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Chicago-Zitierstil (17. Ausg.)Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 ; Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Held in Fukuoka, Japan, November 12 - 16, 2000. Uetikon-Zürich: SCITEC Publ, 2001.
MLA-Zitierstil (9. Ausg.)Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 ; Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Held in Fukuoka, Japan, November 12 - 16, 2000. SCITEC Publ, 2001.