Optical microstructural characterization of semiconductors: symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A.
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Warrendale, Pa.
Materials Research Soc.
2000
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| Schriftenreihe: | Materials Research Society symposia proceedings
588 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Inhaltsverzeichnis |
| Beschreibung: | XI, 333 S. Ill., graph. Darst. |
| ISBN: | 1558994963 |
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Datensatz im Suchindex
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| adam_text | MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS VOLUME 588 OPTICAL
MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS SYMPOSIUM HELD
NOVEMBER 29-30, 1999, BOSTON, MASSACHUSETTS, U.S.A. EDITORS: M. SELIM
UENLUE BOSTON UNIVERSITY BOSTON, MASSACHUSETTS, U.S.A. JAVIER PIQUERAS
UNIVERSIDAD COMPLUTENSE DE MADRID MADRID, SPAIN NADER M. KALKHORAN SPIRE
CORPORATION BEDFORD, MASSACHUSETTS, U.S.A. TAKASHI SEKIGUCHI TOHOKU
UNIVERSITY SENDAI, JAPAN [***1 MATERIALS RESEARCH SOCIETY WARRENDALE,
PENNSYLVANIA CONTENTS PREFACE XI MATERIALS RESEARCH SOCIETY SYMPOSIUM
PROCEEDINGS XII NEAR-FIELD TECHNIQUES *INTERNAL SPATIAL MODES AND LOCAL
PROPAGATION PROPERTIES IN OPTICAL WAVEGUIDES MEASURED USING NEAR-FIELD
SCANNING OPTICAL MICROSCOPY 3 BENNETT B. GOLDBERG, M. SELIM UENLUE, AND
GREG VANDER RHODES PHOTOREFLECTANCE NEAR-FIELD SCANNING OPTICAL
MICROSCOPY 13 CHARLES PAULSON, BRIAN HAWKINS, JINGXI SUN, ARTHUR B.
ELLIS, LEON MCCAUGHAN, AND T.F. KUECH SCANNING TUNNELING
MICROSCOPE-INDUCED LUMINESCENCE STUDIES OF DEFECTS IN GAN LAYERS AND
HETEROSTRUCTURES 19 S. EVOY, CK. HARNETT, S. KELLER, U.K. MISHRA, S.P.
DENBAARS, AND H.G. CRAIGHEAD *OPTICAL CHARACTERIZATION OF INDIVIDUAL
NANOSTRUCTURES BY STM LIGHT EMISSION 25 S. USHIODA OPTICAL INTEGRATED
WAVEGUIDES CHARACTERIZATION BY SCANNING NEAR-FIELD OPTICAL MICROSCOPE 37
X. BORRISE, N. BARNIOL, F. PEREZ-MURANO, G. ABADAL, X. AYMERICH, AND D.
JIMENEZ STM-LIGHT EMISSION FROM METAL DEPOSITED SEMICONDUCTOR SURFACES
43 N. YAMAMOTO, S. KAGAMI, AND H. MINODA PHOTOELECTRICAL AND RESONANCE
TECHNIQUES *LIGHT-EXCITATION-BASED SPECTROSCOPY OF ELECTRONIC DEFECTS IN
NOVEL MATERIALS 51 A. CASTALDINI, A. CAVALLINI, AND L. POLENTA * INVITED
PAPER V INVESTIGATION OF DEEP LEVELS IN GAP LIQUID PHASE EPITAXIAL
LAYERS ON SUBSTRATES WITH VAPOR PRESSURE HEAT TREATMENT 61 T.J. YU, K.
SUTO, AND J. NISHIZAWA LOW-TEMPERATURE PHOTOLUMINESCENCE PHOTOINDUCED
CURRENT SPECTROSCOPY ON CDZNTE GROWN BY HIGH-PRESSURE BRIDGMAN TECHNIQUE
67 A. ZERRAI, K. CHERKAOUI, S. MERGUI, A. ZUMBIEHL, M. HAGE-ALI, G.
MARRAKCHI, AND G. BREMOND LUMINESCENCE DEVELOPMENT OF LOW ENERGY
CATHODOLUMINESCENCE SYSTEM AND ITS APPLICATION TO THE STUDY OF ZNO
POWDERS 7 5 TAKASHI SEKIGUCHI OPTICAL PROPERTIES AND DEFECT STRUCTURE OF
MOVPE INGAN FILMS 81 A. CREMADES, M. ALBRECHT, J.M. ULLOA, J. PIQUERAS,
H.P. STRUNK, D. HANSER, AND R.F. DAVIS A STUDY OF THE ORIGIN OF BAND-A
EMISSION IN HOMOEPITAXIAL DIAMOND THIN FILMS 87 DAISUKE TAKEUCHI,
HIDEYUKI WATANABE, SADANORI YAMANAKA, HIDEYO OKUSHI, KOJI KAJIMURA,
HIDETAKA SAWADA, HIDEKI ICHINOSE, AND TAKASHI SEKIGUCHI SPECTRALLY
RESOLVED CATHODOLUMINESCENCE DETERMINATION OF DOPANT DIFFUSION IN
INPANGAASP BASED MULTI QUANTUM WELL FABRY-PEROT LASERS 93 *
ZANOTTI-FREGONARA, C. FERRARI, L. LAZZARINI, G. SALVIATI, M. MELIGA, D.
BERTONE, R.Y. FANG, G. MORELLO, AND R. PAOLETTI OPTICAL PROPERTIES OF SI
NANOWIRES ON A SI{LLL} SURFACE 99 N. OZAKI, Y. OHNO, AND S. TAKEDA
MESOSCOPIC CHARACTERIZATION OF THE OPTICAL PROPERTY OF ANTIPHASE
BOUNDARIES IN CUPT-ORDERED GAINP 2 105 Y. OHNO AND S. TAKEDA HOMOGENEITY
OF THERMALLY-ANNEALED LIGHTLY FE-DOPED SI INP ILL M. AVELLA, J. JIMENEZ,
R. FORNARI, AND E. DE LA PUENTE STUDY OF THE RADIATIVE AND NON-RADIATIVE
RECOMBINATION PROCESSES AT DISLOCATIONS IN SILICON BY PHOTOLUMINESCENCE
AND LBIC MEASUREMENTS 117 S. PIZZINI, S. BINETTI, M. ACCIARRI, AND M.
CASATI OPTICAL EMISSION RELATED TO HOLES CONFINED IN P-TYPE 5-DOPED
LAYERS IN GAAS 123 Q.X. ZHAO, M. WILLANDER, P.O. HOLTZ, W. LU, H.F. DOU,
S.C. SHEN, G. LI, AND C. JAGADISH CHARACTERIZATION OF SI, SIGE AND SOI
STRUCTURES USING PHOTOLUMINESCENCE 129 V. HIGGS PHOTOLUMINESCENCE AND
PHOTOLUMINESCENCE EXCITATION MECHANISMS FOR POROUS SILICON AND SILICON
OXYNITRIDE 141 XINGSHENG LIU, JESUS NOEL CALATA, HOUYUN LIANG, WANGZHOU
SHI, XUANYIN LIN, KUIXUN LIN, AND G.G. QIN RAMAN SPECTROSCOPY
MICRO-RAMAN CHARACTERIZATION OF ARSENIC-IMPLANTED SILICON:
INTERPRETATION OF THE SPECTRA 149 JAMES P. LAVINE AND DAVID D. TUSCHEL
DEPTH-RESOLVED MICROSPECTROSCOPY OF POROUS SILICON MULTILAYERS 155 S.
MANOTAS, F. AGULLO-RUEDA, J.D. MORENO, R.J. MARTIN-PALMA, R.
GUERRERO-LEMUS, AND J.M. MARTINEZ-DUART MICRO-RAMAN STUDY OF CHARGE
CARRIER DISTRIBUTION AND CATHODOLUMINESCENCE MICROANALYSIS OF POROUS GAP
MEMBRANES 161 I.M. TIGINYANU, M.A. STEVENS KALCEFF, A. SARUA, G IRMER,
J. MONECKE, O. COJOCARI, AND H.L. HARTNAGEL STUDY OF RAMAN SCATTERING OF
INPFLNGAASFLNP HEMTS 167 K. RADHAKRISHNAN, T.H.K. PATRICK, H.Q. ZHENG,
AND S.F. YOON OPTICAL PROPERTIES *OPTICAL AND MICROSTRUCTURAL
CHARACTERIZATION OF NANOCRYSTALHNE SILICON SUPERLATTICES 173 L.
TSYBESKOV, G.F. GROM, R. KRISHNAN, P.M. FAUCHET, J.P. MCCAFFREY, J-M.
BARIBEAU, G.I. SPROULE, D.J. LOCKWOOD, V. TIMOSHENKO, J. DIENER, H.
HECKLER, D. KOVALEV, F. KOCH, AND T.N. BLANTON *INVITED PAPER VII
*MICROSTRUCTURAL CHARACTERIZATION OF ANTIMONIDE BASED III-V COMPOUNDS
AND THEIR EFFECT ON ELECTRO-OPTICAL PROPERTIES OF SUBSTRATE MATERIALS
AND DEVICES 187 P.S. DUTTA, R.J. GUTMANN, G.W. CHARACHE, AND C.A. WANG
OPTICAL PROPERTIES OF PSEUDOMORPHIC SN X GEI_ X ALLOYS 199 REGINA RAGAN
AND HARRY A. ATWATER OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF
SEMICOND UCTORS*POSTERS OPTICAL ABSORPTION AND LUMINESCENCE STUDY OF THE
EFFECT OF THERMAL TREATMENTS ON THE POROUS SILICON SURFACE 209 R.
PLUGARU, G. CRACIUN, M. BEREU, J. RAMS, AND J. PIQUERAS OPTICAL
CHARACTERIZATION OF ION IMPLANTED SIC 215 E.K. WILLIAMS, D. IIA, D.B.
POKER, AND D.K. HENSLEY ANALYSIS OF THE CRYSTALLIZATION KINETICS AND
MICROSTRUCTURE OF POLYCRYSTALLINE SIGE FILMS BY OPTICAL TECHNIQUES 221
J. OLIVARES, P. MARTIN, A. RODRIGUEZ, J. SANGRADOR, O. MARTINEZ, J.
JIMENEZ, AND T. RODRIGUEZ MICRO-RAMAN CHARACTERIZATION OF UNUSUAL DEFECT
STRUCTURE IN ARSENIC-IMPLANTED SILICON 227 DAVID D. TUSCHEL AND JAMES P.
LAVINE CONFOCAL MICRO-RAMAN CHARACTERIZATION OF SIC EPILAYERS 233 RAN
LIU STUDY OF GASB JUNCTION DEVICES BY CATHODOLUMINESCENCE AND SCANNING
TUNNELING SPECTROSCOPY 239 P. HIDALGO, B. MENDEZ, J. PIQUERAS, AND P.S.
DUTTA CATHODOLUMINESCENCE FROM IN X GAI_ X AS LAYERS GROWN ON GAAS USING
A TRANSMISSION ELECTRON MICROSCOPE 245 N. YAMAMOTO, T. MITA, S. HEUN, A.
FRANCIOSI, AND J-M. BONARD STUDIES OF PHOTOREFLECTANCE IN CD]_ X MN X
TE/CDI_ Y MN Y TE SUPERLATTICES 251 CHENJIA CHEN, XUEZHONG WANG, HAITAO
LI, XIAOGAN LIANG, GUANGYU CHAI, ZHENG NING, AND XUN WANG * INVITED
PAPER VIII NONDESTRUCTIVE ANALYSIS OF CURRENT GAIN OF INP/INGAAS
HETEROJUNCTION BIPOLAR TRANSISTOR STRUCTURES USING PHOTOREFLECTANCE
SPECTROSCOPY 257 HIROKI SUGIYAMA, NORIYUKI WATANABE, KAZUO WATANABE,
TAKASHI KOBAYASHI, AND KAZUMI WADA QUANTUM CONFINEMENT OF ABOVE-BAND-GAP
TRANSITIONS IN GE QUANTUM DOTS 263 C.W. TENG, J.F. MUTH, R.M. KOLBAS,
K.M. HASSAN, A.K. SHARMA, A. KVIT, AND J. NARAYAN EFFECTS OF RAPID
THERMAL ANNEALING ON THE INTERSUBBAND ENERGY SPACING OF SELF-ASSEMBLED
INAS/GAAS QUANTUM DOTS 269 X.C. WANG, S.J. CHUA, S.J. XU, AND Z.H. ZHANG
PHOTO-INDUCED CURRENT SPECTROSCOPY IN UNDOPED CVD DIAMOND FILMS 277 E.
BORCHI, M. BRUZZI, L. LOMBARDI, D. MENICHELLI, S. MIGLIO, S. PIROLLO, S.
SCIORTINO, AND D. SERAFMI MICROVOIDS IN POLYCRYSTALLINE CVD DIAMOND 283
KAREN M. MCNAMARA PHOTOEMITTERS BASED ON GLASS-ITO STRUCTURES 291 J.
OLESIK DETERMINATION OF OPTICAL PROPERTIES OF FLUOROCARBON POLYMER THIN
FILMS BY A VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY 297 KANG-KUK LEE,
JIN-GOO PARK, AND HYUNG-JAE SHIN OPTICALLY INDUCED CONDENSATION OF
IMPURITY EXCITATIONS IN TRANSPARENT SOLIDS 303 E.A. MANYKIN, M.I.
OJOVAN, AND P.P. POLUEKTOV HYBRIDIZATION IN ELECTRONIC STATES AND
OPTICAL PROPERTIES OF COVALENT AMORPHOUS SEMICONDUCTORS 309 YUZO
SHINOZUKA VIEWPORT INFLUENCE ON OPTICAL PYROMETRY AND DEPOSITION PROCESS
IN MOCVD VERTICAL ROTATING DISC REACTORS 315 ANTON PROKOPENKO, ALEXANDER
GURARY, VADIM BOGUSLAVSKIY, JEFFREY RAMER, AND MATTHEW SCHURMAN IX
ENERGY BEHAVIOR WITH MAGNETIC FIELD OF NEGATIVELY CHARGED
MAGNETO-EXCITONS IN QUANTUM WELLS AND HETEROJUNCTIONS 321 F.M. MUNTEANU,
Y. KIM, C.H. PERRY, D.G. RICKEL, J.A. SIMMONS, AND J.L. RENO AUTHOR
INDEX 327 SUBJECT INDEX 331 X
|
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| indexdate | 2024-07-09T18:53:15Z |
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| spelling | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. ed.: M. Selim Ünlü... Warrendale, Pa. Materials Research Soc. 2000 XI, 333 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society symposia proceedings 588 Microstructure Congresses Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd rswk-swf Optische Messung (DE-588)4121429-8 gnd rswk-swf Mikrostruktur (DE-588)4131028-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Boston Mass. gnd-content Halbleiter (DE-588)4022993-2 s Mikrostruktur (DE-588)4131028-7 s Optische Messung (DE-588)4121429-8 s DE-604 Ünlü, M. Selim edt Materials Research Society symposia proceedings 588 (DE-604)BV001899105 588 https://www.gbv.de/dms/ilmenau/toc/312448570.PDF Inhaltsverzeichnis GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009477475&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. Materials Research Society symposia proceedings Microstructure Congresses Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd Optische Messung (DE-588)4121429-8 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4121429-8 (DE-588)4131028-7 (DE-588)1071861417 |
| title | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. |
| title_auth | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. |
| title_exact_search | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. |
| title_full | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. ed.: M. Selim Ünlü... |
| title_fullStr | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. ed.: M. Selim Ünlü... |
| title_full_unstemmed | Optical microstructural characterization of semiconductors symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. ed.: M. Selim Ünlü... |
| title_short | Optical microstructural characterization of semiconductors |
| title_sort | optical microstructural characterization of semiconductors symposium held november 29 30 1999 boston massachusetts u s a |
| title_sub | symposium held November 29 - 30, 1999, Boston, Massachusetts, U.S.A. |
| topic | Microstructure Congresses Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd Optische Messung (DE-588)4121429-8 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| topic_facet | Microstructure Congresses Semiconductors Congresses Halbleiter Optische Messung Mikrostruktur Konferenzschrift 1999 Boston Mass. |
| url | https://www.gbv.de/dms/ilmenau/toc/312448570.PDF http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009477475&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV001899105 |
| work_keys_str_mv | AT unlumselim opticalmicrostructuralcharacterizationofsemiconductorssymposiumheldnovember29301999bostonmassachusettsusa |
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