Electron microscopy and analysis:
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
London [u.a.]
Taylor & Francis
2001
|
| Edition: | 3. ed. |
| Subjects: | |
| Physical Description: | X, 251 S. Ill., graph. Darst. |
| ISBN: | 0748409688 |
Staff View
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| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| 250 | |a 3. ed. | ||
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| 700 | 1 | |a Beanland, Richard |e Verfasser |4 aut | |
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Record in the Search Index
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| dewey-ones | 502 - Miscellany |
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| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Biologie Chemie |
| edition | 3. ed. |
| format | Book |
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| id | DE-604.BV013458715 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:46:15Z |
| institution | BVB |
| isbn | 0748409688 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009186444 |
| oclc_num | 43787600 |
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| owner_facet | DE-703 DE-355 DE-BY-UBR DE-91G DE-BY-TUM DE-1051 DE-29T DE-19 DE-BY-UBM DE-522 |
| physical | X, 251 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Taylor & Francis |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland 3. ed. London [u.a.] Taylor & Francis 2001 X, 251 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Humphreys, John F. Verfasser aut Beanland, Richard Verfasser aut |
| spellingShingle | Goodhew, Peter J. Humphreys, John F. Beanland, Richard Electron microscopy and analysis Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Microscopie électronique Electron microscopy Elektronenmikroskopie |
| work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT humphreysjohnf electronmicroscopyandanalysis AT beanlandrichard electronmicroscopyandanalysis |