | |a (DE-599)BVBBV014274419 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-29T | ||
245 | 1 | 0 | |a Proceedings |b October 18 - 23, 1998, Washington, D.C., USA |c International Test Conference 1998 |
264 | 1 | |a Piscataway, NJ |b IEEE |c 1998 | |
300 | |a 1 CD-ROM |c 12 cm. - 12 cm | ||
337 | |b c |2 rdamedia | ||
338 | |b cd |2 rdacarrier | ||
650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1998 |z Washington DC |2 gnd-content | |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 0 | |5 DE-604 | |
711 | 2 | |a International Test Conference |n 29 |d 1998 |c Washington, DC |j Sonstige |0 (DE-588)1901697-9 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009788210 |
Datensatz im Suchindex
_version_ | 1804129164038504448 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV014274419 |
ctrlnum | (OCoLC)632892675 (DE-599)BVBBV014274419 |
format | Electronic Conference Proceeding Software eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01169nmm a2200325 c 4500</leader><controlfield tag="001">BV014274419</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020426 </controlfield><controlfield tag="006">a |||| 10||| </controlfield><controlfield tag="007">co|uuu---uuuuu</controlfield><controlfield tag="008">020426s1998 |||| q||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780350952</subfield><subfield code="9">0-7803-5095-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632892675</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014274419</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">October 18 - 23, 1998, Washington, D.C., USA</subfield><subfield code="c">International Test Conference 1998</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 CD-ROM</subfield><subfield code="c">12 cm. - 12 cm</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cd</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1998</subfield><subfield code="z">Washington DC</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">29</subfield><subfield code="d">1998</subfield><subfield code="c">Washington, DC</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)1901697-9</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009788210</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1998 Washington DC gnd-content |
genre_facet | Konferenzschrift 1998 Washington DC |
id | DE-604.BV014274419 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T19:00:47Z |
institution | BVB |
institution_GND | (DE-588)1901697-9 |
isbn | 0780350952 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009788210 |
oclc_num | 632892675 |
open_access_boolean | |
owner | DE-29T |
owner_facet | DE-29T |
physical | 1 CD-ROM 12 cm. - 12 cm |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | IEEE |
record_format | marc |
spelling | Proceedings October 18 - 23, 1998, Washington, D.C., USA International Test Conference 1998 Piscataway, NJ IEEE 1998 1 CD-ROM 12 cm. - 12 cm c rdamedia cd rdacarrier Prüftechnik (DE-588)4047610-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 Washington DC gnd-content Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 29 1998 Washington, DC Sonstige (DE-588)1901697-9 oth |
spellingShingle | Proceedings October 18 - 23, 1998, Washington, D.C., USA Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
subject_GND | (DE-588)4047610-8 (DE-588)4027242-4 (DE-588)1071861417 |
title | Proceedings October 18 - 23, 1998, Washington, D.C., USA |
title_auth | Proceedings October 18 - 23, 1998, Washington, D.C., USA |
title_exact_search | Proceedings October 18 - 23, 1998, Washington, D.C., USA |
title_full | Proceedings October 18 - 23, 1998, Washington, D.C., USA International Test Conference 1998 |
title_fullStr | Proceedings October 18 - 23, 1998, Washington, D.C., USA International Test Conference 1998 |
title_full_unstemmed | Proceedings October 18 - 23, 1998, Washington, D.C., USA International Test Conference 1998 |
title_short | Proceedings |
title_sort | proceedings october 18 23 1998 washington d c usa |
title_sub | October 18 - 23, 1998, Washington, D.C., USA |
topic | Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
topic_facet | Prüftechnik Integrierte Schaltung Konferenzschrift 1998 Washington DC |
work_keys_str_mv | AT internationaltestconferencewashingtondc proceedingsoctober18231998washingtondcusa |