Proceedings of the 2nd LEEM/PEEM Workshop: Paris, France, 26 - 28 September 2000
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
Elsevier
2001
|
| Schriftenreihe: | Surface science
480,3 |
| Schlagworte: | |
| Beschreibung: | Einzelaufn. eines Zeitschr.-Heftes |
| Beschreibung: | VII S., S. 98 - 218 Ill., graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
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| genre_facet | Konferenzschrift 2000 Paris |
| id | DE-604.BV013783818 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:51:55Z |
| institution | BVB |
| institution_GND | (DE-588)6033240-2 |
| language | English |
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| physical | VII S., S. 98 - 218 Ill., graph. Darst. |
| publishDate | 2001 |
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| publisher | Elsevier |
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| series2 | Surface science |
| spelling | LEEM PEEM Workshop 2 2000 Paris Verfasser (DE-588)6033240-2 aut Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 LEEM/PEEM 2. Ed. by E. Bauer ... LEEM/PEEM 2 Amsterdam u.a. Elsevier 2001 VII S., S. 98 - 218 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Surface science 480,3 Einzelaufn. eines Zeitschr.-Heftes Niedrige Energie (DE-588)4356330-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Paris gnd-content Photoemissionselektronenmikroskopie (DE-588)4174495-0 s DE-604 Niedrige Energie (DE-588)4356330-2 s Elektronenmikroskopie (DE-588)4014327-2 s Bauer, Ernst Sonstige oth |
| spellingShingle | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 Niedrige Energie (DE-588)4356330-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd |
| subject_GND | (DE-588)4356330-2 (DE-588)4014327-2 (DE-588)4174495-0 (DE-588)1071861417 |
| title | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 |
| title_alt | LEEM/PEEM 2 |
| title_auth | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 |
| title_exact_search | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 |
| title_full | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 LEEM/PEEM 2. Ed. by E. Bauer ... |
| title_fullStr | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 LEEM/PEEM 2. Ed. by E. Bauer ... |
| title_full_unstemmed | Proceedings of the 2nd LEEM/PEEM Workshop Paris, France, 26 - 28 September 2000 LEEM/PEEM 2. Ed. by E. Bauer ... |
| title_short | Proceedings of the 2nd LEEM/PEEM Workshop |
| title_sort | proceedings of the 2nd leem peem workshop paris france 26 28 september 2000 |
| title_sub | Paris, France, 26 - 28 September 2000 |
| topic | Niedrige Energie (DE-588)4356330-2 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd |
| topic_facet | Niedrige Energie Elektronenmikroskopie Photoemissionselektronenmikroskopie Konferenzschrift 2000 Paris |
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