NC-AFM 2000: proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
2001
|
| Series: | Applied Physics : A, Materials science & processing
72, Suppl. |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zs.-Suppl. |
| Physical Description: | 6, 143, II S. Ill., graph. Darst. |
Staff View
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| indexdate | 2024-07-09T18:59:03Z |
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| physical | 6, 143, II S. Ill., graph. Darst. |
| publishDate | 2001 |
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| publisher | Springer |
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| series2 | Applied Physics : A, Materials science & processing |
| spelling | NC-AFM 3 2000 Hamburg Verfasser (DE-588)1246904-X aut NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... Berlin [u.a.] Springer 2001 6, 143, II S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Applied Physics : A, Materials science & processing 72, Suppl. Einzelaufnahme eines Zs.-Suppl. Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Hamburg gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Schwarz, Udo D. Sonstige oth |
| spellingShingle | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_auth | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_exact_search | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_full | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_fullStr | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_full_unstemmed | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_short | NC-AFM 2000 |
| title_sort | nc afm 2000 proceedings of the third international conference on non contact atomic force microscopy 16 19 july 2000 hamburg germany |
| title_sub | proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 2000 Hamburg |
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