Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Regensburg
2001
|
| Schlagworte: | |
| Beschreibung: | Regensburg, Univ., Diplomarbeit, 2001 |
| Beschreibung: | VI, 138 S. graph. Darst. |
Internformat
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Rehrl, Tobias |
| author_facet | Rehrl, Tobias |
| author_role | aut |
| author_sort | Rehrl, Tobias |
| author_variant | t r tr |
| building | Verbundindex |
| bvnumber | BV013890949 |
| classification_rvk | UD 6100 |
| ctrlnum | (OCoLC)634265585 (DE-599)BVBBV013890949 |
| discipline | Physik |
| format | Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV013890949 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:53:54Z |
| institution | BVB |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009504224 |
| oclc_num | 634265585 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | VI, 138 S. graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| record_format | marc |
| spelling | Rehrl, Tobias Verfasser aut Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl Regensburg 2001 VI, 138 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Regensburg, Univ., Diplomarbeit, 2001 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Lebensdauerspektroskopie (DE-588)4332426-5 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Gitterbaufehler (DE-588)4125030-8 s Lebensdauerspektroskopie (DE-588)4332426-5 s DE-604 |
| spellingShingle | Rehrl, Tobias Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium Gitterbaufehler (DE-588)4125030-8 gnd Lebensdauerspektroskopie (DE-588)4332426-5 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4332426-5 (DE-588)4077445-4 (DE-588)4113937-9 |
| title | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
| title_auth | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
| title_exact_search | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
| title_full | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
| title_fullStr | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
| title_full_unstemmed | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium von Tobias Rehrl |
| title_short | Temperaturabhängige Lebensdauerspektroskopie (TDLS) zur Defektanalyse in Silizium |
| title_sort | temperaturabhangige lebensdauerspektroskopie tdls zur defektanalyse in silizium |
| topic | Gitterbaufehler (DE-588)4125030-8 gnd Lebensdauerspektroskopie (DE-588)4332426-5 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Gitterbaufehler Lebensdauerspektroskopie Silicium Hochschulschrift |
| work_keys_str_mv | AT rehrltobias temperaturabhangigelebensdauerspektroskopietdlszurdefektanalyseinsilizium |