Electron microscopy and analysis:
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
London [u.a.]
Taylor & Francis
2001
|
Ausgabe: | 3. ed. |
Schlagworte: | |
Beschreibung: | X, 251 S. Ill., graph. Darst. |
ISBN: | 0748409688 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV013458715 | ||
003 | DE-604 | ||
005 | 20010530 | ||
007 | t | ||
008 | 001128s2001 ad|| |||| 00||| eng d | ||
020 | |a 0748409688 |9 0-7484-0968-8 | ||
035 | |a (OCoLC)43787600 | ||
035 | |a (DE-599)BVBBV013458715 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-703 |a DE-355 |a DE-91G |a DE-1051 |a DE-29T |a DE-19 |a DE-522 | ||
050 | 0 | |a QH212.E4 | |
082 | 0 | |a 502/.8/25 |2 21 | |
084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
084 | |a WC 3100 |0 (DE-625)148081: |2 rvk | ||
084 | |a PHY 130f |2 stub | ||
084 | |a CHE 264f |2 stub | ||
100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew ; John Humphreys ; Richard Beanland |
250 | |a 3. ed. | ||
264 | 1 | |a London [u.a.] |b Taylor & Francis |c 2001 | |
300 | |a X, 251 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Microscopie électronique | |
650 | 4 | |a Electron microscopy | |
650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Humphreys, John F. |e Verfasser |4 aut | |
700 | 1 | |a Beanland, Richard |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009186444 |
Datensatz im Suchindex
_version_ | 1804128250077642752 |
---|---|
any_adam_object | |
author | Goodhew, Peter J. Humphreys, John F. Beanland, Richard |
author_facet | Goodhew, Peter J. Humphreys, John F. Beanland, Richard |
author_role | aut aut aut |
author_sort | Goodhew, Peter J. |
author_variant | p j g pj pjg j f h jf jfh r b rb |
building | Verbundindex |
bvnumber | BV013458715 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.E4 |
callnumber-search | QH212.E4 |
callnumber-sort | QH 3212 E4 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | UH 6300 WC 3100 |
classification_tum | PHY 130f CHE 264f |
ctrlnum | (OCoLC)43787600 (DE-599)BVBBV013458715 |
dewey-full | 502/.8/25 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8/25 |
dewey-search | 502/.8/25 |
dewey-sort | 3502 18 225 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Biologie Chemie |
edition | 3. ed. |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01368nam a2200421 c 4500</leader><controlfield tag="001">BV013458715</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010530 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">001128s2001 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0748409688</subfield><subfield code="9">0-7484-0968-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)43787600</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013458715</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-1051</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-522</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.E4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WC 3100</subfield><subfield code="0">(DE-625)148081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 130f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 264f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Goodhew, Peter J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron microscopy and analysis</subfield><subfield code="c">Peter J. Goodhew ; John Humphreys ; Richard Beanland</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">3. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London [u.a.]</subfield><subfield code="b">Taylor & Francis</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 251 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopie électronique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Humphreys, John F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Beanland, Richard</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009186444</subfield></datafield></record></collection> |
id | DE-604.BV013458715 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:46:15Z |
institution | BVB |
isbn | 0748409688 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009186444 |
oclc_num | 43787600 |
open_access_boolean | |
owner | DE-703 DE-355 DE-BY-UBR DE-91G DE-BY-TUM DE-1051 DE-29T DE-19 DE-BY-UBM DE-522 |
owner_facet | DE-703 DE-355 DE-BY-UBR DE-91G DE-BY-TUM DE-1051 DE-29T DE-19 DE-BY-UBM DE-522 |
physical | X, 251 S. Ill., graph. Darst. |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | Taylor & Francis |
record_format | marc |
spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland 3. ed. London [u.a.] Taylor & Francis 2001 X, 251 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Humphreys, John F. Verfasser aut Beanland, Richard Verfasser aut |
spellingShingle | Goodhew, Peter J. Humphreys, John F. Beanland, Richard Electron microscopy and analysis Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4014327-2 |
title | Electron microscopy and analysis |
title_auth | Electron microscopy and analysis |
title_exact_search | Electron microscopy and analysis |
title_full | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
title_fullStr | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew ; John Humphreys ; Richard Beanland |
title_short | Electron microscopy and analysis |
title_sort | electron microscopy and analysis |
topic | Microscopie électronique Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | Microscopie électronique Electron microscopy Elektronenmikroskopie |
work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT humphreysjohnf electronmicroscopyandanalysis AT beanlandrichard electronmicroscopyandanalysis |