(1999). Optical metrology: Proceedings of a conference held 18 - 19 July 1999, Denver, Colorado. SPIE Optical Engineering Press.
Chicago Style (17th ed.) CitationOptical Metrology: Proceedings of a Conference Held 18 - 19 July 1999, Denver, Colorado. Bellingham, Wash: SPIE Optical Engineering Press, 1999.
MLA (9th ed.) CitationOptical Metrology: Proceedings of a Conference Held 18 - 19 July 1999, Denver, Colorado. SPIE Optical Engineering Press, 1999.
Warning: These citations may not always be 100% accurate.