Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | German |
Veröffentlicht: |
Regensburg
2001
|
Schlagworte: | |
Beschreibung: | Regensburg, Univ., Diplomarbeit, 2001 |
Beschreibung: | VI, 138 S. graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
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any_adam_object | |
author | Rehrl, Tobias |
author_facet | Rehrl, Tobias |
author_role | aut |
author_sort | Rehrl, Tobias |
author_variant | t r tr |
building | Verbundindex |
bvnumber | BV013890949 |
classification_rvk | UD 6100 |
ctrlnum | (OCoLC)634265585 (DE-599)BVBBV013890949 |
discipline | Physik |
format | Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV013890949 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:53:54Z |
institution | BVB |
language | German |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009504224 |
oclc_num | 634265585 |
open_access_boolean | |
owner | DE-355 DE-BY-UBR |
owner_facet | DE-355 DE-BY-UBR |
physical | VI, 138 S. graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
record_format | marc |
spelling | Rehrl, Tobias Verfasser aut Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl Regensburg 2001 VI, 138 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Regensburg, Univ., Diplomarbeit, 2001 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Lebensdauerspektroskopie (DE-588)4332426-5 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Gitterbaufehler (DE-588)4125030-8 s Lebensdauerspektroskopie (DE-588)4332426-5 s DE-604 |
spellingShingle | Rehrl, Tobias Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium Gitterbaufehler (DE-588)4125030-8 gnd Lebensdauerspektroskopie (DE-588)4332426-5 gnd Silicium (DE-588)4077445-4 gnd |
subject_GND | (DE-588)4125030-8 (DE-588)4332426-5 (DE-588)4077445-4 (DE-588)4113937-9 |
title | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
title_auth | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
title_exact_search | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
title_full | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
title_fullStr | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
title_full_unstemmed | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
title_short | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
title_sort | temperaturabhangige lebensdauerspektroskopie tdls zur defektanalyse in silizium |
topic | Gitterbaufehler (DE-588)4125030-8 gnd Lebensdauerspektroskopie (DE-588)4332426-5 gnd Silicium (DE-588)4077445-4 gnd |
topic_facet | Gitterbaufehler Lebensdauerspektroskopie Silicium Hochschulschrift |
work_keys_str_mv | AT rehrltobias temperaturabhangigelebensdauerspektroskopietdlszurdefektanalyseinsilizium |