APA (7th ed.) Citation

(2001). In situ real time characterization of thin films. Wiley.

Chicago Style (17th ed.) Citation

In Situ Real Time Characterization of Thin Films. New York [u.a.]: Wiley, 2001.

MLA (9th ed.) Citation

In Situ Real Time Characterization of Thin Films. Wiley, 2001.

Warning: These citations may not always be 100% accurate.