IEEE transactions on device and materials reliability:
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic Journal |
| Language: | English |
| Published: |
New York, NY
IEEE
2001-
|
| Subjects: | |
| Online Access: | Volltext Volltext |
| Published: | 1.2001 - |
| Item Description: | Gesehen am 05.12.06 |
| Physical Description: | Online-Ressource |
| ISSN: | 1558-2574 1530-4388 |
Staff View
MARC
| LEADER | 00000nas a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV013998248 | ||
| 003 | DE-604 | ||
| 005 | 20241112202749 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 011108c20019999xxu|| p|o|||| 0 ||eng d | ||
| 016 | 7 | |a 022778055 |2 DE-101 | |
| 016 | 7 | |a 2061445-7 |2 DE-600 | |
| 022 | |a 1558-2574 |2 6 | ||
| 030 | |a ITDMA2 | ||
| 035 | |a (OCoLC)1368094667 | ||
| 035 | |a (DE-599)ZDB2061445-7 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c XD-US | ||
| 049 | |a DE-384 |a DE-29 |a DE-91 |a DE-739 |a DE-M347 |a DE-706 |a DE-92 |a DE-898 |a DE-Aug4 |a DE-83 |a DE-1043 |a DE-863 |a DE-573 |a DE-M382 |a DE-703 |a DE-522 |a DE-859 |a DE-862 |a DE-861 |a DE-634 |a DE-1050 |a DE-526 |a DE-523 |a DE-20 |a DE-Y2 |a DE-Y3 |a DE-858 |a DE-B768 |a DE-1049 |a DE-860 |a DE-355 |a DE-1046 |a DE-473 | ||
| 084 | |a 620 |2 22sdnb | ||
| 084 | |a ELT 240z |2 stub | ||
| 110 | 2 | |a Institute of Electrical and Electronics Engineers |e Verfasser |0 (DE-588)1692-5 |4 aut | |
| 210 | 1 | 0 | |a IEEE T-DMR |2 din1502 |
| 210 | 1 | 0 | |a IEEE Trans. Device and Materials Reliability |2 din1502 |
| 245 | 1 | 0 | |a IEEE transactions on device and materials reliability |
| 246 | 1 | 3 | |a Transactions on device and materials reliability |
| 264 | 3 | 1 | |a New York, NY |b IEEE |c 2001- |
| 300 | |a Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 362 | 0 | |a 1.2001 - | |
| 363 | 0 | 1 | |a 1 |i 2001 |
| 500 | |a Gesehen am 05.12.06 | ||
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zeitschrift |0 (DE-588)4067488-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Online-Ressource |0 (DE-588)4511937-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4067488-5 |a Zeitschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | 2 | |a Zeitschrift |0 (DE-588)4067488-5 |D s |
| 689 | 0 | 3 | |a Online-Ressource |0 (DE-588)4511937-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Institute of Electrical and Electronics Engineers |t IEEE transactions on device and materials reliability |d New York, NY : IEEE, 2001- |x 1530-4388 |w (DE-604)BV014002405 |
| 856 | 4 | 0 | |u https://ezb.ur.de/?2061445-7 |x EZB |3 Volltext |
| 856 | 4 | 0 | |u https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298 |x Verlag |3 Volltext |
| 912 | |a ZDB-37-IEA | ||
| 912 | |a ZDB-37-IEL | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-009582286 | |
Record in the Search Index
| DE-BY-FWS_katkey | 361480 |
|---|---|
| _version_ | 1824555449067765760 |
| adam_text | |
| any_adam_object | |
| author_corporate | Institute of Electrical and Electronics Engineers |
| author_corporate_role | aut |
| author_facet | Institute of Electrical and Electronics Engineers |
| author_sort | Institute of Electrical and Electronics Engineers |
| building | Verbundindex |
| bvnumber | BV013998248 |
| classification_tum | ELT 240z |
| collection | ZDB-37-IEA ZDB-37-IEL |
| ctrlnum | 2061445-7 (OCoLC)1368094667 (DE-599)ZDB2061445-7 |
| dateSpan | 1.2001 - |
| discipline | Elektrotechnik |
| format | Electronic Journal |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nas a2200000 c 4500</leader><controlfield tag="001">BV013998248</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20241112202749</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">011108c20019999xxu|| p|o|||| 0 ||eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">022778055</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">2061445-7</subfield><subfield code="2">DE-600</subfield></datafield><datafield tag="022" ind1=" " ind2=" "><subfield code="a">1558-2574</subfield><subfield code="2">6</subfield></datafield><datafield tag="030" ind1=" " ind2=" "><subfield code="a">ITDMA2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1368094667</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)ZDB2061445-7</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M382</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-526</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-Y2</subfield><subfield code="a">DE-Y3</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-B768</subfield><subfield code="a">DE-1049</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-473</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">620</subfield><subfield code="2">22sdnb</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240z</subfield><subfield code="2">stub</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="210" ind1="1" ind2="0"><subfield code="a">IEEE T-DMR</subfield><subfield code="2">din1502</subfield></datafield><datafield tag="210" ind1="1" ind2="0"><subfield code="a">IEEE Trans. Device and Materials Reliability</subfield><subfield code="2">din1502</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">IEEE transactions on device and materials reliability</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Transactions on device and materials reliability</subfield></datafield><datafield tag="264" ind1="3" ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">IEEE</subfield><subfield code="c">2001-</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="362" ind1="0" ind2=" "><subfield code="a">1.2001 -</subfield></datafield><datafield tag="363" ind1="0" ind2="1"><subfield code="a">1</subfield><subfield code="i">2001</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Gesehen am 05.12.06</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zeitschrift</subfield><subfield code="0">(DE-588)4067488-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Online-Ressource</subfield><subfield code="0">(DE-588)4511937-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4067488-5</subfield><subfield code="a">Zeitschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Zeitschrift</subfield><subfield code="0">(DE-588)4067488-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Online-Ressource</subfield><subfield code="0">(DE-588)4511937-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="t">IEEE transactions on device and materials reliability</subfield><subfield code="d">New York, NY : IEEE, 2001-</subfield><subfield code="x">1530-4388</subfield><subfield code="w">(DE-604)BV014002405</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ezb.ur.de/?2061445-7</subfield><subfield code="x">EZB</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-37-IEA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-37-IEL</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009582286</subfield></datafield></record></collection> |
| genre | (DE-588)4067488-5 Zeitschrift gnd-content |
| genre_facet | Zeitschrift |
| id | DE-604.BV013998248 |
| illustrated | Illustrated |
| indexdate | 2025-02-20T07:07:50Z |
| institution | BVB |
| institution_GND | (DE-588)1692-5 |
| issn | 1558-2574 1530-4388 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009582286 |
| oclc_num | 1368094667 |
| open_access_boolean | |
| owner | DE-384 DE-29 DE-91 DE-BY-TUM DE-739 DE-M347 DE-706 DE-92 DE-898 DE-BY-UBR DE-Aug4 DE-83 DE-1043 DE-863 DE-BY-FWS DE-573 DE-M382 DE-703 DE-522 DE-859 DE-862 DE-BY-FWS DE-861 DE-634 DE-1050 DE-526 DE-523 DE-20 DE-Y2 DE-Y3 DE-858 DE-B768 DE-1049 DE-860 DE-355 DE-BY-UBR DE-1046 DE-473 DE-BY-UBG |
| owner_facet | DE-384 DE-29 DE-91 DE-BY-TUM DE-739 DE-M347 DE-706 DE-92 DE-898 DE-BY-UBR DE-Aug4 DE-83 DE-1043 DE-863 DE-BY-FWS DE-573 DE-M382 DE-703 DE-522 DE-859 DE-862 DE-BY-FWS DE-861 DE-634 DE-1050 DE-526 DE-523 DE-20 DE-Y2 DE-Y3 DE-858 DE-B768 DE-1049 DE-860 DE-355 DE-BY-UBR DE-1046 DE-473 DE-BY-UBG |
| physical | Online-Ressource |
| psigel | ZDB-37-IEA ZDB-37-IEL |
| publishDate | 2001 |
| publishDateSearch | 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 2025 8888 |
| publishDateSort | 2025 |
| publisher | IEEE |
| record_format | marc |
| spellingShingle | IEEE transactions on device and materials reliability Zuverlässigkeit (DE-588)4059245-5 gnd Elektronik (DE-588)4014346-6 gnd Zeitschrift (DE-588)4067488-5 gnd Online-Ressource (DE-588)4511937-5 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4014346-6 (DE-588)4067488-5 (DE-588)4511937-5 |
| title | IEEE transactions on device and materials reliability |
| title_alt | Transactions on device and materials reliability |
| title_auth | IEEE transactions on device and materials reliability |
| title_exact_search | IEEE transactions on device and materials reliability |
| title_full | IEEE transactions on device and materials reliability |
| title_fullStr | IEEE transactions on device and materials reliability |
| title_full_unstemmed | IEEE transactions on device and materials reliability |
| title_short | IEEE transactions on device and materials reliability |
| title_sort | ieee transactions on device and materials reliability |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Elektronik (DE-588)4014346-6 gnd Zeitschrift (DE-588)4067488-5 gnd Online-Ressource (DE-588)4511937-5 gnd |
| topic_facet | Zuverlässigkeit Elektronik Zeitschrift Online-Ressource |
| url | https://ezb.ur.de/?2061445-7 https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298 |
| work_keys_str_mv | AT instituteofelectricalandelectronicsengineers ieeetransactionsondeviceandmaterialsreliability AT instituteofelectricalandelectronicsengineers transactionsondeviceandmaterialsreliability |
| zdb_num | 2061445-7 (DE-599)ZDB2061445-7 |