Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures: Heidelberg, Germany, May 28 - 31, 2000
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2001
|
| Schriftenreihe: | Ultramicroscopy
86,1/2 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
| Beschreibung: | XII, 254 S. Ill., graph. Darst. |
Internformat
MARC
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| 245 | 1 | 0 | |a Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures |b Heidelberg, Germany, May 28 - 31, 2000 |c SPM 2000. Guest ed.: David P. Allison |
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| 246 | 1 | 3 | |a Scanning probe microscopy, sensors & nanostructures |
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| 300 | |a XII, 254 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| format | Conference Proceeding Book |
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| id | DE-604.BV013574617 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:48:13Z |
| institution | BVB |
| institution_GND | (DE-588)5523380-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009269832 |
| oclc_num | 633430217 |
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| physical | XII, 254 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Ultramicroscopy |
| spelling | International Conference on Scanning Probe Microscopy, Sensors and Nanostructures 2 2000 Heidelberg Verfasser (DE-588)5523380-6 aut Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison SPM 2000 Scanning probe microscopy, sensors & nanostructures Amsterdam [u.a.] Elsevier 2001 XII, 254 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 86,1/2 Einzelaufnahme eines Zeitschr.-H. Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Heidelberg gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Allison, David P. Sonstige oth |
| spellingShingle | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)1071861417 |
| title | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_alt | SPM 2000 Scanning probe microscopy, sensors & nanostructures |
| title_auth | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_exact_search | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 |
| title_full | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_fullStr | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_full_unstemmed | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg, Germany, May 28 - 31, 2000 SPM 2000. Guest ed.: David P. Allison |
| title_short | Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures |
| title_sort | proceedings of the second international conference on scanning probe microscopy sensors and nanostructures heidelberg germany may 28 31 2000 |
| title_sub | Heidelberg, Germany, May 28 - 31, 2000 |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie Konferenzschrift 2000 Heidelberg |
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