Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures: Heidelberg, Germany, May 28 - 31, 2000
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam [u.a.]
Elsevier
2001
|
| Series: | Ultramicroscopy
86,1/2 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. |
| Physical Description: | XII, 254 S. Ill., graph. Darst. |
Staff View
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| illustrated | Illustrated |
| indexdate | 2024-07-09T18:48:13Z |
| institution | BVB |
| institution_GND | (DE-588)5523380-6 |
| language | English |
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| physical | XII, 254 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Ultramicroscopy |
| spelling | International Conference on Scanning Probe Microscopy, Sensors and Nanostructures 2 2000 Heidelberg Verfasser (DE-588)5523380-6 aut Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison SPM 2000 Scanning probe microscopy, sensors & nanostructures Amsterdam [u.a.] Elsevier 2001 XII, 254 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 86,1/2 Einzelaufnahme eines Zeitschr.-H. Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Heidelberg gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Allison, David P. Sonstige oth |
| spellingShingle | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)1071861417 |
| title | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_alt | SPM 2000 Scanning probe microscopy, sensors & nanostructures |
| title_auth | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_exact_search | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_full | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_fullStr | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_full_unstemmed | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_short | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures |
| title_sort | proceedings of the second international conference on scanning probe microscopy sensors and nanostructures heidelberg germany may 28 31 2000 |
| title_sub | Heidelberg, Germany, May 28 - 31, 2000 |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie Konferenzschrift 2000 Heidelberg |
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