In situ real time characterization of thin films:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York [u.a.]
Wiley
2001
|
| Series: | A Wiley interscience publication
|
| Subjects: | |
| Physical Description: | XI, 263 S. Ill., graph. Darst. |
| ISBN: | 0471241415 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV013886492 | ||
| 003 | DE-604 | ||
| 005 | 20020107 | ||
| 007 | t | ||
| 008 | 010829s2001 ad|| |||| 00||| eng d | ||
| 020 | |a 0471241415 |9 0-471-24141-5 | ||
| 035 | |a (OCoLC)247425812 | ||
| 035 | |a (DE-599)BVBBV013886492 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 050 | 0 | |a QC176.83 | |
| 082 | 0 | |a 530.4275 | |
| 084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
| 245 | 1 | 0 | |a In situ real time characterization of thin films |c ed. by Orlando Auciello ... |
| 264 | 1 | |a New York [u.a.] |b Wiley |c 2001 | |
| 300 | |a XI, 263 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a A Wiley interscience publication | |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Auciello, Orlando |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009500185 | ||
Record in the Search Index
| _version_ | 1804128725446426624 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013886492 |
| callnumber-first | Q - Science |
| callnumber-label | QC176 |
| callnumber-raw | QC176.83 |
| callnumber-search | QC176.83 |
| callnumber-sort | QC 3176.83 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 7500 |
| ctrlnum | (OCoLC)247425812 (DE-599)BVBBV013886492 |
| dewey-full | 530.4275 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.4275 |
| dewey-search | 530.4275 |
| dewey-sort | 3530.4275 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01027nam a2200337 c 4500</leader><controlfield tag="001">BV013886492</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020107 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010829s2001 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471241415</subfield><subfield code="9">0-471-24141-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)247425812</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013886492</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC176.83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.4275</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">In situ real time characterization of thin films</subfield><subfield code="c">ed. by Orlando Auciello ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Wiley</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 263 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">A Wiley interscience publication</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Auciello, Orlando</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009500185</subfield></datafield></record></collection> |
| id | DE-604.BV013886492 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:53:48Z |
| institution | BVB |
| isbn | 0471241415 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009500185 |
| oclc_num | 247425812 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | XI, 263 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley interscience publication |
| spelling | In situ real time characterization of thin films ed. by Orlando Auciello ... New York [u.a.] Wiley 2001 XI, 263 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley interscience publication Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s DE-604 Auciello, Orlando Sonstige oth |
| spellingShingle | In situ real time characterization of thin films Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4136925-7 |
| title | In situ real time characterization of thin films |
| title_auth | In situ real time characterization of thin films |
| title_exact_search | In situ real time characterization of thin films |
| title_full | In situ real time characterization of thin films ed. by Orlando Auciello ... |
| title_fullStr | In situ real time characterization of thin films ed. by Orlando Auciello ... |
| title_full_unstemmed | In situ real time characterization of thin films ed. by Orlando Auciello ... |
| title_short | In situ real time characterization of thin films |
| title_sort | in situ real time characterization of thin films |
| topic | Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | Dünne Schicht |
| work_keys_str_mv | AT aucielloorlando insiturealtimecharacterizationofthinfilms |