Machine vision applications in industrial inspection VII: 25 - 26 January 1999, San Jose, California
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
SPIE
1999
|
Schriftenreihe: | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers
3652 |
Schlagworte: | |
Beschreibung: | IX, 262 S. Ill., graph. Darst. |
ISBN: | 0819431230 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV013966676 | ||
003 | DE-604 | ||
005 | 20020516 | ||
007 | t | ||
008 | 011019s1999 ad|| |||| 10||| eng d | ||
020 | |a 0819431230 |9 0-8194-3123-0 | ||
035 | |a (OCoLC)41180986 | ||
035 | |a (DE-599)BVBBV013966676 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-703 | ||
050 | 0 | |a TA1505 | |
050 | 0 | |a TS156.2 | |
082 | 0 | |a 670.42/5 |2 21 | |
084 | |a ZQ 3150 |0 (DE-625)158046: |2 rvk | ||
245 | 1 | 0 | |a Machine vision applications in industrial inspection VII |b 25 - 26 January 1999, San Jose, California |c Kenneth W. Tobin ... chair/ed. |
264 | 1 | |a Bellingham, Wash. |b SPIE |c 1999 | |
300 | |a IX, 262 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |v 3652 | |
650 | 4 | |a Computer vision |x Industrial applications |v Congresses | |
650 | 4 | |a Engineering inspection |x Automation |v Congresses | |
650 | 4 | |a Quality control |x Optical methods |x Automation |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Tobin, Kenneth W. |e Sonstige |4 oth | |
810 | 2 | |a Society of Photo-Optical Instrumentation Engineers |t Proceedings of SPIE |v 3652 |w (DE-604)BV000010887 |9 3652 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009559514 |
Datensatz im Suchindex
_version_ | 1804128817528176640 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV013966676 |
callnumber-first | T - Technology |
callnumber-label | TA1505 |
callnumber-raw | TA1505 TS156.2 |
callnumber-search | TA1505 TS156.2 |
callnumber-sort | TA 41505 |
callnumber-subject | TA - General and Civil Engineering |
classification_rvk | ZQ 3150 |
ctrlnum | (OCoLC)41180986 (DE-599)BVBBV013966676 |
dewey-full | 670.42/5 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 670 - Manufacturing |
dewey-raw | 670.42/5 |
dewey-search | 670.42/5 |
dewey-sort | 3670.42 15 |
dewey-tens | 670 - Manufacturing |
discipline | Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01401nam a2200373 cb4500</leader><controlfield tag="001">BV013966676</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020516 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">011019s1999 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819431230</subfield><subfield code="9">0-8194-3123-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)41180986</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013966676</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA1505</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TS156.2</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">670.42/5</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3150</subfield><subfield code="0">(DE-625)158046:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Machine vision applications in industrial inspection VII</subfield><subfield code="b">25 - 26 January 1999, San Jose, California</subfield><subfield code="c">Kenneth W. Tobin ... chair/ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 262 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="v">3652</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer vision</subfield><subfield code="x">Industrial applications</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering inspection</subfield><subfield code="x">Automation</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield><subfield code="x">Optical methods</subfield><subfield code="x">Automation</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tobin, Kenneth W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="t">Proceedings of SPIE</subfield><subfield code="v">3652</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">3652</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009559514</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV013966676 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:55:16Z |
institution | BVB |
isbn | 0819431230 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009559514 |
oclc_num | 41180986 |
open_access_boolean | |
owner | DE-703 |
owner_facet | DE-703 |
physical | IX, 262 S. Ill., graph. Darst. |
publishDate | 1999 |
publishDateSearch | 1999 |
publishDateSort | 1999 |
publisher | SPIE |
record_format | marc |
series2 | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |
spelling | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California Kenneth W. Tobin ... chair/ed. Bellingham, Wash. SPIE 1999 IX, 262 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 3652 Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Quality control Optical methods Automation Congresses (DE-588)1071861417 Konferenzschrift gnd-content Tobin, Kenneth W. Sonstige oth Society of Photo-Optical Instrumentation Engineers Proceedings of SPIE 3652 (DE-604)BV000010887 3652 |
spellingShingle | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Quality control Optical methods Automation Congresses |
subject_GND | (DE-588)1071861417 |
title | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California |
title_auth | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California |
title_exact_search | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California |
title_full | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California Kenneth W. Tobin ... chair/ed. |
title_fullStr | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California Kenneth W. Tobin ... chair/ed. |
title_full_unstemmed | Machine vision applications in industrial inspection VII 25 - 26 January 1999, San Jose, California Kenneth W. Tobin ... chair/ed. |
title_short | Machine vision applications in industrial inspection VII |
title_sort | machine vision applications in industrial inspection vii 25 26 january 1999 san jose california |
title_sub | 25 - 26 January 1999, San Jose, California |
topic | Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Quality control Optical methods Automation Congresses |
topic_facet | Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Quality control Optical methods Automation Congresses Konferenzschrift |
volume_link | (DE-604)BV000010887 |
work_keys_str_mv | AT tobinkennethw machinevisionapplicationsinindustrialinspectionvii2526january1999sanjosecalifornia |