APA (7th ed.) Citation

(2001). Beam injection assessment of microstructures in semiconductors: BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000. SCITEC Publ.

Chicago Style (17th ed.) Citation

Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 ; Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Held in Fukuoka, Japan, November 12 - 16, 2000. Uetikon-Zürich: SCITEC Publ, 2001.

MLA (9th ed.) Citation

Beam Injection Assessment of Microstructures in Semiconductors: BIAMS 2000 ; Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Held in Fukuoka, Japan, November 12 - 16, 2000. SCITEC Publ, 2001.