2000 IEEE International Reliability Physics Symposium proceedings: 38th annual ; San Jose, California April 10-13, 2000
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Piscataway, NJ
2000
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Schlagworte: | |
Beschreibung: | VIII, 456 S. Ill., graph. Darst. |
ISBN: | 0780358600 0780358619 0780358627 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV013593301 | ||
003 | DE-604 | ||
005 | 20010219 | ||
007 | t | ||
008 | 010219s2000 ad||j |||| 10||| eng d | ||
020 | |a 0780358600 |9 0-7803-5860-0 | ||
020 | |a 0780358619 |9 0-7803-5861-9 | ||
020 | |a 0780358627 |9 0-7803-5862-7 | ||
035 | |a (OCoLC)44060152 | ||
035 | |a (DE-599)BVBBV013593301 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-1050 |a DE-83 | ||
050 | 0 | |a TK7870 | |
082 | 0 | |a 621.3815 |2 22 | |
084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
111 | 2 | |a International Reliability Physics Symposium |n 38 |d 2000 |c San José, Calif. |j Verfasser |0 (DE-588)1244654-3 |4 aut | |
245 | 1 | 0 | |a 2000 IEEE International Reliability Physics Symposium proceedings |b 38th annual ; San Jose, California April 10-13, 2000 |
246 | 1 | 3 | |a Two-Thousand IEEE International Reliability Physics Symposium proceedings |
264 | 1 | |a Piscataway, NJ |c 2000 | |
300 | |a VIII, 456 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
650 | 0 | 7 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2000 |z San Jose Calif. |2 gnd-content | |
689 | 0 | 0 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |D s |
689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009284808 |
Datensatz im Suchindex
_version_ | 1804128397298761728 |
---|---|
any_adam_object | |
author_corporate | International Reliability Physics Symposium San José, Calif |
author_corporate_role | aut |
author_facet | International Reliability Physics Symposium San José, Calif |
author_sort | International Reliability Physics Symposium San José, Calif |
building | Verbundindex |
bvnumber | BV013593301 |
callnumber-first | T - Technology |
callnumber-label | TK7870 |
callnumber-raw | TK7870 |
callnumber-search | TK7870 |
callnumber-sort | TK 47870 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4040 |
ctrlnum | (OCoLC)44060152 (DE-599)BVBBV013593301 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01578nam a2200409 c 4500</leader><controlfield tag="001">BV013593301</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010219 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010219s2000 ad||j |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780358600</subfield><subfield code="9">0-7803-5860-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780358619</subfield><subfield code="9">0-7803-5861-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780358627</subfield><subfield code="9">0-7803-5862-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)44060152</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013593301</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="n">38</subfield><subfield code="d">2000</subfield><subfield code="c">San José, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1244654-3</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">2000 IEEE International Reliability Physics Symposium proceedings</subfield><subfield code="b">38th annual ; San Jose, California April 10-13, 2000</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Two-Thousand IEEE International Reliability Physics Symposium proceedings</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 456 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2000</subfield><subfield code="z">San Jose Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009284808</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 2000 San Jose Calif. gnd-content |
genre_facet | Konferenzschrift 2000 San Jose Calif. |
id | DE-604.BV013593301 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:48:35Z |
institution | BVB |
institution_GND | (DE-588)1244654-3 |
isbn | 0780358600 0780358619 0780358627 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009284808 |
oclc_num | 44060152 |
open_access_boolean | |
owner | DE-1050 DE-83 |
owner_facet | DE-1050 DE-83 |
physical | VIII, 456 S. Ill., graph. Darst. |
publishDate | 2000 |
publishDateSearch | 2000 |
publishDateSort | 2000 |
record_format | marc |
spelling | International Reliability Physics Symposium 38 2000 San José, Calif. Verfasser (DE-588)1244654-3 aut 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 Two-Thousand IEEE International Reliability Physics Symposium proceedings Piscataway, NJ 2000 VIII, 456 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 San Jose Calif. gnd-content Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 |
spellingShingle | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
subject_GND | (DE-588)4014360-0 (DE-588)4059245-5 (DE-588)1071861417 |
title | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_alt | Two-Thousand IEEE International Reliability Physics Symposium proceedings |
title_auth | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_exact_search | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_full | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_fullStr | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_full_unstemmed | 2000 IEEE International Reliability Physics Symposium proceedings 38th annual ; San Jose, California April 10-13, 2000 |
title_short | 2000 IEEE International Reliability Physics Symposium proceedings |
title_sort | 2000 ieee international reliability physics symposium proceedings 38th annual san jose california april 10 13 2000 |
title_sub | 38th annual ; San Jose, California April 10-13, 2000 |
topic | Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
topic_facet | Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement Zuverlässigkeit Konferenzschrift 2000 San Jose Calif. |
work_keys_str_mv | AT internationalreliabilityphysicssymposiumsanjosecalif 2000ieeeinternationalreliabilityphysicssymposiumproceedings38thannualsanjosecaliforniaapril10132000 AT internationalreliabilityphysicssymposiumsanjosecalif twothousandieeeinternationalreliabilityphysicssymposiumproceedings |