Optical measurement and nondestructive testing: techniques and applications ; 8 - 10 November 2000, Beijing, China
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
SPIE
2000
|
Schriftenreihe: | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers
4221 |
Schlagworte: | |
Beschreibung: | XIX, 468 S. Ill., graph. Darst. |
ISBN: | 0819438928 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV014093870 | ||
003 | DE-604 | ||
005 | 20020813 | ||
007 | t | ||
008 | 020116s2000 ad|| |||| 10||| eng d | ||
020 | |a 0819438928 |9 0-8194-3892-8 | ||
035 | |a (OCoLC)45851160 | ||
035 | |a (DE-599)BVBBV014093870 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-703 | ||
050 | 0 | |a QC367 | |
050 | 0 | |a TS510 | |
082 | 0 | |a 681/.25 |2 21 | |
084 | |a UH 5725 |0 (DE-625)145699: |2 rvk | ||
245 | 1 | 0 | |a Optical measurement and nondestructive testing |b techniques and applications ; 8 - 10 November 2000, Beijing, China |c FeiJun Song ... chairs/ed. |
264 | 1 | |a Bellingham, Wash. |b SPIE |c 2000 | |
300 | |a XIX, 468 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |v 4221 | |
650 | 4 | |a Nondestructive testing |v Congresses | |
650 | 4 | |a Optical measurements |v Congresses | |
650 | 4 | |a Optoelectronic devices |x Industrial applications |v Congresses | |
650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2000 |z Peking |2 gnd-content | |
689 | 0 | 0 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
689 | 0 | 1 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Song, FeiJun |e Sonstige |4 oth | |
810 | 2 | |a Society of Photo-Optical Instrumentation Engineers |t Proceedings of SPIE |v 4221 |w (DE-604)BV000010887 |9 4221 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009655322 |
Datensatz im Suchindex
_version_ | 1804128960378830848 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV014093870 |
callnumber-first | Q - Science |
callnumber-label | QC367 |
callnumber-raw | QC367 TS510 |
callnumber-search | QC367 TS510 |
callnumber-sort | QC 3367 |
callnumber-subject | QC - Physics |
classification_rvk | UH 5725 |
ctrlnum | (OCoLC)45851160 (DE-599)BVBBV014093870 |
dewey-full | 681/.25 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 681 - Precision instruments and other devices |
dewey-raw | 681/.25 |
dewey-search | 681/.25 |
dewey-sort | 3681 225 |
dewey-tens | 680 - Manufacture of products for specific uses |
discipline | Physik Handwerk und Gewerbe / Verschiedene Technologien |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01701nam a2200433 cb4500</leader><controlfield tag="001">BV014093870</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020813 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020116s2000 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819438928</subfield><subfield code="9">0-8194-3892-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)45851160</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014093870</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC367</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TS510</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681/.25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5725</subfield><subfield code="0">(DE-625)145699:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optical measurement and nondestructive testing</subfield><subfield code="b">techniques and applications ; 8 - 10 November 2000, Beijing, China</subfield><subfield code="c">FeiJun Song ... chairs/ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIX, 468 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="v">4221</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nondestructive testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical measurements</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optoelectronic devices</subfield><subfield code="x">Industrial applications</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2000</subfield><subfield code="z">Peking</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Song, FeiJun</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="t">Proceedings of SPIE</subfield><subfield code="v">4221</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">4221</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009655322</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 2000 Peking gnd-content |
genre_facet | Konferenzschrift 2000 Peking |
id | DE-604.BV014093870 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:57:32Z |
institution | BVB |
isbn | 0819438928 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009655322 |
oclc_num | 45851160 |
open_access_boolean | |
owner | DE-703 |
owner_facet | DE-703 |
physical | XIX, 468 S. Ill., graph. Darst. |
publishDate | 2000 |
publishDateSearch | 2000 |
publishDateSort | 2000 |
publisher | SPIE |
record_format | marc |
series2 | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |
spelling | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China FeiJun Song ... chairs/ed. Bellingham, Wash. SPIE 2000 XIX, 468 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 4221 Nondestructive testing Congresses Optical measurements Congresses Optoelectronic devices Industrial applications Congresses Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Peking gnd-content Optische Messtechnik (DE-588)4172667-4 s Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s DE-604 Song, FeiJun Sonstige oth Society of Photo-Optical Instrumentation Engineers Proceedings of SPIE 4221 (DE-604)BV000010887 4221 |
spellingShingle | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China Nondestructive testing Congresses Optical measurements Congresses Optoelectronic devices Industrial applications Congresses Optische Messtechnik (DE-588)4172667-4 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd |
subject_GND | (DE-588)4172667-4 (DE-588)4067689-4 (DE-588)1071861417 |
title | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China |
title_auth | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China |
title_exact_search | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China |
title_full | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China FeiJun Song ... chairs/ed. |
title_fullStr | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China FeiJun Song ... chairs/ed. |
title_full_unstemmed | Optical measurement and nondestructive testing techniques and applications ; 8 - 10 November 2000, Beijing, China FeiJun Song ... chairs/ed. |
title_short | Optical measurement and nondestructive testing |
title_sort | optical measurement and nondestructive testing techniques and applications 8 10 november 2000 beijing china |
title_sub | techniques and applications ; 8 - 10 November 2000, Beijing, China |
topic | Nondestructive testing Congresses Optical measurements Congresses Optoelectronic devices Industrial applications Congresses Optische Messtechnik (DE-588)4172667-4 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd |
topic_facet | Nondestructive testing Congresses Optical measurements Congresses Optoelectronic devices Industrial applications Congresses Optische Messtechnik Zerstörungsfreie Werkstoffprüfung Konferenzschrift 2000 Peking |
volume_link | (DE-604)BV000010887 |
work_keys_str_mv | AT songfeijun opticalmeasurementandnondestructivetestingtechniquesandapplications810november2000beijingchina |