Proceedings: 29 May - 1 June 2001, Stockholm, Sweden
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
2001
|
Schlagworte: | |
Beschreibung: | XII, 147 S. Ill., graph. Darst. |
ISBN: | 0769510167 |
Internformat
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Datensatz im Suchindex
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adam_text | |
any_adam_object | |
author_corporate | European Test Workshop Stockholm |
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author_facet | European Test Workshop Stockholm |
author_sort | European Test Workshop Stockholm |
building | Verbundindex |
bvnumber | BV013868805 |
classification_rvk | SS 2001 |
ctrlnum | (OCoLC)633995319 (DE-599)BVBBV013868805 |
discipline | Informatik |
format | Conference Proceeding Book |
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genre_facet | Konferenzschrift 2001 Stockholm |
id | DE-604.BV013868805 |
illustrated | Illustrated |
indexdate | 2025-01-10T13:21:19Z |
institution | BVB |
institution_GND | (DE-588)1401618-7 |
isbn | 0769510167 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009486215 |
oclc_num | 633995319 |
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owner | DE-739 DE-29T DE-634 |
owner_facet | DE-739 DE-29T DE-634 |
physical | XII, 147 S. Ill., graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | IEEE Computer Soc. |
record_format | marc |
spelling | European Test Workshop 6 2001 Stockholm Verfasser (DE-588)1401618-7 aut Proceedings 29 May - 1 June 2001, Stockholm, Sweden IEEE European Test Workshop ETW 2001 Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 2001 XII, 147 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronik (DE-588)4014346-6 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Fehlersuche (DE-588)4016615-6 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2001 Stockholm gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Elektronik (DE-588)4014346-6 s Fehlersuche (DE-588)4016615-6 s |
spellingShingle | Proceedings 29 May - 1 June 2001, Stockholm, Sweden Elektronik (DE-588)4014346-6 gnd Testen (DE-588)4367264-4 gnd Fehlersuche (DE-588)4016615-6 gnd VLSI (DE-588)4117388-0 gnd |
subject_GND | (DE-588)4014346-6 (DE-588)4367264-4 (DE-588)4016615-6 (DE-588)4117388-0 (DE-588)1071861417 |
title | Proceedings 29 May - 1 June 2001, Stockholm, Sweden |
title_alt | ETW 2001 |
title_auth | Proceedings 29 May - 1 June 2001, Stockholm, Sweden |
title_exact_search | Proceedings 29 May - 1 June 2001, Stockholm, Sweden |
title_full | Proceedings 29 May - 1 June 2001, Stockholm, Sweden IEEE European Test Workshop |
title_fullStr | Proceedings 29 May - 1 June 2001, Stockholm, Sweden IEEE European Test Workshop |
title_full_unstemmed | Proceedings 29 May - 1 June 2001, Stockholm, Sweden IEEE European Test Workshop |
title_short | Proceedings |
title_sort | proceedings 29 may 1 june 2001 stockholm sweden |
title_sub | 29 May - 1 June 2001, Stockholm, Sweden |
topic | Elektronik (DE-588)4014346-6 gnd Testen (DE-588)4367264-4 gnd Fehlersuche (DE-588)4016615-6 gnd VLSI (DE-588)4117388-0 gnd |
topic_facet | Elektronik Testen Fehlersuche VLSI Konferenzschrift 2001 Stockholm |
work_keys_str_mv | AT europeantestworkshopstockholm proceedings29may1june2001stockholmsweden AT europeantestworkshopstockholm etw2001 |