Electron backscatter diffraction in materials science:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Kluwer Acad.
2000
|
| Schlagworte: | |
| Beschreibung: | XVI, 339 S. Ill., graph. Darst. |
| ISBN: | 030646487X |
Internformat
MARC
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| 245 | 1 | 0 | |a Electron backscatter diffraction in materials science |c ed. by Adam J. Schwartz ... |
| 264 | 1 | |a New York [u.a.] |b Kluwer Acad. |c 2000 | |
| 300 | |a XVI, 339 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 650 | 4 | |a Cristallographie | |
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| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Materials |x Microscopy | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 0 | 7 | |a Elektronenbeugung |0 (DE-588)4151862-7 |2 gnd |9 rswk-swf |
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| 689 | 0 | 3 | |a Rückstreuung |0 (DE-588)4178653-1 |D s |
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Datensatz im Suchindex
| _version_ | 1804128699125071872 |
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| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013864373 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UQ 5500 |
| ctrlnum | (OCoLC)44619481 (DE-599)BVBBV013864373 |
| dewey-full | 620.1/1299 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1299 |
| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV013864373 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:53:23Z |
| institution | BVB |
| isbn | 030646487X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009483381 |
| oclc_num | 44619481 |
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| owner | DE-703 DE-29T |
| owner_facet | DE-703 DE-29T |
| physical | XVI, 339 S. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Kluwer Acad. |
| record_format | marc |
| spelling | Electron backscatter diffraction in materials science ed. by Adam J. Schwartz ... New York [u.a.] Kluwer Acad. 2000 XVI, 339 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Cristallographie Matériaux - Microscopie Microscopie électronique à balayage Crystallography Materials Microscopy Scanning electron microscopy Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Rückstreuung (DE-588)4178653-1 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 s Kristallographie (DE-588)4033217-2 s Elektronenbeugung (DE-588)4151862-7 s Rückstreuung (DE-588)4178653-1 s 1\p DE-604 Schwartz, Adam J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Electron backscatter diffraction in materials science Cristallographie Matériaux - Microscopie Microscopie électronique à balayage Crystallography Materials Microscopy Scanning electron microscopy Elektronenbeugung (DE-588)4151862-7 gnd Rückstreuung (DE-588)4178653-1 gnd Kristallographie (DE-588)4033217-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4151862-7 (DE-588)4178653-1 (DE-588)4033217-2 (DE-588)4079184-1 |
| title | Electron backscatter diffraction in materials science |
| title_auth | Electron backscatter diffraction in materials science |
| title_exact_search | Electron backscatter diffraction in materials science |
| title_full | Electron backscatter diffraction in materials science ed. by Adam J. Schwartz ... |
| title_fullStr | Electron backscatter diffraction in materials science ed. by Adam J. Schwartz ... |
| title_full_unstemmed | Electron backscatter diffraction in materials science ed. by Adam J. Schwartz ... |
| title_short | Electron backscatter diffraction in materials science |
| title_sort | electron backscatter diffraction in materials science |
| topic | Cristallographie Matériaux - Microscopie Microscopie électronique à balayage Crystallography Materials Microscopy Scanning electron microscopy Elektronenbeugung (DE-588)4151862-7 gnd Rückstreuung (DE-588)4178653-1 gnd Kristallographie (DE-588)4033217-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Cristallographie Matériaux - Microscopie Microscopie électronique à balayage Crystallography Materials Microscopy Scanning electron microscopy Elektronenbeugung Rückstreuung Kristallographie Werkstoffkunde |
| work_keys_str_mv | AT schwartzadamj electronbackscatterdiffractioninmaterialsscience |