Proceedings: August 6 - 7, 2001, San Jose, California, USA
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
2001
|
Schlagworte: | |
Beschreibung: | VIII, 105 S. Ill., graph. Darst. |
ISBN: | 0769512429 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV013868818 | ||
003 | DE-604 | ||
005 | 20150520 | ||
007 | t | ||
008 | 010814s2001 ad|| |||| 10||| eng d | ||
020 | |a 0769512429 |9 0-7695-1242-9 | ||
035 | |a (OCoLC)59473306 | ||
035 | |a (DE-599)BVBBV013868818 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-739 |a DE-83 | ||
084 | |a SS 2001 |0 (DE-625)143438: |2 rvk | ||
084 | |a ST 175 |0 (DE-625)143603: |2 rvk | ||
111 | 2 | |a International Workshop on Memory Technology, Design and Testing |n 9 |d 2001 |c San José, Calif. |j Verfasser |0 (DE-588)10032340-6 |4 aut | |
245 | 1 | 0 | |a Proceedings |b August 6 - 7, 2001, San Jose, California, USA |c 2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ... |
246 | 1 | 3 | |a MTDT 2001 |
246 | 1 | 3 | |a Memory technology, design and testing |
246 | 1 | 3 | |a Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing |
264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. |c 2001 | |
300 | |a VIII, 105 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Zorian, Yervant |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009486223 |
Datensatz im Suchindex
_version_ | 1804128703686377472 |
---|---|
any_adam_object | |
author_corporate | International Workshop on Memory Technology, Design and Testing San José, Calif |
author_corporate_role | aut |
author_facet | International Workshop on Memory Technology, Design and Testing San José, Calif |
author_sort | International Workshop on Memory Technology, Design and Testing San José, Calif |
building | Verbundindex |
bvnumber | BV013868818 |
classification_rvk | SS 2001 ST 175 |
ctrlnum | (OCoLC)59473306 (DE-599)BVBBV013868818 |
discipline | Informatik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01336nam a2200337 c 4500</leader><controlfield tag="001">BV013868818</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20150520 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010814s2001 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0769512429</subfield><subfield code="9">0-7695-1242-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)59473306</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013868818</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SS 2001</subfield><subfield code="0">(DE-625)143438:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 175</subfield><subfield code="0">(DE-625)143603:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Workshop on Memory Technology, Design and Testing</subfield><subfield code="n">9</subfield><subfield code="d">2001</subfield><subfield code="c">San José, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)10032340-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">August 6 - 7, 2001, San Jose, California, USA</subfield><subfield code="c">2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">MTDT 2001</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Memory technology, design and testing</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc.</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 105 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zorian, Yervant</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009486223</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV013868818 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:53:28Z |
institution | BVB |
institution_GND | (DE-588)10032340-6 |
isbn | 0769512429 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009486223 |
oclc_num | 59473306 |
open_access_boolean | |
owner | DE-739 DE-83 |
owner_facet | DE-739 DE-83 |
physical | VIII, 105 S. Ill., graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | IEEE Computer Soc. |
record_format | marc |
spelling | International Workshop on Memory Technology, Design and Testing 9 2001 San José, Calif. Verfasser (DE-588)10032340-6 aut Proceedings August 6 - 7, 2001, San Jose, California, USA 2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ... MTDT 2001 Memory technology, design and testing Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 2001 VIII, 105 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content Zorian, Yervant Sonstige oth |
spellingShingle | Proceedings August 6 - 7, 2001, San Jose, California, USA |
subject_GND | (DE-588)1071861417 |
title | Proceedings August 6 - 7, 2001, San Jose, California, USA |
title_alt | MTDT 2001 Memory technology, design and testing Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing |
title_auth | Proceedings August 6 - 7, 2001, San Jose, California, USA |
title_exact_search | Proceedings August 6 - 7, 2001, San Jose, California, USA |
title_full | Proceedings August 6 - 7, 2001, San Jose, California, USA 2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ... |
title_fullStr | Proceedings August 6 - 7, 2001, San Jose, California, USA 2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ... |
title_full_unstemmed | Proceedings August 6 - 7, 2001, San Jose, California, USA 2001 IEEE International Workshop on Memory Technology, Design and Testing ; eds. Yervant Zorian ... |
title_short | Proceedings |
title_sort | proceedings august 6 7 2001 san jose california usa |
title_sub | August 6 - 7, 2001, San Jose, California, USA |
topic_facet | Konferenzschrift |
work_keys_str_mv | AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif proceedingsaugust672001sanjosecaliforniausa AT zorianyervant proceedingsaugust672001sanjosecaliforniausa AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif mtdt2001 AT zorianyervant mtdt2001 AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif memorytechnologydesignandtesting AT zorianyervant memorytechnologydesignandtesting AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif recordsofthe2001ieeeinternationalworkshoponmemorytechnologydesignandtesting AT zorianyervant recordsofthe2001ieeeinternationalworkshoponmemorytechnologydesignandtesting |