Nondestructive characterization of materials X: proceedings of the 10th International Symposium on Nondestructive Characterization of Materials, 26 - 30 June 2000, Karuizawa, Japan
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] Elsevier 2001
Edition:1. ed.
Subjects:
Physical Description:XII, 421 S. Ill., graph. Darst.
ISBN:0080437990

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