NC-AFM 2000: proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2001
|
| Schriftenreihe: | Applied Physics : A, Materials science & processing
72, Suppl. |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zs.-Suppl. |
| Beschreibung: | 6, 143, II S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV014179069 | ||
| 003 | DE-604 | ||
| 005 | 20020301 | ||
| 007 | t | ||
| 008 | 020228s2001 gw ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)163645828 | ||
| 035 | |a (DE-599)BVBBV014179069 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-12 | ||
| 111 | 2 | |a NC-AFM |n 3 |d 2000 |c Hamburg |j Verfasser |0 (DE-588)1246904-X |4 aut | |
| 245 | 1 | 0 | |a NC-AFM 2000 |b proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |c ed. by: U. D. Schwarz ... |
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2001 | |
| 300 | |a 6, 143, II S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Applied Physics : A, Materials science & processing |v 72, Suppl. | |
| 500 | |a Einzelaufnahme eines Zs.-Suppl. | ||
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2000 |z Hamburg |2 gnd-content | |
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Schwarz, Udo D. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009717532 | ||
Datensatz im Suchindex
| _version_ | 1804129055021203456 |
|---|---|
| any_adam_object | |
| author_corporate | NC-AFM Hamburg |
| author_corporate_role | aut |
| author_facet | NC-AFM Hamburg |
| author_sort | NC-AFM Hamburg |
| building | Verbundindex |
| bvnumber | BV014179069 |
| ctrlnum | (OCoLC)163645828 (DE-599)BVBBV014179069 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01249nam a2200337 cb4500</leader><controlfield tag="001">BV014179069</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020301 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020228s2001 gw ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)163645828</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014179069</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">NC-AFM</subfield><subfield code="n">3</subfield><subfield code="d">2000</subfield><subfield code="c">Hamburg</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1246904-X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">NC-AFM 2000</subfield><subfield code="b">proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany</subfield><subfield code="c">ed. by: U. D. Schwarz ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">6, 143, II S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Applied Physics : A, Materials science & processing</subfield><subfield code="v">72, Suppl.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zs.-Suppl.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2000</subfield><subfield code="z">Hamburg</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schwarz, Udo D.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009717532</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2000 Hamburg gnd-content |
| genre_facet | Konferenzschrift 2000 Hamburg |
| id | DE-604.BV014179069 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:59:03Z |
| institution | BVB |
| institution_GND | (DE-588)1246904-X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009717532 |
| oclc_num | 163645828 |
| open_access_boolean | |
| owner | DE-12 |
| owner_facet | DE-12 |
| physical | 6, 143, II S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Springer |
| record_format | marc |
| series2 | Applied Physics : A, Materials science & processing |
| spelling | NC-AFM 3 2000 Hamburg Verfasser (DE-588)1246904-X aut NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... Berlin [u.a.] Springer 2001 6, 143, II S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Applied Physics : A, Materials science & processing 72, Suppl. Einzelaufnahme eines Zs.-Suppl. Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Hamburg gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Schwarz, Udo D. Sonstige oth |
| spellingShingle | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_auth | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_exact_search | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| title_full | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_fullStr | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_full_unstemmed | NC-AFM 2000 proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany ed. by: U. D. Schwarz ... |
| title_short | NC-AFM 2000 |
| title_sort | nc afm 2000 proceedings of the third international conference on non contact atomic force microscopy 16 19 july 2000 hamburg germany |
| title_sub | proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, 16 - 19 July 2000, Hamburg, Germany |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 2000 Hamburg |
| work_keys_str_mv | AT ncafmhamburg ncafm2000proceedingsofthethirdinternationalconferenceonnoncontactatomicforcemicroscopy1619july2000hamburggermany AT schwarzudod ncafm2000proceedingsofthethirdinternationalconferenceonnoncontactatomicforcemicroscopy1619july2000hamburggermany |