Beam injection assessment of microstructures in semiconductors: BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Uetikon-Zürich
SCITEC Publ.
2001
|
| Schriftenreihe: | Diffusion and defect data
B, Solid state phenomena ; 78/79 |
| Schlagworte: | |
| Beschreibung: | XIII, 441 S. Ill., graph. Darst. |
| ISBN: | 3908450616 |
Internformat
MARC
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| 245 | 1 | 0 | |a Beam injection assessment of microstructures in semiconductors |b BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 |c ed.: Hajime Tomokage ... |
| 264 | 1 | |a Uetikon-Zürich |b SCITEC Publ. |c 2001 | |
| 300 | |a XIII, 441 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Diffusion and defect data : B, Solid state phenomena |v 78/79 | |
| 650 | 4 | |a Semiconductors |x Microscopy |v Congresses | |
| 650 | 4 | |a Semiconductors |x Testing |v Congresses | |
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| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Tomokage, Hajime |e Sonstige |4 oth | |
| 711 | 2 | |a BIAMS |n 6 |d 2000 |c Fukuoka |j Sonstige |0 (DE-588)6030503-4 |4 oth | |
| 830 | 0 | |a Diffusion and defect data |v B, Solid state phenomena ; 78/79 |w (DE-604)BV021637351 |9 78/79 | |
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Datensatz im Suchindex
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UP 3250 |
| ctrlnum | (OCoLC)47095956 (DE-599)BVBBV014273559 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 2000 Fukuoka gnd-content |
| genre_facet | Konferenzschrift 2000 Fukuoka |
| id | DE-604.BV014273559 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:00:46Z |
| institution | BVB |
| institution_GND | (DE-588)6030503-4 |
| isbn | 3908450616 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009787442 |
| oclc_num | 47095956 |
| open_access_boolean | |
| owner | DE-703 DE-706 |
| owner_facet | DE-703 DE-706 |
| physical | XIII, 441 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | SCITEC Publ. |
| record_format | marc |
| series | Diffusion and defect data |
| series2 | Diffusion and defect data : B, Solid state phenomena |
| spelling | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 ed.: Hajime Tomokage ... Uetikon-Zürich SCITEC Publ. 2001 XIII, 441 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Diffusion and defect data : B, Solid state phenomena 78/79 Semiconductors Microscopy Congresses Semiconductors Testing Congresses Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Fukuoka gnd-content Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Tomokage, Hajime Sonstige oth BIAMS 6 2000 Fukuoka Sonstige (DE-588)6030503-4 oth Diffusion and defect data B, Solid state phenomena ; 78/79 (DE-604)BV021637351 78/79 |
| spellingShingle | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 Diffusion and defect data Semiconductors Microscopy Congresses Semiconductors Testing Congresses Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)1071861417 |
| title | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 |
| title_auth | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 |
| title_exact_search | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 |
| title_full | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 ed.: Hajime Tomokage ... |
| title_fullStr | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 ed.: Hajime Tomokage ... |
| title_full_unstemmed | Beam injection assessment of microstructures in semiconductors BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 ed.: Hajime Tomokage ... |
| title_short | Beam injection assessment of microstructures in semiconductors |
| title_sort | beam injection assessment of microstructures in semiconductors biams 2000 proceedings of the 6th international workshop on beam injection assessment of microstructures in semiconductors held in fukuoka japan november 12 16 2000 |
| title_sub | BIAMS 2000 ; proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, held in Fukuoka, Japan, November 12 - 16, 2000 |
| topic | Semiconductors Microscopy Congresses Semiconductors Testing Congresses Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Semiconductors Microscopy Congresses Semiconductors Testing Congresses Gitterbaufehler Halbleiter Konferenzschrift 2000 Fukuoka |
| volume_link | (DE-604)BV021637351 |
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