Proceedings of the Conference on Photographic and Spectroscopic Optics: Tokyo and Kyoto 1964
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English French |
| Veröffentlicht: |
Tokyo
Japanese Journal of Applied Physics
1965
|
| Schriftenreihe: | Japanese journal of applied physics
Supplement ; Volume 4, Supplement I |
| Schlagworte: | |
| Beschreibung: | XXI, 669 Seiten Illustrationen, Diagramme |
Internformat
MARC
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| 049 | |a DE-83 |a DE-188 | ||
| 050 | 0 | |a QC1 | |
| 082 | 0 | |a 770 |2 19 | |
| 111 | 2 | |a Conference on Photographic and Spectroscopic Optics |d 1964 |c Tōkyō; Kyōto |j Verfasser |0 (DE-588)5254670-6 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Conference on Photographic and Spectroscopic Optics |b Tokyo and Kyoto 1964 |c held under the auspices of the International Commission for Optics ; arranged by the Science Council of Japan and the Japan Society of Applied Physics |
| 264 | 1 | |a Tokyo |b Japanese Journal of Applied Physics |c 1965 | |
| 300 | |a XXI, 669 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Japanese journal of applied physics : Supplement |v Volume 4, Supplement I | |
| 505 | 8 | 0 | |t Light fluctuations as a new spectroscopic tool |r E. Wolf |t Attempts to treat nonlinear imaging devices |r E. Ingelstam |t Infrared optical materials, old and new |r S.S. Ballard |t Canonical pupil coordinates in geometrical and diffraction image theory |r H.H. Hopkins |t Analytical determination of axial spherical aberration in spherical-mirror systems |r P. Lindberg |t Principal points, cardinal axis and focal planes of a slightly decentred optical system |r J. Bartkowska |t <<The>> correction of optical systems |r M. Herzberger |t Optical transfer function and lens design techniques |r K. Sayanagi |t Objectifs photographiques grand-angulaires utilisant une surface parabolique - Wide angle camera lens with parabolic surface |r Ed. Hugues |t <<A>> series of lenses designed for optimum performance |r R.E. Hopkins |t Automatic lens design by statistical analysis |r B. Brixner |t Automatic lens design |r T. Suzuki, Y. Ichioka, S. Yonezawa, and M. Koyama |t Some examples of lens designing by computer |r C.G. Wynne |t Some experiments on automatic optical design |r Y. Matsui and R. Hirose |t Some properties of diapoints |r S. Kato |t Some applications of the wave front shearing interferometer |r J.B. Saunders |t Some applications of the gas laser as a source of light for the testing of optical systems |r M.V.R.K. Murty and D. Malacara-Hernandez |t Lenses for ultra-microphotography |r Z. Koana and Z. Wakimoto |t New instrument for assessing lens quality by pupil scanning (Spot diagram generation) |r L.R. Baker and J.N. Whyte |
| 505 | 8 | 0 | |t High speed image synthesizer |r T. Suzuki, Y. Ichioka, and M. Koyama |t Measuring instruments for optical transfer function |r H. Kubota |t Automatic recording instrument for measuring optical transfer functions |r L.R. Baker |t <<Le>> transfert de modulation des objectifs |r J.F. Simon |t <<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method |r T. Ose, M. Takashima, and I. Yamaguchi |t <<An>> instrument for the evaluation of the image performance of photographic lenses |r K. Murata and H. Matsui |t Measurement of OTF using large test pattern of single frequency |r S. Tatuoka |t <<A>> polarizing shearing interferometer for evaluating photographic optics |r T. Tsuruta |t Experimental measurements of modulation transfer functions of intensifier and fluorescent screens |r H.A.W. Schober, R. Rohler, and H. Pulvermacher |t <<The>> application of optical transfer function in radiography |r K. Doi, A. Kaji, T. Takizawa, and K. Sayanagi |t <<A>> new definition of photographic image information |r H. Kanamori |t Sensitivity and sharpness of X-ray film exposed with intensifying screens |r W.F. Berg and A. Spühler |t <<The>> determination of the modulation transfer function of color films |r S. Ooue and I. Hatanaka |t Evaluation of light-scattering-images |r J.C. Urbach |t Some properties of random charts |r K. Kinoshita |t Geometrical optical approximation of optical transfer function |r K. Miyamoto |t Effects of large aberration on the optical transfer function |r I. Ogura |
| 505 | 8 | 0 | |t Transfer functions for wide spectrum imagery |r R.R. Shannon |t <<The>> aberration synthesizer |r Y. Matsui and M. Takashima |t Chromatic aberrations and optical transfer functions of photographic lenses |r K. Rosenhauer and K.J. Rosenbruch |t Formation of images in coherent and partially coherent illumination |r A. Maréchal |t Image-forming performance of projection systems |r J. Tsujiuchi |t Recherches récentes sur la cohérence partielle |r G. Nomarski |t Improvement in resolving power of optical systems |r G. Lansraux |t Superresolution image-forming systems for objects with restricted lambda dependence |r J.D. Armitage, A. Lohmann, and D.P. Paris |t Far-field diffraction patterns of single and multiple circularly symmetric apertures |r A.I. Mahan, C.V. Bitterli, and S.M. Cannon |t Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols |r T. Asakura and Tsuneko Suzuki |t Intensity distribution near the focus of a large aperture optical system |r S. Maruyama |t Evaluation of optical image by wave aberration |r K.P. Miyake |t <<A>> new method of measuring particle size by diffraction techniques |r B.J. Thompson |t Effect of coherence on the slit function |r H. Sakai |t Role of fiber optics in photography |r N.S. Kapany |t Image transfer properties of fiber bundle |r H. Ohzu, T. Sawatari, and K. Sayanagi |t <<The>> chemical resistance of optical glasses |r A.M. Reid, R.J. Parry, and J. Blackburn |t On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters |r R. Jacobsson and J.O. Mårtensson |
| 505 | 8 | 0 | |t Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS |r K. Kinosita, K. Nakamizo, K. Maki, K. Onuki, and K. Takeuchi |t Spectral reflectance of Lippmann plate |r M. Iwata, R. Makabe, and S. Katsube |t Far infrared spectroscopy |r L. Genzel |t Far infrared spectrometer with a variable depth grating |r T. Sakurai and S. Takahashi |t <<An>> application of double chopping system to far infrared spectrophotometer |r S. Minami, H. Yoshinaga, and K. Matsunaga |t <<A>> far infrared spectrometer designed mainly for use in solid state physics |r I. Makino, T. Iwasaki, and I. Iwahashi |t Versatile far infrared spectrophotometer |r K. Kudo and Y. Mochida |t Récents développements du spectromètre O.N.E.R.A |r A. Girard |t Instrumental problems in high resolution infrared spectroscopy |r H. Makabe, Y. Fukuda, and S. Hashizume |t Self calibration and automatic correction for the wavelength response of a monochromator-dectector system |r R.A. Brower and A.T. Stair, Jr. |t Transmission grating as an infrared filter |r Y. Sakayangi |t Progrès récents en spectroscopie interférentielle |r P. Jacquinot |t Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer |r E.E. Bell |t High resolution far infrared interferometry with application to solid state physics |r P.L. Richards |t Recent techniques in far infrared spectroscopy |r H. Yoshinaga |t <<A>> new computing method for interference spectroscopy |r S. Fujita, H. Yoshinaga, K. Chiba, K. Nakano, S. Yoshida, and H. Sugimori |
| 505 | 8 | 0 | |t Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer |r S.P. Stewart, E.R. Huppi, A.T. Stair jr., and G.A. Vanasse |t <<A>> new design of a scanning Fabry-Pérot interferometer |r P.N. Slater, H.T. Betz, and G. Henderson |t Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC |r R. Chabbal et R. Pelletier |t Nouvelle méthode spectrométrique interférentielle |r R. Prat |t Profile analysis of spectral line by Fabry-Perot interferometer |r T. Tako and M. Ohi |t High resolution vacuum spectrograph |r G.H. Dieke and D.F. Heath |t Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue |r B. Vodar |t <<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet |r D.J. Bradley, B. Bates, C.O.L. Juulman, and S. Majumdar |t Collimating grating monochromators for vacuum ultraviolet |r D.E. Bedo and H.E. Hinteregger |t <<An>> ultraviolet rocket stellar spectrometer |r D.U. Wright, jr. |t <<An>> ultraviolet spectrophotometer for satellite astronomy |r K. Hallam and J. Mangus |t Some instrumentation problems in the vacuum ultraviolet below 1000 Å |r G.L. Weissler |t Argon, krypton and xenon continuum light sources for the vacuum ultraviolet |r R.E. Huffman, Y. Tanaka, and J.C. Larrabee |t Extreme ultraviolet emission from beryllium oxide |r K. Fukuda, Y. Uchida, and M. Nakagawa |t <<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain |r J. Romand |t Ultraviolet photography and spectroscopy using a spectrally selective image |r L. Dunkelman and J.P. Hennes |
| 505 | 8 | 0 | |t Possible uses of thin films as polarizers in the vacuum ultraviolet region |r F. Abelès |t Polarizers for the extreme ultraviolet |r W.R. Hunter |t Determination of optical constants of glasses in the vacuum ultraviolet region |r F. Sasaki, H. Fukutani, K. Ishiguro, and T. Izumitani |t Recent instrumentation for the optical studies of solids in the vacuum ultraviolet |r P.L. Hartman |t Application of vacuum ultraviolet spectroscopy in solid state physics |r Wm.A. Rense |t <<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region |r D.H. Tomboulian |t Etude théorique de la diffraction de la lumière par les réseaux |r P. Bousquet |t On the ruling errors of a diffraction grating and their effects on the spectral lines |r K. Shimizu |t Modern diffraction gratings |r D. Richardson |t Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures |r C.H. Perry |t Optical measurement of several materials in the far infrared region |r A. Mitsuishi, H. Yoshinaga, K. Yata and A. Manabe |t Far infrared spectroscopy of compressed gases using a Michelson interferometer |r D.R. Bosomworth and H.P. Gush |t <<An>> absolute method of determining transmission and reflection coefficients |r S.J. Fray, A.R. Goodwin, F.A. Johnson, and J.E. Quarrington |
| 650 | 7 | |a Instr. & méthodes |2 obspm | |
| 650 | 7 | |a Photographie - Congrès |2 ram | |
| 650 | 7 | |a Photographie |2 obspm | |
| 650 | 7 | |a Spectroscopie |2 obspm | |
| 650 | 4 | |a Optics and Photonics |v Congresses | |
| 650 | 4 | |a Photographic optics |v Congresses | |
| 650 | 4 | |a Photography |v Congresses | |
| 650 | 4 | |a Spectrum Analysis |v Congresses | |
| 650 | 4 | |a Spectrum analysis |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1964 |z Tokyo and Kyoto |2 gnd-content | |
| 710 | 2 | |a International Commission for Optics |0 (DE-588)1460-6 |4 oth | |
| 830 | 0 | |a Japanese journal of applied physics |v Supplement ; Volume 4, Supplement I |w (DE-604)BV001888390 |9 4,1 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-009658926 | |
Datensatz im Suchindex
| _version_ | 1822490866423431168 |
|---|---|
| adam_text | |
| any_adam_object | |
| author_additional | E. Wolf E. Ingelstam S.S. Ballard H.H. Hopkins P. Lindberg J. Bartkowska M. Herzberger K. Sayanagi Ed. Hugues R.E. Hopkins B. Brixner T. Suzuki, Y. Ichioka, S. Yonezawa, and M. Koyama C.G. Wynne Y. Matsui and R. Hirose S. Kato J.B. Saunders M.V.R.K. Murty and D. Malacara-Hernandez Z. Koana and Z. Wakimoto L.R. Baker and J.N. Whyte T. Suzuki, Y. Ichioka, and M. Koyama H. Kubota L.R. Baker J.F. Simon T. Ose, M. Takashima, and I. Yamaguchi K. Murata and H. Matsui S. Tatuoka T. Tsuruta H.A.W. Schober, R. Rohler, and H. Pulvermacher K. Doi, A. Kaji, T. Takizawa, and K. Sayanagi H. Kanamori W.F. Berg and A. Spühler S. Ooue and I. Hatanaka J.C. Urbach K. Kinoshita K. Miyamoto I. Ogura R.R. Shannon Y. Matsui and M. Takashima K. Rosenhauer and K.J. Rosenbruch A. Maréchal J. Tsujiuchi G. Nomarski G. Lansraux J.D. Armitage, A. Lohmann, and D.P. Paris A.I. Mahan, C.V. Bitterli, and S.M. Cannon T. Asakura and Tsuneko Suzuki S. Maruyama K.P. Miyake B.J. Thompson H. Sakai N.S. Kapany H. Ohzu, T. Sawatari, and K. Sayanagi A.M. Reid, R.J. Parry, and J. Blackburn R. Jacobsson and J.O. Mårtensson K. Kinosita, K. Nakamizo, K. Maki, K. Onuki, and K. Takeuchi M. Iwata, R. Makabe, and S. Katsube L. Genzel T. Sakurai and S. Takahashi S. Minami, H. Yoshinaga, and K. Matsunaga I. Makino, T. Iwasaki, and I. Iwahashi K. Kudo and Y. Mochida A. Girard H. Makabe, Y. Fukuda, and S. Hashizume R.A. Brower and A.T. Stair, Jr. Y. Sakayangi P. Jacquinot E.E. Bell P.L. Richards H. Yoshinaga S. Fujita, H. Yoshinaga, K. Chiba, K. Nakano, S. Yoshida, and H. Sugimori S.P. Stewart, E.R. Huppi, A.T. Stair jr., and G.A. Vanasse P.N. Slater, H.T. Betz, and G. Henderson R. Chabbal et R. Pelletier R. Prat T. Tako and M. Ohi G.H. Dieke and D.F. Heath B. Vodar D.J. Bradley, B. Bates, C.O.L. Juulman, and S. Majumdar D.E. Bedo and H.E. Hinteregger D.U. Wright, jr. K. Hallam and J. Mangus G.L. Weissler R.E. Huffman, Y. Tanaka, and J.C. Larrabee K. Fukuda, Y. Uchida, and M. Nakagawa J. Romand L. Dunkelman and J.P. Hennes F. Abelès W.R. Hunter F. Sasaki, H. Fukutani, K. Ishiguro, and T. Izumitani P.L. Hartman Wm.A. Rense D.H. Tomboulian P. Bousquet K. Shimizu D. Richardson C.H. Perry A. Mitsuishi, H. Yoshinaga, K. Yata and A. Manabe D.R. Bosomworth and H.P. Gush S.J. Fray, A.R. Goodwin, F.A. Johnson, and J.E. Quarrington |
| author_corporate | Conference on Photographic and Spectroscopic Optics Tōkyō; Kyōto |
| author_corporate_role | aut |
| author_facet | Conference on Photographic and Spectroscopic Optics Tōkyō; Kyōto |
| author_sort | Conference on Photographic and Spectroscopic Optics Tōkyō; Kyōto |
| building | Verbundindex |
| bvnumber | BV014100732 |
| callnumber-first | Q - Science |
| callnumber-label | QC1 |
| callnumber-raw | QC1 |
| callnumber-search | QC1 |
| callnumber-sort | QC 11 |
| callnumber-subject | QC - Physics |
| contents | Light fluctuations as a new spectroscopic tool Attempts to treat nonlinear imaging devices Infrared optical materials, old and new Canonical pupil coordinates in geometrical and diffraction image theory Analytical determination of axial spherical aberration in spherical-mirror systems Principal points, cardinal axis and focal planes of a slightly decentred optical system <<The>> correction of optical systems Optical transfer function and lens design techniques Objectifs photographiques grand-angulaires utilisant une surface parabolique - Wide angle camera lens with parabolic surface <<A>> series of lenses designed for optimum performance Automatic lens design by statistical analysis Automatic lens design Some examples of lens designing by computer Some experiments on automatic optical design Some properties of diapoints Some applications of the wave front shearing interferometer Some applications of the gas laser as a source of light for the testing of optical systems Lenses for ultra-microphotography New instrument for assessing lens quality by pupil scanning (Spot diagram generation) High speed image synthesizer Measuring instruments for optical transfer function Automatic recording instrument for measuring optical transfer functions <<Le>> transfert de modulation des objectifs <<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method <<An>> instrument for the evaluation of the image performance of photographic lenses Measurement of OTF using large test pattern of single frequency <<A>> polarizing shearing interferometer for evaluating photographic optics Experimental measurements of modulation transfer functions of intensifier and fluorescent screens <<The>> application of optical transfer function in radiography <<A>> new definition of photographic image information Sensitivity and sharpness of X-ray film exposed with intensifying screens <<The>> determination of the modulation transfer function of color films Evaluation of light-scattering-images Some properties of random charts Geometrical optical approximation of optical transfer function Effects of large aberration on the optical transfer function Transfer functions for wide spectrum imagery <<The>> aberration synthesizer Chromatic aberrations and optical transfer functions of photographic lenses Formation of images in coherent and partially coherent illumination Image-forming performance of projection systems Recherches récentes sur la cohérence partielle Improvement in resolving power of optical systems Superresolution image-forming systems for objects with restricted lambda dependence Far-field diffraction patterns of single and multiple circularly symmetric apertures Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols Intensity distribution near the focus of a large aperture optical system Evaluation of optical image by wave aberration <<A>> new method of measuring particle size by diffraction techniques Effect of coherence on the slit function Role of fiber optics in photography Image transfer properties of fiber bundle <<The>> chemical resistance of optical glasses On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS Spectral reflectance of Lippmann plate Far infrared spectroscopy Far infrared spectrometer with a variable depth grating <<An>> application of double chopping system to far infrared spectrophotometer <<A>> far infrared spectrometer designed mainly for use in solid state physics Versatile far infrared spectrophotometer Récents développements du spectromètre O.N.E.R.A Instrumental problems in high resolution infrared spectroscopy Self calibration and automatic correction for the wavelength response of a monochromator-dectector system Transmission grating as an infrared filter Progrès récents en spectroscopie interférentielle Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer High resolution far infrared interferometry with application to solid state physics Recent techniques in far infrared spectroscopy <<A>> new computing method for interference spectroscopy Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer <<A>> new design of a scanning Fabry-Pérot interferometer Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC Nouvelle méthode spectrométrique interférentielle Profile analysis of spectral line by Fabry-Perot interferometer High resolution vacuum spectrograph Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue <<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet Collimating grating monochromators for vacuum ultraviolet <<An>> ultraviolet rocket stellar spectrometer <<An>> ultraviolet spectrophotometer for satellite astronomy Some instrumentation problems in the vacuum ultraviolet below 1000 Å Argon, krypton and xenon continuum light sources for the vacuum ultraviolet Extreme ultraviolet emission from beryllium oxide <<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain Ultraviolet photography and spectroscopy using a spectrally selective image Possible uses of thin films as polarizers in the vacuum ultraviolet region Polarizers for the extreme ultraviolet Determination of optical constants of glasses in the vacuum ultraviolet region Recent instrumentation for the optical studies of solids in the vacuum ultraviolet Application of vacuum ultraviolet spectroscopy in solid state physics <<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region Etude théorique de la diffraction de la lumière par les réseaux On the ruling errors of a diffraction grating and their effects on the spectral lines Modern diffraction gratings Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures Optical measurement of several materials in the far infrared region Far infrared spectroscopy of compressed gases using a Michelson interferometer <<An>> absolute method of determining transmission and reflection coefficients |
| ctrlnum | (OCoLC)255635466 (DE-599)BVBBV014100732 |
| dewey-full | 770 |
| dewey-hundreds | 700 - The arts |
| dewey-ones | 770 - Photography, computer art, cinematography |
| dewey-raw | 770 |
| dewey-search | 770 |
| dewey-sort | 3770 |
| dewey-tens | 770 - Photography, computer art, cinematography |
| discipline | Kunstgeschichte |
| format | Conference Proceeding Book |
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Kato</subfield><subfield code="t">Some applications of the wave front shearing interferometer</subfield><subfield code="r">J.B. Saunders</subfield><subfield code="t">Some applications of the gas laser as a source of light for the testing of optical systems</subfield><subfield code="r">M.V.R.K. Murty and D. Malacara-Hernandez</subfield><subfield code="t">Lenses for ultra-microphotography</subfield><subfield code="r">Z. Koana and Z. Wakimoto</subfield><subfield code="t">New instrument for assessing lens quality by pupil scanning (Spot diagram generation)</subfield><subfield code="r">L.R. Baker and J.N. Whyte</subfield></datafield><datafield tag="505" ind1="8" ind2="0"><subfield code="t">High speed image synthesizer</subfield><subfield code="r">T. Suzuki, Y. Ichioka, and M. Koyama</subfield><subfield code="t">Measuring instruments for optical transfer function</subfield><subfield code="r">H. Kubota</subfield><subfield code="t">Automatic recording instrument for measuring optical transfer functions</subfield><subfield code="r">L.R. Baker</subfield><subfield code="t"><<Le>> transfert de modulation des objectifs</subfield><subfield code="r">J.F. Simon</subfield><subfield code="t"><<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method</subfield><subfield code="r">T. Ose, M. Takashima, and I. Yamaguchi</subfield><subfield code="t"><<An>> instrument for the evaluation of the image performance of photographic lenses</subfield><subfield code="r">K. Murata and H. Matsui</subfield><subfield code="t">Measurement of OTF using large test pattern of single frequency</subfield><subfield code="r">S. Tatuoka</subfield><subfield code="t"><<A>> polarizing shearing interferometer for evaluating photographic optics</subfield><subfield code="r">T. Tsuruta</subfield><subfield code="t">Experimental measurements of modulation transfer functions of intensifier and fluorescent screens</subfield><subfield code="r">H.A.W. Schober, R. Rohler, and H. Pulvermacher</subfield><subfield code="t"><<The>> application of optical transfer function in radiography</subfield><subfield code="r">K. Doi, A. Kaji, T. Takizawa, and K. Sayanagi</subfield><subfield code="t"><<A>> new definition of photographic image information</subfield><subfield code="r">H. Kanamori</subfield><subfield code="t">Sensitivity and sharpness of X-ray film exposed with intensifying screens</subfield><subfield code="r">W.F. Berg and A. Spühler</subfield><subfield code="t"><<The>> determination of the modulation transfer function of color films</subfield><subfield code="r">S. Ooue and I. Hatanaka</subfield><subfield code="t">Evaluation of light-scattering-images</subfield><subfield code="r">J.C. Urbach</subfield><subfield code="t">Some properties of random charts</subfield><subfield code="r">K. Kinoshita</subfield><subfield code="t">Geometrical optical approximation of optical transfer function</subfield><subfield code="r">K. Miyamoto</subfield><subfield code="t">Effects of large aberration on the optical transfer function</subfield><subfield code="r">I. Ogura</subfield></datafield><datafield tag="505" ind1="8" ind2="0"><subfield code="t">Transfer functions for wide spectrum imagery</subfield><subfield code="r">R.R. Shannon</subfield><subfield code="t"><<The>> aberration synthesizer</subfield><subfield code="r">Y. Matsui and M. Takashima</subfield><subfield code="t">Chromatic aberrations and optical transfer functions of photographic lenses</subfield><subfield code="r">K. Rosenhauer and K.J. Rosenbruch</subfield><subfield code="t">Formation of images in coherent and partially coherent illumination</subfield><subfield code="r">A. Maréchal</subfield><subfield code="t">Image-forming performance of projection systems</subfield><subfield code="r">J. Tsujiuchi</subfield><subfield code="t">Recherches récentes sur la cohérence partielle</subfield><subfield code="r">G. Nomarski</subfield><subfield code="t">Improvement in resolving power of optical systems</subfield><subfield code="r">G. Lansraux</subfield><subfield code="t">Superresolution image-forming systems for objects with restricted lambda dependence</subfield><subfield code="r">J.D. Armitage, A. Lohmann, and D.P. Paris</subfield><subfield code="t">Far-field diffraction patterns of single and multiple circularly symmetric apertures</subfield><subfield code="r">A.I. Mahan, C.V. Bitterli, and S.M. Cannon</subfield><subfield code="t">Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols</subfield><subfield code="r">T. Asakura and Tsuneko Suzuki</subfield><subfield code="t">Intensity distribution near the focus of a large aperture optical system</subfield><subfield code="r">S. Maruyama</subfield><subfield code="t">Evaluation of optical image by wave aberration</subfield><subfield code="r">K.P. Miyake</subfield><subfield code="t"><<A>> new method of measuring particle size by diffraction techniques</subfield><subfield code="r">B.J. Thompson</subfield><subfield code="t">Effect of coherence on the slit function</subfield><subfield code="r">H. Sakai</subfield><subfield code="t">Role of fiber optics in photography</subfield><subfield code="r">N.S. Kapany</subfield><subfield code="t">Image transfer properties of fiber bundle</subfield><subfield code="r">H. Ohzu, T. Sawatari, and K. Sayanagi</subfield><subfield code="t"><<The>> chemical resistance of optical glasses</subfield><subfield code="r">A.M. Reid, R.J. Parry, and J. Blackburn</subfield><subfield code="t">On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters</subfield><subfield code="r">R. Jacobsson and J.O. Mårtensson</subfield></datafield><datafield tag="505" ind1="8" ind2="0"><subfield code="t">Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS</subfield><subfield code="r">K. Kinosita, K. Nakamizo, K. Maki, K. Onuki, and K. Takeuchi</subfield><subfield code="t">Spectral reflectance of Lippmann plate</subfield><subfield code="r">M. Iwata, R. Makabe, and S. Katsube</subfield><subfield code="t">Far infrared spectroscopy</subfield><subfield code="r">L. Genzel</subfield><subfield code="t">Far infrared spectrometer with a variable depth grating</subfield><subfield code="r">T. Sakurai and S. Takahashi</subfield><subfield code="t"><<An>> application of double chopping system to far infrared spectrophotometer</subfield><subfield code="r">S. Minami, H. Yoshinaga, and K. Matsunaga</subfield><subfield code="t"><<A>> far infrared spectrometer designed mainly for use in solid state physics</subfield><subfield code="r">I. Makino, T. Iwasaki, and I. Iwahashi</subfield><subfield code="t">Versatile far infrared spectrophotometer</subfield><subfield code="r">K. Kudo and Y. Mochida</subfield><subfield code="t">Récents développements du spectromètre O.N.E.R.A</subfield><subfield code="r">A. Girard</subfield><subfield code="t">Instrumental problems in high resolution infrared spectroscopy</subfield><subfield code="r">H. Makabe, Y. Fukuda, and S. Hashizume</subfield><subfield code="t">Self calibration and automatic correction for the wavelength response of a monochromator-dectector system</subfield><subfield code="r">R.A. Brower and A.T. Stair, Jr.</subfield><subfield code="t">Transmission grating as an infrared filter</subfield><subfield code="r">Y. Sakayangi</subfield><subfield code="t">Progrès récents en spectroscopie interférentielle</subfield><subfield code="r">P. Jacquinot</subfield><subfield code="t">Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer</subfield><subfield code="r">E.E. Bell</subfield><subfield code="t">High resolution far infrared interferometry with application to solid state physics</subfield><subfield code="r">P.L. Richards</subfield><subfield code="t">Recent techniques in far infrared spectroscopy</subfield><subfield code="r">H. Yoshinaga</subfield><subfield code="t"><<A>> new computing method for interference spectroscopy</subfield><subfield code="r">S. Fujita, H. Yoshinaga, K. Chiba, K. Nakano, S. Yoshida, and H. Sugimori</subfield></datafield><datafield tag="505" ind1="8" ind2="0"><subfield code="t">Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer</subfield><subfield code="r">S.P. Stewart, E.R. Huppi, A.T. Stair jr., and G.A. Vanasse</subfield><subfield code="t"><<A>> new design of a scanning Fabry-Pérot interferometer</subfield><subfield code="r">P.N. Slater, H.T. Betz, and G. Henderson</subfield><subfield code="t">Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC</subfield><subfield code="r">R. Chabbal et R. Pelletier</subfield><subfield code="t">Nouvelle méthode spectrométrique interférentielle</subfield><subfield code="r">R. Prat</subfield><subfield code="t">Profile analysis of spectral line by Fabry-Perot interferometer</subfield><subfield code="r">T. Tako and M. Ohi</subfield><subfield code="t">High resolution vacuum spectrograph</subfield><subfield code="r">G.H. Dieke and D.F. Heath</subfield><subfield code="t">Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue</subfield><subfield code="r">B. Vodar</subfield><subfield code="t"><<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet</subfield><subfield code="r">D.J. Bradley, B. Bates, C.O.L. Juulman, and S. Majumdar</subfield><subfield code="t">Collimating grating monochromators for vacuum ultraviolet</subfield><subfield code="r">D.E. Bedo and H.E. Hinteregger</subfield><subfield code="t"><<An>> ultraviolet rocket stellar spectrometer</subfield><subfield code="r">D.U. Wright, jr.</subfield><subfield code="t"><<An>> ultraviolet spectrophotometer for satellite astronomy</subfield><subfield code="r">K. Hallam and J. Mangus</subfield><subfield code="t">Some instrumentation problems in the vacuum ultraviolet below 1000 Å</subfield><subfield code="r">G.L. Weissler</subfield><subfield code="t">Argon, krypton and xenon continuum light sources for the vacuum ultraviolet</subfield><subfield code="r">R.E. Huffman, Y. Tanaka, and J.C. Larrabee</subfield><subfield code="t">Extreme ultraviolet emission from beryllium oxide</subfield><subfield code="r">K. Fukuda, Y. Uchida, and M. Nakagawa</subfield><subfield code="t"><<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain</subfield><subfield code="r">J. Romand</subfield><subfield code="t">Ultraviolet photography and spectroscopy using a spectrally selective image</subfield><subfield code="r">L. Dunkelman and J.P. Hennes</subfield></datafield><datafield tag="505" ind1="8" ind2="0"><subfield code="t">Possible uses of thin films as polarizers in the vacuum ultraviolet region</subfield><subfield code="r">F. Abelès</subfield><subfield code="t">Polarizers for the extreme ultraviolet</subfield><subfield code="r">W.R. Hunter</subfield><subfield code="t">Determination of optical constants of glasses in the vacuum ultraviolet region</subfield><subfield code="r">F. Sasaki, H. Fukutani, K. Ishiguro, and T. Izumitani</subfield><subfield code="t">Recent instrumentation for the optical studies of solids in the vacuum ultraviolet</subfield><subfield code="r">P.L. Hartman</subfield><subfield code="t">Application of vacuum ultraviolet spectroscopy in solid state physics</subfield><subfield code="r">Wm.A. Rense</subfield><subfield code="t"><<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region</subfield><subfield code="r">D.H. Tomboulian</subfield><subfield code="t">Etude théorique de la diffraction de la lumière par les réseaux</subfield><subfield code="r">P. Bousquet</subfield><subfield code="t">On the ruling errors of a diffraction grating and their effects on the spectral lines</subfield><subfield code="r">K. Shimizu</subfield><subfield code="t">Modern diffraction gratings</subfield><subfield code="r">D. Richardson</subfield><subfield code="t">Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures</subfield><subfield code="r">C.H. Perry</subfield><subfield code="t">Optical measurement of several materials in the far infrared region</subfield><subfield code="r">A. Mitsuishi, H. Yoshinaga, K. Yata and A. Manabe</subfield><subfield code="t">Far infrared spectroscopy of compressed gases using a Michelson interferometer</subfield><subfield code="r">D.R. Bosomworth and H.P. Gush</subfield><subfield code="t"><<An>> absolute method of determining transmission and reflection coefficients</subfield><subfield code="r">S.J. Fray, A.R. Goodwin, F.A. Johnson, and J.E. 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| genre | (DE-588)1071861417 Konferenzschrift gnd-content (DE-588)1071861417 Konferenzschrift 1964 Tokyo and Kyoto gnd-content |
| genre_facet | Konferenzschrift Konferenzschrift 1964 Tokyo and Kyoto |
| id | DE-604.BV014100732 |
| illustrated | Illustrated |
| indexdate | 2025-01-28T11:12:10Z |
| institution | BVB |
| institution_GND | (DE-588)5254670-6 (DE-588)1460-6 |
| language | English French |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009658926 |
| oclc_num | 255635466 |
| open_access_boolean | |
| owner | DE-83 DE-188 |
| owner_facet | DE-83 DE-188 |
| physical | XXI, 669 Seiten Illustrationen, Diagramme |
| publishDate | 1965 |
| publishDateSearch | 1965 |
| publishDateSort | 1965 |
| publisher | Japanese Journal of Applied Physics |
| record_format | marc |
| series | Japanese journal of applied physics |
| series2 | Japanese journal of applied physics : Supplement |
| spelling | Conference on Photographic and Spectroscopic Optics 1964 Tōkyō; Kyōto Verfasser (DE-588)5254670-6 aut Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 held under the auspices of the International Commission for Optics ; arranged by the Science Council of Japan and the Japan Society of Applied Physics Tokyo Japanese Journal of Applied Physics 1965 XXI, 669 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Japanese journal of applied physics : Supplement Volume 4, Supplement I Light fluctuations as a new spectroscopic tool E. Wolf Attempts to treat nonlinear imaging devices E. Ingelstam Infrared optical materials, old and new S.S. Ballard Canonical pupil coordinates in geometrical and diffraction image theory H.H. Hopkins Analytical determination of axial spherical aberration in spherical-mirror systems P. Lindberg Principal points, cardinal axis and focal planes of a slightly decentred optical system J. Bartkowska <<The>> correction of optical systems M. Herzberger Optical transfer function and lens design techniques K. Sayanagi Objectifs photographiques grand-angulaires utilisant une surface parabolique - Wide angle camera lens with parabolic surface Ed. Hugues <<A>> series of lenses designed for optimum performance R.E. Hopkins Automatic lens design by statistical analysis B. Brixner Automatic lens design T. Suzuki, Y. Ichioka, S. Yonezawa, and M. Koyama Some examples of lens designing by computer C.G. Wynne Some experiments on automatic optical design Y. Matsui and R. Hirose Some properties of diapoints S. Kato Some applications of the wave front shearing interferometer J.B. Saunders Some applications of the gas laser as a source of light for the testing of optical systems M.V.R.K. Murty and D. Malacara-Hernandez Lenses for ultra-microphotography Z. Koana and Z. Wakimoto New instrument for assessing lens quality by pupil scanning (Spot diagram generation) L.R. Baker and J.N. Whyte High speed image synthesizer T. Suzuki, Y. Ichioka, and M. Koyama Measuring instruments for optical transfer function H. Kubota Automatic recording instrument for measuring optical transfer functions L.R. Baker <<Le>> transfert de modulation des objectifs J.F. Simon <<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method T. Ose, M. Takashima, and I. Yamaguchi <<An>> instrument for the evaluation of the image performance of photographic lenses K. Murata and H. Matsui Measurement of OTF using large test pattern of single frequency S. Tatuoka <<A>> polarizing shearing interferometer for evaluating photographic optics T. Tsuruta Experimental measurements of modulation transfer functions of intensifier and fluorescent screens H.A.W. Schober, R. Rohler, and H. Pulvermacher <<The>> application of optical transfer function in radiography K. Doi, A. Kaji, T. Takizawa, and K. Sayanagi <<A>> new definition of photographic image information H. Kanamori Sensitivity and sharpness of X-ray film exposed with intensifying screens W.F. Berg and A. Spühler <<The>> determination of the modulation transfer function of color films S. Ooue and I. Hatanaka Evaluation of light-scattering-images J.C. Urbach Some properties of random charts K. Kinoshita Geometrical optical approximation of optical transfer function K. Miyamoto Effects of large aberration on the optical transfer function I. Ogura Transfer functions for wide spectrum imagery R.R. Shannon <<The>> aberration synthesizer Y. Matsui and M. Takashima Chromatic aberrations and optical transfer functions of photographic lenses K. Rosenhauer and K.J. Rosenbruch Formation of images in coherent and partially coherent illumination A. Maréchal Image-forming performance of projection systems J. Tsujiuchi Recherches récentes sur la cohérence partielle G. Nomarski Improvement in resolving power of optical systems G. Lansraux Superresolution image-forming systems for objects with restricted lambda dependence J.D. Armitage, A. Lohmann, and D.P. Paris Far-field diffraction patterns of single and multiple circularly symmetric apertures A.I. Mahan, C.V. Bitterli, and S.M. Cannon Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols T. Asakura and Tsuneko Suzuki Intensity distribution near the focus of a large aperture optical system S. Maruyama Evaluation of optical image by wave aberration K.P. Miyake <<A>> new method of measuring particle size by diffraction techniques B.J. Thompson Effect of coherence on the slit function H. Sakai Role of fiber optics in photography N.S. Kapany Image transfer properties of fiber bundle H. Ohzu, T. Sawatari, and K. Sayanagi <<The>> chemical resistance of optical glasses A.M. Reid, R.J. Parry, and J. Blackburn On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters R. Jacobsson and J.O. Mårtensson Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS K. Kinosita, K. Nakamizo, K. Maki, K. Onuki, and K. Takeuchi Spectral reflectance of Lippmann plate M. Iwata, R. Makabe, and S. Katsube Far infrared spectroscopy L. Genzel Far infrared spectrometer with a variable depth grating T. Sakurai and S. Takahashi <<An>> application of double chopping system to far infrared spectrophotometer S. Minami, H. Yoshinaga, and K. Matsunaga <<A>> far infrared spectrometer designed mainly for use in solid state physics I. Makino, T. Iwasaki, and I. Iwahashi Versatile far infrared spectrophotometer K. Kudo and Y. Mochida Récents développements du spectromètre O.N.E.R.A A. Girard Instrumental problems in high resolution infrared spectroscopy H. Makabe, Y. Fukuda, and S. Hashizume Self calibration and automatic correction for the wavelength response of a monochromator-dectector system R.A. Brower and A.T. Stair, Jr. Transmission grating as an infrared filter Y. Sakayangi Progrès récents en spectroscopie interférentielle P. Jacquinot Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer E.E. Bell High resolution far infrared interferometry with application to solid state physics P.L. Richards Recent techniques in far infrared spectroscopy H. Yoshinaga <<A>> new computing method for interference spectroscopy S. Fujita, H. Yoshinaga, K. Chiba, K. Nakano, S. Yoshida, and H. Sugimori Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer S.P. Stewart, E.R. Huppi, A.T. Stair jr., and G.A. Vanasse <<A>> new design of a scanning Fabry-Pérot interferometer P.N. Slater, H.T. Betz, and G. Henderson Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC R. Chabbal et R. Pelletier Nouvelle méthode spectrométrique interférentielle R. Prat Profile analysis of spectral line by Fabry-Perot interferometer T. Tako and M. Ohi High resolution vacuum spectrograph G.H. Dieke and D.F. Heath Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue B. Vodar <<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet D.J. Bradley, B. Bates, C.O.L. Juulman, and S. Majumdar Collimating grating monochromators for vacuum ultraviolet D.E. Bedo and H.E. Hinteregger <<An>> ultraviolet rocket stellar spectrometer D.U. Wright, jr. <<An>> ultraviolet spectrophotometer for satellite astronomy K. Hallam and J. Mangus Some instrumentation problems in the vacuum ultraviolet below 1000 Å G.L. Weissler Argon, krypton and xenon continuum light sources for the vacuum ultraviolet R.E. Huffman, Y. Tanaka, and J.C. Larrabee Extreme ultraviolet emission from beryllium oxide K. Fukuda, Y. Uchida, and M. Nakagawa <<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain J. Romand Ultraviolet photography and spectroscopy using a spectrally selective image L. Dunkelman and J.P. Hennes Possible uses of thin films as polarizers in the vacuum ultraviolet region F. Abelès Polarizers for the extreme ultraviolet W.R. Hunter Determination of optical constants of glasses in the vacuum ultraviolet region F. Sasaki, H. Fukutani, K. Ishiguro, and T. Izumitani Recent instrumentation for the optical studies of solids in the vacuum ultraviolet P.L. Hartman Application of vacuum ultraviolet spectroscopy in solid state physics Wm.A. Rense <<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region D.H. Tomboulian Etude théorique de la diffraction de la lumière par les réseaux P. Bousquet On the ruling errors of a diffraction grating and their effects on the spectral lines K. Shimizu Modern diffraction gratings D. Richardson Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures C.H. Perry Optical measurement of several materials in the far infrared region A. Mitsuishi, H. Yoshinaga, K. Yata and A. Manabe Far infrared spectroscopy of compressed gases using a Michelson interferometer D.R. Bosomworth and H.P. Gush <<An>> absolute method of determining transmission and reflection coefficients S.J. Fray, A.R. Goodwin, F.A. Johnson, and J.E. Quarrington Instr. & méthodes obspm Photographie - Congrès ram Photographie obspm Spectroscopie obspm Optics and Photonics Congresses Photographic optics Congresses Photography Congresses Spectrum Analysis Congresses Spectrum analysis Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-588)1071861417 Konferenzschrift 1964 Tokyo and Kyoto gnd-content International Commission for Optics (DE-588)1460-6 oth Japanese journal of applied physics Supplement ; Volume 4, Supplement I (DE-604)BV001888390 4,1 |
| spellingShingle | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 Japanese journal of applied physics Light fluctuations as a new spectroscopic tool Attempts to treat nonlinear imaging devices Infrared optical materials, old and new Canonical pupil coordinates in geometrical and diffraction image theory Analytical determination of axial spherical aberration in spherical-mirror systems Principal points, cardinal axis and focal planes of a slightly decentred optical system <<The>> correction of optical systems Optical transfer function and lens design techniques Objectifs photographiques grand-angulaires utilisant une surface parabolique - Wide angle camera lens with parabolic surface <<A>> series of lenses designed for optimum performance Automatic lens design by statistical analysis Automatic lens design Some examples of lens designing by computer Some experiments on automatic optical design Some properties of diapoints Some applications of the wave front shearing interferometer Some applications of the gas laser as a source of light for the testing of optical systems Lenses for ultra-microphotography New instrument for assessing lens quality by pupil scanning (Spot diagram generation) High speed image synthesizer Measuring instruments for optical transfer function Automatic recording instrument for measuring optical transfer functions <<Le>> transfert de modulation des objectifs <<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method <<An>> instrument for the evaluation of the image performance of photographic lenses Measurement of OTF using large test pattern of single frequency <<A>> polarizing shearing interferometer for evaluating photographic optics Experimental measurements of modulation transfer functions of intensifier and fluorescent screens <<The>> application of optical transfer function in radiography <<A>> new definition of photographic image information Sensitivity and sharpness of X-ray film exposed with intensifying screens <<The>> determination of the modulation transfer function of color films Evaluation of light-scattering-images Some properties of random charts Geometrical optical approximation of optical transfer function Effects of large aberration on the optical transfer function Transfer functions for wide spectrum imagery <<The>> aberration synthesizer Chromatic aberrations and optical transfer functions of photographic lenses Formation of images in coherent and partially coherent illumination Image-forming performance of projection systems Recherches récentes sur la cohérence partielle Improvement in resolving power of optical systems Superresolution image-forming systems for objects with restricted lambda dependence Far-field diffraction patterns of single and multiple circularly symmetric apertures Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols Intensity distribution near the focus of a large aperture optical system Evaluation of optical image by wave aberration <<A>> new method of measuring particle size by diffraction techniques Effect of coherence on the slit function Role of fiber optics in photography Image transfer properties of fiber bundle <<The>> chemical resistance of optical glasses On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS Spectral reflectance of Lippmann plate Far infrared spectroscopy Far infrared spectrometer with a variable depth grating <<An>> application of double chopping system to far infrared spectrophotometer <<A>> far infrared spectrometer designed mainly for use in solid state physics Versatile far infrared spectrophotometer Récents développements du spectromètre O.N.E.R.A Instrumental problems in high resolution infrared spectroscopy Self calibration and automatic correction for the wavelength response of a monochromator-dectector system Transmission grating as an infrared filter Progrès récents en spectroscopie interférentielle Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer High resolution far infrared interferometry with application to solid state physics Recent techniques in far infrared spectroscopy <<A>> new computing method for interference spectroscopy Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer <<A>> new design of a scanning Fabry-Pérot interferometer Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC Nouvelle méthode spectrométrique interférentielle Profile analysis of spectral line by Fabry-Perot interferometer High resolution vacuum spectrograph Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue <<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet Collimating grating monochromators for vacuum ultraviolet <<An>> ultraviolet rocket stellar spectrometer <<An>> ultraviolet spectrophotometer for satellite astronomy Some instrumentation problems in the vacuum ultraviolet below 1000 Å Argon, krypton and xenon continuum light sources for the vacuum ultraviolet Extreme ultraviolet emission from beryllium oxide <<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain Ultraviolet photography and spectroscopy using a spectrally selective image Possible uses of thin films as polarizers in the vacuum ultraviolet region Polarizers for the extreme ultraviolet Determination of optical constants of glasses in the vacuum ultraviolet region Recent instrumentation for the optical studies of solids in the vacuum ultraviolet Application of vacuum ultraviolet spectroscopy in solid state physics <<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region Etude théorique de la diffraction de la lumière par les réseaux On the ruling errors of a diffraction grating and their effects on the spectral lines Modern diffraction gratings Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures Optical measurement of several materials in the far infrared region Far infrared spectroscopy of compressed gases using a Michelson interferometer <<An>> absolute method of determining transmission and reflection coefficients Instr. & méthodes obspm Photographie - Congrès ram Photographie obspm Spectroscopie obspm Optics and Photonics Congresses Photographic optics Congresses Photography Congresses Spectrum Analysis Congresses Spectrum analysis Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 |
| title_alt | Light fluctuations as a new spectroscopic tool Attempts to treat nonlinear imaging devices Infrared optical materials, old and new Canonical pupil coordinates in geometrical and diffraction image theory Analytical determination of axial spherical aberration in spherical-mirror systems Principal points, cardinal axis and focal planes of a slightly decentred optical system <<The>> correction of optical systems Optical transfer function and lens design techniques Objectifs photographiques grand-angulaires utilisant une surface parabolique - Wide angle camera lens with parabolic surface <<A>> series of lenses designed for optimum performance Automatic lens design by statistical analysis Automatic lens design Some examples of lens designing by computer Some experiments on automatic optical design Some properties of diapoints Some applications of the wave front shearing interferometer Some applications of the gas laser as a source of light for the testing of optical systems Lenses for ultra-microphotography New instrument for assessing lens quality by pupil scanning (Spot diagram generation) High speed image synthesizer Measuring instruments for optical transfer function Automatic recording instrument for measuring optical transfer functions <<Le>> transfert de modulation des objectifs <<A>> measuring instrument for optical transfer function: by means of electrical frequency analysis method <<An>> instrument for the evaluation of the image performance of photographic lenses Measurement of OTF using large test pattern of single frequency <<A>> polarizing shearing interferometer for evaluating photographic optics Experimental measurements of modulation transfer functions of intensifier and fluorescent screens <<The>> application of optical transfer function in radiography <<A>> new definition of photographic image information Sensitivity and sharpness of X-ray film exposed with intensifying screens <<The>> determination of the modulation transfer function of color films Evaluation of light-scattering-images Some properties of random charts Geometrical optical approximation of optical transfer function Effects of large aberration on the optical transfer function Transfer functions for wide spectrum imagery <<The>> aberration synthesizer Chromatic aberrations and optical transfer functions of photographic lenses Formation of images in coherent and partially coherent illumination Image-forming performance of projection systems Recherches récentes sur la cohérence partielle Improvement in resolving power of optical systems Superresolution image-forming systems for objects with restricted lambda dependence Far-field diffraction patterns of single and multiple circularly symmetric apertures Diffraction anomaly of various types of extended source: by polarizing microscope with crossed nicols Intensity distribution near the focus of a large aperture optical system Evaluation of optical image by wave aberration <<A>> new method of measuring particle size by diffraction techniques Effect of coherence on the slit function Role of fiber optics in photography Image transfer properties of fiber bundle <<The>> chemical resistance of optical glasses On the evaporation of two-component dielectric thin films for reflection-reducing coatings and interference filters Mechanical stresses in vacuum deposited films of Ag, MgF2 and ZnS Spectral reflectance of Lippmann plate Far infrared spectroscopy Far infrared spectrometer with a variable depth grating <<An>> application of double chopping system to far infrared spectrophotometer <<A>> far infrared spectrometer designed mainly for use in solid state physics Versatile far infrared spectrophotometer Récents développements du spectromètre O.N.E.R.A Instrumental problems in high resolution infrared spectroscopy Self calibration and automatic correction for the wavelength response of a monochromator-dectector system Transmission grating as an infrared filter Progrès récents en spectroscopie interférentielle Measurement of spectral transmittance and reflectance with a far infrared Michelson interferometer High resolution far infrared interferometry with application to solid state physics Recent techniques in far infrared spectroscopy <<A>> new computing method for interference spectroscopy Spectra of argon in the 2-6 μ region obtained with a field-widened interferometer <<A>> new design of a scanning Fabry-Pérot interferometer Principe et réalisation d'un spectromètre Fabry-Perot multicanal: le SIMAC Nouvelle méthode spectrométrique interférentielle Profile analysis of spectral line by Fabry-Perot interferometer High resolution vacuum spectrograph Instruments et techniques pour l'ultraviolet lointain au C.N.R.S.-Bellevue <<The>> Fabry-Perot interferometer in the middle and vacuum ultraviolet Collimating grating monochromators for vacuum ultraviolet <<An>> ultraviolet rocket stellar spectrometer <<An>> ultraviolet spectrophotometer for satellite astronomy Some instrumentation problems in the vacuum ultraviolet below 1000 Å Argon, krypton and xenon continuum light sources for the vacuum ultraviolet Extreme ultraviolet emission from beryllium oxide <<Les>> étincelles sous vide utilisées comme source de lumière pour l'ultraviolet lointain Ultraviolet photography and spectroscopy using a spectrally selective image Possible uses of thin films as polarizers in the vacuum ultraviolet region Polarizers for the extreme ultraviolet Determination of optical constants of glasses in the vacuum ultraviolet region Recent instrumentation for the optical studies of solids in the vacuum ultraviolet Application of vacuum ultraviolet spectroscopy in solid state physics <<The>> measurement of absolute photon fluxes in the 100 Å to 300 Å region Etude théorique de la diffraction de la lumière par les réseaux On the ruling errors of a diffraction grating and their effects on the spectral lines Modern diffraction gratings Far infrared reflectance spectra and dielectric dispersion of a variety of materials having the perovoskite and related structures Optical measurement of several materials in the far infrared region Far infrared spectroscopy of compressed gases using a Michelson interferometer <<An>> absolute method of determining transmission and reflection coefficients |
| title_auth | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 |
| title_exact_search | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 |
| title_full | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 held under the auspices of the International Commission for Optics ; arranged by the Science Council of Japan and the Japan Society of Applied Physics |
| title_fullStr | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 held under the auspices of the International Commission for Optics ; arranged by the Science Council of Japan and the Japan Society of Applied Physics |
| title_full_unstemmed | Proceedings of the Conference on Photographic and Spectroscopic Optics Tokyo and Kyoto 1964 held under the auspices of the International Commission for Optics ; arranged by the Science Council of Japan and the Japan Society of Applied Physics |
| title_short | Proceedings of the Conference on Photographic and Spectroscopic Optics |
| title_sort | proceedings of the conference on photographic and spectroscopic optics tokyo and kyoto 1964 |
| title_sub | Tokyo and Kyoto 1964 |
| topic | Instr. & méthodes obspm Photographie - Congrès ram Photographie obspm Spectroscopie obspm Optics and Photonics Congresses Photographic optics Congresses Photography Congresses Spectrum Analysis Congresses Spectrum analysis Congresses |
| topic_facet | Instr. & méthodes Photographie - Congrès Photographie Spectroscopie Optics and Photonics Congresses Photographic optics Congresses Photography Congresses Spectrum Analysis Congresses Spectrum analysis Congresses Konferenzschrift Konferenzschrift 1964 Tokyo and Kyoto |
| volume_link | (DE-604)BV001888390 |
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