ISSM 2000: proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000
Gespeichert in:
1. Verfasser: | |
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Körperschaft: | |
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam u..a
Elsevier
2001
|
Schriftenreihe: | Ultramicroscopy
86,3/4 |
Schlagworte: | |
Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
Beschreibung: | S. 256 - 390 Ill., graph. Darst. |
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Datensatz im Suchindex
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author | Sigle, Wilfried |
author_corporate | International Symposium on Spectroscopy of Materials |
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indexdate | 2024-07-09T18:55:28Z |
institution | BVB |
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language | English |
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physical | S. 256 - 390 Ill., graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
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publisher | Elsevier |
record_format | marc |
series2 | Ultramicroscopy |
spelling | Sigle, Wilfried Verfasser aut ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 guest ed.: W. Sigle ... Amsterdam u..a Elsevier 2001 S. 256 - 390 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 86,3/4 Einzelaufnahme eines Zeitschr.-H. Materials science Congresses Spectrum analysis Congresses X-ray spectroscopy Congresses Festkörperspektroskopie (DE-588)4226322-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Rottach-Egern gnd-content Festkörperspektroskopie (DE-588)4226322-0 s DE-604 International Symposium on Spectroscopy of Materials 2000 Rottach-Egern Verfasser (DE-588)5525492-5 aut |
spellingShingle | Sigle, Wilfried ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 Materials science Congresses Spectrum analysis Congresses X-ray spectroscopy Congresses Festkörperspektroskopie (DE-588)4226322-0 gnd |
subject_GND | (DE-588)4226322-0 (DE-588)1071861417 |
title | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 |
title_auth | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 |
title_exact_search | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 |
title_full | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 guest ed.: W. Sigle ... |
title_fullStr | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 guest ed.: W. Sigle ... |
title_full_unstemmed | ISSM 2000 proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 guest ed.: W. Sigle ... |
title_short | ISSM 2000 |
title_sort | issm 2000 proceedings of the international symposium on spectroscopy of materials rottach egern germany march 6 10 2000 |
title_sub | proceedings of the international Symposium on Spectroscopy of Materials, Rottach-Egern, Germany, March 6 - 10, 2000 |
topic | Materials science Congresses Spectrum analysis Congresses X-ray spectroscopy Congresses Festkörperspektroskopie (DE-588)4226322-0 gnd |
topic_facet | Materials science Congresses Spectrum analysis Congresses X-ray spectroscopy Congresses Festkörperspektroskopie Konferenzschrift 2000 Rottach-Egern |
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