Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston [u.a.]
Kluwer
2000
|
| Schriftenreihe: | Frontiers in electronic testing
17 |
| Schlagworte: | |
| Beschreibung: | XVIII, 690 S. Ill., graph. Darst. |
| ISBN: | 0792379918 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013614040 | ||
| 003 | DE-604 | ||
| 005 | 20061026 | ||
| 007 | t | ||
| 008 | 010305s2000 ad|| |||| 00||| eng d | ||
| 020 | |a 0792379918 |9 0-7923-7991-8 | ||
| 035 | |a (OCoLC)890196362 | ||
| 035 | |a (DE-599)BVBBV013614040 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 |a DE-29T |a DE-91 | ||
| 050 | 0 | |a TK7874.75 | |
| 082 | 0 | |a 621.39/5 |2 21 | |
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 084 | |a ELT 359f |2 stub | ||
| 084 | |a ELT 355f |2 stub | ||
| 100 | 1 | |a Bushnell, Michael Lee |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |c Michael L. Bushnell ; Vishwani D. Agrawal |
| 264 | 1 | |a Boston [u.a.] |b Kluwer |c 2000 | |
| 300 | |a XVIII, 690 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in electronic testing |v 17 | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 4 | |a Semiconductor storage devices |x Testing | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |D s |
| 689 | 0 | 1 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 2 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Agrawal, Vishwani D. |e Verfasser |4 aut | |
| 830 | 0 | |a Frontiers in electronic testing |v 17 |w (DE-604)BV010836129 |9 17 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009301042 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804128421813420032 |
|---|---|
| any_adam_object | |
| author | Bushnell, Michael Lee Agrawal, Vishwani D. |
| author_facet | Bushnell, Michael Lee Agrawal, Vishwani D. |
| author_role | aut aut |
| author_sort | Bushnell, Michael Lee |
| author_variant | m l b ml mlb v d a vd vda |
| building | Verbundindex |
| bvnumber | BV013614040 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874.75 |
| callnumber-search | TK7874.75 |
| callnumber-sort | TK 47874.75 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4030 |
| classification_tum | ELT 359f ELT 355f |
| ctrlnum | (OCoLC)890196362 (DE-599)BVBBV013614040 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01845nam a2200493 cb4500</leader><controlfield tag="001">BV013614040</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20061026 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010305s2000 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792379918</subfield><subfield code="9">0-7923-7991-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)890196362</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013614040</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874.75</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 355f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bushnell, Michael Lee</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits</subfield><subfield code="c">Michael L. Bushnell ; Vishwani D. Agrawal</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston [u.a.]</subfield><subfield code="b">Kluwer</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 690 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">17</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mixed signal circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor storage devices</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Agrawal, Vishwani D.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">17</subfield><subfield code="w">(DE-604)BV010836129</subfield><subfield code="9">17</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009301042</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV013614040 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:48:59Z |
| institution | BVB |
| isbn | 0792379918 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009301042 |
| oclc_num | 890196362 |
| open_access_boolean | |
| owner | DE-573 DE-29T DE-91 DE-BY-TUM |
| owner_facet | DE-573 DE-29T DE-91 DE-BY-TUM |
| physical | XVIII, 690 S. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Kluwer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Bushnell, Michael Lee Verfasser aut Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal Boston [u.a.] Kluwer 2000 XVIII, 690 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 17 Digital integrated circuits Testing Integrated circuits Very large scale integration Testing Mixed signal circuits Testing Semiconductor storage devices Testing VLSI (DE-588)4117388-0 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 s VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Agrawal, Vishwani D. Verfasser aut Frontiers in electronic testing 17 (DE-604)BV010836129 17 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Bushnell, Michael Lee Agrawal, Vishwani D. Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Frontiers in electronic testing Digital integrated circuits Testing Integrated circuits Very large scale integration Testing Mixed signal circuits Testing Semiconductor storage devices Testing VLSI (DE-588)4117388-0 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4113419-9 (DE-588)4047610-8 |
| title | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_auth | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_exact_search | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_full | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_fullStr | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_full_unstemmed | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_short | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_sort | essentials of electronic testing for digital memory and mixed signal vlsi circuits |
| topic | Digital integrated circuits Testing Integrated circuits Very large scale integration Testing Mixed signal circuits Testing Semiconductor storage devices Testing VLSI (DE-588)4117388-0 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Digital integrated circuits Testing Integrated circuits Very large scale integration Testing Mixed signal circuits Testing Semiconductor storage devices Testing VLSI Elektronische Schaltung Prüftechnik |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT bushnellmichaellee essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits AT agrawalvishwanid essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits |