International Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg. (2001). Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures: Heidelberg, Germany, May 28 - 31, 2000. Elsevier.
Chicago Style (17th ed.) CitationInternational Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg. Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures: Heidelberg, Germany, May 28 - 31, 2000. Amsterdam [u.a.]: Elsevier, 2001.
MLA (9th ed.) CitationInternational Conference on Scanning Probe Microscopy, Sensors and Nanostructures Heidelberg. Proceedings of the Second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures: Heidelberg, Germany, May 28 - 31, 2000. Elsevier, 2001.