Nanoscale spectroscopy and its applications to semiconductor research:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
2002
|
| Series: | Lecture notes in physics
588 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | zugl.: International workshop on nanoscale spectroscopy and its applications to semiconductor research (2000 : Trieste, Italy) |
| Physical Description: | XV, 306 S. Ill., graph. Darst. |
| ISBN: | 3540433120 |
Staff View
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Record in the Search Index
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| adam_text | Y. WATANABE S. HEUN G. SALVIATI N. YAMAMOTO (EDS.) NANOSCALE
SPECTROSCOPY AND ITS APPLICATIONS TO SEMICONDUCTOR RESEARCH (AE SPRINGER
CONTENTS INTRODUCTION S. HEUN, G. SALVIATI, Y. WATANABE, N. YAMAMOTO 1
PART I SPECTROSCOPY USING AN ELECTRON MICROSCOPE SPECTRO-MICROSCOPY BY
TEM SEM K. YAGI, Y. TANISHIRO, H. MINODA 11 DETERMINATION OF NANOSIZE
PARTICLE DISTRIBUTION BY LOW FREQUENCY RAMAN SCATTERING: COMPARISON TO
ELECTRON MICROSCOPY M. IVANDA, A.M. TONEJC, I. DJERDJ, M. GOTIC, S.
MUSIC, G. MARIOTTO, M. MONTAGNA 24 DEVELOPMENT OF CATHODOLUMINESCENCE
(CL) FOR SEMICONDUCTOR RESEARCH, PART I: TEM*CL STUDY OF MICROSTRUCTURES
AND DEFECTS IN SEMICONDUCTOR EPILAYERS N. YAMAMOTO 37 DEVELOPMENT OF CL
FOR SEMICONDUCTOR RESEARCH, PART II: CATHODOLUMINESCENCE STUDY OF
SEMICONDUCTOR NANOPARTICLES AND NANOSTRUCTURES USING LOW-ELECTRON-BEAM
ENERGIES T. SEKIGUCHI 52 DEVELOPMENT OF CL FOR SEMICONDUCTOR RESEARCH,
PART III: STUDY OF DEGRADATION MECHANISMS IN COMPOUND
SEMICONDUCTOR-BASED DEVICES BY SEM CL G. SALVIATI 61
MICROCHARACTERIZATION OF CONFORMAL GAAS ON SI LAYERS BY SPATIALLY
RESOLVED OPTICAL TECHNIQUES 0. MARTINEZ, M. AVELLA, A.M. ARDILA, J.
JIMENEZ, B. GERAD, E.G. LAFON. . 74 STRAIN ANALYSIS IN SUBMICRON
ELECTRON DEVICES BY CONVERGENT BEAM ELECTRON DIFFRACTION A. ARMIGLIATO,
R. BALBONI, S. FRABBONI, A. BENEDETTI, A.G. CULLIS 82 X CONTENTS PART II
X-RAY NANOSPECTROSCOPY SYNCHROTRON RADIATION X-RAY MICROSCOPY BASED ON
ZONE PLATE OPTICS B. KAULICH, M. KISKINOVA 93 LONG-TERM OXIDATION
BEHAVIOUR OF LEAD SULFIDE SURFACES K.C. PRINCE, S. HEUN, L. GREGORATTI,
A. BARINOV, M. KISKINOVA 111 CROSS-SECTIONAL PHOTOEMISSION
SPECTROMICROSCOPY OF SEMICONDUCTOR HETEROSTRUCTURES F. BARBO, M.
BERTOLO, A. BIANCO, G. CAUTERO, R. CIMINO, S. FONTANA, A. FRANCIOSI,
T.K. JOHAL, S. LA ROSA, D. OMNI, M. PICCIN, R.C. PURANDARE, S. RUBINI,
N. SVETCHNIKOV 121 SURFACE IMAGING USING ELECTRONS EXCITED BY
METASTABLE-ATOM IMPACTS N. UENO, H. YASUFUKU, S. KERA, K.K. OKUDAIRA, Y.
HARADA 131 APPLICATION OF PHOTOEMISSION ELECTRON MICROSCOPY TO MAGNETIC
DOMAIN IMAGING T. KINOSHITA 145 PHOTOELECTRON SPECTROSCOPY WITH A
PHOTOEMISSION ELECTRON MICROSCOPE S. HEUN, Y. WATANABE 157 X-RAY
PHOTOEMISSION AND LOW-ENERGY ELECTRON MICROSCOPE R. VASINA, M. MYNDF, V.
KOLAFIK 172 APPLICATION OF IMAGING-TYPE PHOTOELECTRON SPECTROMICROSCOPY
TO SOLID-STATE PHYSICS T. KINOSHITA, Y. HARUYAMA 180 PART III SCANNING
PROBE SPECTROSCOPY SCANNING NEAR-FIELD OPTICAL SPECTROSCOPY OF
QUANTUM-CONFINED SEMICONDUCTOR NANOSTRUCTURES M. COLOCCI, V. EMILIANI,
P.G. GUCCIARDI, J. KUDRNA, A. VINATTIERI 199 NOVEL TUNING FORK SENSOR
FOR LOW-TEMPERATURE NEAR-FIELD SPECTROSCOPY A. CROTTINI, J.L. STAEHLI,
B. DEVEAUD, X.L. WANG, M. OGURA 210 MANIPULATING, REACTING, AND
CONSTRUCTING SINGLE MOLECULES WITH A SCANNING TUNNELING MICROSCOPE TIP
S.-W. HLA 222 CONTENTS XI ELECTRON-BEAM-INDUCED DECOMPOSITION OF SIO*2
OVERLAY ON SI IN STM NANOLITHOGRAPHY H. IWASAKI, T. ITO, M. GOTOH, L.
NAN, K. SUDOH 231 DIRECT IMAGING OF INGAAS QUANTUM DOT STATES BY
SCANNING TUNNELING SPECTROSCOPY T.K. JOHAL, R. RINALDI, A. PASSASEO, R.
CINGOLANI, A. VASANELLI, R. FERREIRA, G. BASTARD 241 GROWTH AND
CHARACTERIZATION OF GE NANOSTRUCTURES ON SI(LLL) F. ROSEI, N. MOTTA, A.
SGARLATA, A. BALZAROTTI 252 IMAGING OF ZERO-DIMENSIONAL STATES IN
SEMICONDUCTOR NANOSTRUCTURES USING SCANNING TUNNELING MICROSCOPY K.
KANISAWA, M.J. BUTCHER, Y. TOKURA, H. YAMAGUCHI, Y. HIRAYAMA 263
ELECTRONIC-EXCITATION-INDUCED ENHANCEMENT IN METALLICITY ON HOPG AND SI
SURFACES: IN SITU STM/STS STUDIES J.P. SINGH, D. KANJILAL 269 ELECTRONIC
PROPERTIES OF POLYCRYSTALLINE AND AMORPHOUS WO3 INVESTIGATED WITH
SCANNING TUNNELLING SPECTROSCOPY L. OTTAVIANO, E. MACCALLINI, S.
SANTUCCI 278 PROBING OF ELECTRONIC TRANSITIONS WITH ATOMIC-SCALE SPATIAL
RESOLUTION IN SEMICONDUCTOR QUANTUM WELL STRUCTURES S. USHIODA, T.
TSURUOKA, Y. OHIZUMI, R. TANIMOTO 287 SCANNING TUNNELING
MICROSCOPE-INDUCED LIGHT EMISSION FROM NANOSCALE STRUCTURES M. SAKURAI
294 INDEX 305
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| indexdate | 2024-07-09T18:59:14Z |
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| series | Lecture notes in physics |
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| spelling | Nanoscale spectroscopy and its applications to semiconductor research Y. Watanabe ... (ed.) Berlin [u.a.] Springer 2002 XV, 306 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Lecture notes in physics 588 Physics and astronomy online library zugl.: International workshop on nanoscale spectroscopy and its applications to semiconductor research (2000 : Trieste, Italy) Elektronenspectrometrie gtt Halfgeleiders gtt Matériaux nanocristallins - Congrès Microscopie électronique - Congrès Nano-elektronica gtt Nanokristallijne materialen gtt Nanostructuren gtt Semiconducteurs - Matériaux - Congrès Spectroscopie électronique - Congrès Electron microscopy Congresses Electron spectroscopy Congresses Nanostructured materials Congresses Semiconductors Materials Congresses Nanostruktur (DE-588)4204530-7 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Triest gnd-content Halbleiter (DE-588)4022993-2 s Nanostruktur (DE-588)4204530-7 s Elektronenspektroskopie (DE-588)4014332-6 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Watanabe, Yoshio 1954- Sonstige (DE-588)123576482 oth Lecture notes in physics 588 (DE-604)BV000003166 588 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009725394&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Nanoscale spectroscopy and its applications to semiconductor research Lecture notes in physics Elektronenspectrometrie gtt Halfgeleiders gtt Matériaux nanocristallins - Congrès Microscopie électronique - Congrès Nano-elektronica gtt Nanokristallijne materialen gtt Nanostructuren gtt Semiconducteurs - Matériaux - Congrès Spectroscopie électronique - Congrès Electron microscopy Congresses Electron spectroscopy Congresses Nanostructured materials Congresses Semiconductors Materials Congresses Nanostruktur (DE-588)4204530-7 gnd Halbleiter (DE-588)4022993-2 gnd Elektronenspektroskopie (DE-588)4014332-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4204530-7 (DE-588)4022993-2 (DE-588)4014332-6 (DE-588)4014327-2 (DE-588)1071861417 |
| title | Nanoscale spectroscopy and its applications to semiconductor research |
| title_auth | Nanoscale spectroscopy and its applications to semiconductor research |
| title_exact_search | Nanoscale spectroscopy and its applications to semiconductor research |
| title_full | Nanoscale spectroscopy and its applications to semiconductor research Y. Watanabe ... (ed.) |
| title_fullStr | Nanoscale spectroscopy and its applications to semiconductor research Y. Watanabe ... (ed.) |
| title_full_unstemmed | Nanoscale spectroscopy and its applications to semiconductor research Y. Watanabe ... (ed.) |
| title_short | Nanoscale spectroscopy and its applications to semiconductor research |
| title_sort | nanoscale spectroscopy and its applications to semiconductor research |
| topic | Elektronenspectrometrie gtt Halfgeleiders gtt Matériaux nanocristallins - Congrès Microscopie électronique - Congrès Nano-elektronica gtt Nanokristallijne materialen gtt Nanostructuren gtt Semiconducteurs - Matériaux - Congrès Spectroscopie électronique - Congrès Electron microscopy Congresses Electron spectroscopy Congresses Nanostructured materials Congresses Semiconductors Materials Congresses Nanostruktur (DE-588)4204530-7 gnd Halbleiter (DE-588)4022993-2 gnd Elektronenspektroskopie (DE-588)4014332-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenspectrometrie Halfgeleiders Matériaux nanocristallins - Congrès Microscopie électronique - Congrès Nano-elektronica Nanokristallijne materialen Nanostructuren Semiconducteurs - Matériaux - Congrès Spectroscopie électronique - Congrès Electron microscopy Congresses Electron spectroscopy Congresses Nanostructured materials Congresses Semiconductors Materials Congresses Nanostruktur Halbleiter Elektronenspektroskopie Elektronenmikroskopie Konferenzschrift 2000 Triest |
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