Rough surface scattering and contamination: 21 - 23 July 1999, Denver, Colorado
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1999
|
| Schriftenreihe: | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers
3784 |
| Schlagworte: | |
| Beschreibung: | VII, 404 S. Ill., graph. Darst. |
| ISBN: | 0819432709 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013881909 | ||
| 003 | DE-604 | ||
| 005 | 20020809 | ||
| 007 | t | ||
| 008 | 010828s1999 ad|| |||| 10||| eng d | ||
| 020 | |a 0819432709 |9 0-8194-3270-9 | ||
| 035 | |a (OCoLC)42803631 | ||
| 035 | |a (DE-599)BVBBV013881909 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-83 | ||
| 050 | 0 | |a TA418.7 | |
| 050 | 0 | |a TS510 | |
| 082 | 0 | |a 620/.44 |2 21 | |
| 084 | |a UP 9000 |0 (DE-625)146451: |2 rvk | ||
| 245 | 1 | 0 | |a Rough surface scattering and contamination |b 21 - 23 July 1999, Denver, Colorado |c Philip T. C. Chen ... chairs/ed. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1999 | |
| 300 | |a VII, 404 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |v 3784 | |
| 650 | 4 | |a Scattering (Physics) |v Congresses | |
| 650 | 4 | |a Surface contamination |v Congresses | |
| 650 | 4 | |a Surface roughness |x Measurement |v Congresses | |
| 650 | 0 | 7 | |a Rauigkeit |0 (DE-588)4128988-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Streuung |0 (DE-588)4058056-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Denver Colo. |2 gnd-content | |
| 689 | 0 | 0 | |a Rauigkeit |0 (DE-588)4128988-2 |D s |
| 689 | 0 | 1 | |a Streuung |0 (DE-588)4058056-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Chen, Philip T. C. |e Sonstige |4 oth | |
| 810 | 2 | |a Society of Photo-Optical Instrumentation Engineers |t Proceedings of SPIE |v 3784 |w (DE-604)BV000010887 |9 3784 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009496973 | ||
Datensatz im Suchindex
| _version_ | 1804128720038920192 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013881909 |
| callnumber-first | T - Technology |
| callnumber-label | TA418 |
| callnumber-raw | TA418.7 TS510 |
| callnumber-search | TA418.7 TS510 |
| callnumber-sort | TA 3418.7 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UP 9000 |
| ctrlnum | (OCoLC)42803631 (DE-599)BVBBV013881909 |
| dewey-full | 620/.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620/.44 |
| dewey-search | 620/.44 |
| dewey-sort | 3620 244 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01599nam a2200433 cb4500</leader><controlfield tag="001">BV013881909</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020809 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010828s1999 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819432709</subfield><subfield code="9">0-8194-3270-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)42803631</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013881909</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA418.7</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TS510</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.44</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9000</subfield><subfield code="0">(DE-625)146451:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Rough surface scattering and contamination</subfield><subfield code="b">21 - 23 July 1999, Denver, Colorado</subfield><subfield code="c">Philip T. C. Chen ... chairs/ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII, 404 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="v">3784</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scattering (Physics)</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface contamination</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface roughness</subfield><subfield code="x">Measurement</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rauigkeit</subfield><subfield code="0">(DE-588)4128988-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Streuung</subfield><subfield code="0">(DE-588)4058056-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Denver Colo.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rauigkeit</subfield><subfield code="0">(DE-588)4128988-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Streuung</subfield><subfield code="0">(DE-588)4058056-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Philip T. C.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers</subfield><subfield code="t">Proceedings of SPIE</subfield><subfield code="v">3784</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">3784</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009496973</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1999 Denver Colo. gnd-content |
| genre_facet | Konferenzschrift 1999 Denver Colo. |
| id | DE-604.BV013881909 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:53:43Z |
| institution | BVB |
| isbn | 0819432709 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009496973 |
| oclc_num | 42803631 |
| open_access_boolean | |
| owner | DE-703 DE-83 |
| owner_facet | DE-703 DE-83 |
| physical | VII, 404 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers |
| spelling | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. Bellingham, Wash. SPIE 1999 VII, 404 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 3784 Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd rswk-swf Streuung (DE-588)4058056-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Denver Colo. gnd-content Rauigkeit (DE-588)4128988-2 s Streuung (DE-588)4058056-8 s DE-604 Chen, Philip T. C. Sonstige oth Society of Photo-Optical Instrumentation Engineers Proceedings of SPIE 3784 (DE-604)BV000010887 3784 |
| spellingShingle | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd Streuung (DE-588)4058056-8 gnd |
| subject_GND | (DE-588)4128988-2 (DE-588)4058056-8 (DE-588)1071861417 |
| title | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_auth | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_exact_search | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado |
| title_full | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_fullStr | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_full_unstemmed | Rough surface scattering and contamination 21 - 23 July 1999, Denver, Colorado Philip T. C. Chen ... chairs/ed. |
| title_short | Rough surface scattering and contamination |
| title_sort | rough surface scattering and contamination 21 23 july 1999 denver colorado |
| title_sub | 21 - 23 July 1999, Denver, Colorado |
| topic | Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit (DE-588)4128988-2 gnd Streuung (DE-588)4058056-8 gnd |
| topic_facet | Scattering (Physics) Congresses Surface contamination Congresses Surface roughness Measurement Congresses Rauigkeit Streuung Konferenzschrift 1999 Denver Colo. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT chenphiliptc roughsurfacescatteringandcontamination2123july1999denvercolorado |