Structure and electronic properties of ultrathin dielectric films on silicon and related structures: symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A.
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Warrendale, Pa.
Materials Research Soc.
2000
|
Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
592 |
Schlagworte: | |
Beschreibung: | XI, 386 S. Ill., graph. Darst. |
ISBN: | 1558995005 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV013564888 | ||
003 | DE-604 | ||
005 | 20010201 | ||
007 | t | ||
008 | 010201s2000 ad|| |||| 10||| eng d | ||
020 | |a 1558995005 |9 1-55899-500-5 | ||
035 | |a (OCoLC)314293805 | ||
035 | |a (DE-599)BVBBV013564888 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-29T |a DE-703 |a DE-83 | ||
084 | |a UD 8400 |0 (DE-625)145545: |2 rvk | ||
245 | 1 | 0 | |a Structure and electronic properties of ultrathin dielectric films on silicon and related structures |b symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. |c ed. D. A. Buchanan ... |
264 | 1 | |a Warrendale, Pa. |b Materials Research Soc. |c 2000 | |
300 | |a XI, 386 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 592 | |
650 | 0 | 7 | |a SOI-Technik |0 (DE-588)4128029-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Dielektrische Schicht |0 (DE-588)4194257-7 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Boston Mass. |2 gnd-content | |
689 | 0 | 0 | |a Dielektrische Schicht |0 (DE-588)4194257-7 |D s |
689 | 0 | 1 | |a SOI-Technik |0 (DE-588)4128029-5 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
689 | 1 | |8 1\p |5 DE-604 | |
700 | 1 | |a Buchanan, D. A. |e Sonstige |4 oth | |
830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings |v 592 |w (DE-604)BV001899105 |9 592 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009264276 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804128365139984384 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV013564888 |
classification_rvk | UD 8400 |
ctrlnum | (OCoLC)314293805 (DE-599)BVBBV013564888 |
discipline | Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01731nam a2200409 cb4500</leader><controlfield tag="001">BV013564888</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010201 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">010201s2000 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1558995005</subfield><subfield code="9">1-55899-500-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)314293805</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013564888</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UD 8400</subfield><subfield code="0">(DE-625)145545:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Structure and electronic properties of ultrathin dielectric films on silicon and related structures</subfield><subfield code="b">symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A.</subfield><subfield code="c">ed. D. A. Buchanan ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Warrendale, Pa.</subfield><subfield code="b">Materials Research Soc.</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 386 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">592</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">SOI-Technik</subfield><subfield code="0">(DE-588)4128029-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dielektrische Schicht</subfield><subfield code="0">(DE-588)4194257-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Boston Mass.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Dielektrische Schicht</subfield><subfield code="0">(DE-588)4194257-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">SOI-Technik</subfield><subfield code="0">(DE-588)4128029-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Buchanan, D. A.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">592</subfield><subfield code="w">(DE-604)BV001899105</subfield><subfield code="9">592</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009264276</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1999 Boston Mass. gnd-content |
genre_facet | Konferenzschrift 1999 Boston Mass. |
id | DE-604.BV013564888 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:48:05Z |
institution | BVB |
isbn | 1558995005 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009264276 |
oclc_num | 314293805 |
open_access_boolean | |
owner | DE-29T DE-703 DE-83 |
owner_facet | DE-29T DE-703 DE-83 |
physical | XI, 386 S. Ill., graph. Darst. |
publishDate | 2000 |
publishDateSearch | 2000 |
publishDateSort | 2000 |
publisher | Materials Research Soc. |
record_format | marc |
series | Materials Research Society: Materials Research Society symposia proceedings |
series2 | Materials Research Society: Materials Research Society symposia proceedings |
spelling | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. ed. D. A. Buchanan ... Warrendale, Pa. Materials Research Soc. 2000 XI, 386 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 592 SOI-Technik (DE-588)4128029-5 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf Dielektrische Schicht (DE-588)4194257-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Boston Mass. gnd-content Dielektrische Schicht (DE-588)4194257-7 s SOI-Technik (DE-588)4128029-5 s DE-604 Silicium (DE-588)4077445-4 s 1\p DE-604 Buchanan, D. A. Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 592 (DE-604)BV001899105 592 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. Materials Research Society: Materials Research Society symposia proceedings SOI-Technik (DE-588)4128029-5 gnd Silicium (DE-588)4077445-4 gnd Dielektrische Schicht (DE-588)4194257-7 gnd |
subject_GND | (DE-588)4128029-5 (DE-588)4077445-4 (DE-588)4194257-7 (DE-588)1071861417 |
title | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. |
title_auth | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. |
title_exact_search | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. |
title_full | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. ed. D. A. Buchanan ... |
title_fullStr | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. ed. D. A. Buchanan ... |
title_full_unstemmed | Structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. ed. D. A. Buchanan ... |
title_short | Structure and electronic properties of ultrathin dielectric films on silicon and related structures |
title_sort | structure and electronic properties of ultrathin dielectric films on silicon and related structures symposium held november 29 december 1 1999 boston massachusetts u s a |
title_sub | symposium held November 29 - December 1, 1999, Boston, Massachusetts, U.S.A. |
topic | SOI-Technik (DE-588)4128029-5 gnd Silicium (DE-588)4077445-4 gnd Dielektrische Schicht (DE-588)4194257-7 gnd |
topic_facet | SOI-Technik Silicium Dielektrische Schicht Konferenzschrift 1999 Boston Mass. |
volume_link | (DE-604)BV001899105 |
work_keys_str_mv | AT buchananda structureandelectronicpropertiesofultrathindielectricfilmsonsiliconandrelatedstructuressymposiumheldnovember29december11999bostonmassachusettsusa |