Rough surface scattering and contamination: 21 - 23 July 1999, Denver, Colorado
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Bellingham, Wash.
SPIE
1999
|
| Series: | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers
3784 |
| Subjects: | |
| Physical Description: | VII, 404 S. Ill., graph. Darst. |
| ISBN: | 0819432709 |
Staff View
MARC
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Record in the Search Index
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| genre | (DE-588)1071861417 Konferenzschrift 1999 Denver Colo. gnd-content |
| genre_facet | Konferenzschrift 1999 Denver Colo. |
| id | DE-604.BV013881909 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:53:43Z |
| institution | BVB |
| isbn | 0819432709 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009496973 |
| oclc_num | 42803631 |
| open_access_boolean | |
| owner | DE-703 DE-83 |
| owner_facet | DE-703 DE-83 |
| physical | VII, 404 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |
| spelling | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. Bellingham, Wash. SPIE 1999 VII, 404 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 3784 Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd rswk-swf Streuung (DE-588)4058056-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Denver Colo. gnd-content Rauigkeit (DE-588)4128988-2 s Streuung (DE-588)4058056-8 s DE-604 Chen, Philip T. C. Sonstige oth Society of Photo-Optical Instrumentation Engineers Proceedings of SPIE 3784 (DE-604)BV000010887 3784 |
| spellingShingle | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd Streuung (DE-588)4058056-8 gnd |
| subject_GND | (DE-588)4128988-2 (DE-588)4058056-8 (DE-588)1071861417 |
| title | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_auth | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_exact_search | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_full | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_fullStr | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_full_unstemmed | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_short | Rough surface scattering and contamination |
| title_sort | rough surface scattering and contamination 21 23 july 1999 denver colorado |
| title_sub | 21 - 23 July 1999, Denver, Colorado |
| topic | Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd Streuung (DE-588)4058056-8 gnd |
| topic_facet | Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit Streuung Konferenzschrift 1999 Denver Colo. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT chenphiliptc roughsurfacescatteringandcontamination2123july1999denvercolorado |