Self-checking and fault-tolerant digital design:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
San Francisco [u.a.]
Morgan Kaufmann
2001
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Hier auch spätere, unveränderte Nachdrucke |
| Beschreibung: | XII, 216 S. graph. Darst. |
| ISBN: | 0124343708 9780124343702 |
Internformat
MARC
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|---|---|---|---|
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| 003 | DE-604 | ||
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| 100 | 1 | |a Lala, Parag K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Self-checking and fault-tolerant digital design |c Parag K. Lala |
| 246 | 1 | 3 | |a Self-checking and fault tolerant digital design |
| 264 | 1 | |a San Francisco [u.a.] |b Morgan Kaufmann |c 2001 | |
| 300 | |a XII, 216 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 650 | 4 | |a Fault-tolerant computing | |
| 650 | 4 | |a Logic design | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-009154963 | ||
Datensatz im Suchindex
| _version_ | 1804128203249287168 |
|---|---|
| adam_text | Titel: Self-checking and fault tolerant digital design
Autor: Lala, Parag K
Jahr: 2001
Contents
Preface
Fundamentals of Reliability
1.1 Reliability and the Failure Rate 2
1.2 Relation between Reliability and Mean-Time-Between-Failures
1.3 Maintainability 6
1.4 Availability 8
1.5 Series and Parallel Systems 8
1.6 Dependability 12
1.7 References 12
Error Detecting and Correcting Codes
2.1 Parity Code 16
2.2 Multiple Error Detecting Codes 17
2.2.1 Unordered Codes for Unidirectional Error Detection 18
2.2.2 f-unidirectional Error Detecting Codes 20
2.2.3 Burst Unidirectional Error Detecting Code 22
2.3 Residue Codes 27
2.4 Cyclic Codes 28
2.5 Error Correcting Codes 30
2.5.1 Hamming Code 31
2.5.2 Hsiao Code 34
2.5.3 Reed-Solomon Code 36
2.6 References 40
Self-Checking Combinational Logic Design
3.1 Strongly Fault-Secure Circuits 46
3.2 Strongly Code-Disjoint Circuits 47
3.3 Terminology 49
3.4 Bidirectional Error-Free Combinational Circuit Design 50
3.5 Detection of Input Fault Induced Bidirectional Errors 53
3.6 Techniques for Bidirectional Error Elimination 55
3.6.1 Input Encoding 55
3.6.2 Output Encoding 58
3.7 Self-Dual Parity Checking 61
3.8 Self-Checking Design Using Low-Cost Residue Code 65
3.9 Tbtally Self-Checking PL A Design 67
3.10 Fail-Safe Combinational Circuit Design 73
3.11 References 76
Self-Checking Checkers
4.1 The TWo-Rail Checker 79 j
4.2 Tbtally Self-Checking Checkers for m-out-of-n Codes 82
4.2.1 Pass TTansistor-Based Checker Design for a Subset of m-out-of-2m
Codes 95
4.2.2 Tbtally Self-Checking Checker for 1-out-of-n Code 99
4.3 Tbtally Self-Checking Checker for Berger Code 107
4.4 Tbtally Self-Checking Checker for Low-Cost Residue Code 126
4.5 References 128
Self-Checking Sequential Circuit Design
5.1 Faults in State Machines 132
5.2 Self-Checking State Machine Design Techniques 134
5.3 Elimination of Bidirectional Errors 143
5.4 Synthesis of Redundant Fault-Free State Machines 145
5.5 Decomposition of Finite State Machines 150
5.6 Self-Checking Interacting State Machine Design 152
5.7 Fail-Safe State Machine Design 156
5.8 References 159
Fault-Tolerant Design
6.1 Hardware Redundancy 162
6.1.1 Static Redundancy 162
6.1.2 Dynamic Redundancy 168
6.1.3 Hybrid Redundancy 172
6.2 Information Redundancy 176
6.2.1 Fault-Tblerant State Machine Design Using Hamming Codes 176
6.2.2 Error Checking and Correction (ECC) in Memory Systems 178
6.2.3 Improvement in Reliability with ECC 179
6.2.4 Multiple Error Correction Using Orthogonal Latin Squares
Configuration 181
6.2.5 Soft Error Correction Using the Horizontal and Vertical Parity
Method 185
6.3 Time Redundancy 187
6.4 Software Redundancy 188
6.5 System-Level Fault Tblerance 189
6.5.1 Byzantine Fault Model 191
6.5.2 System-Level Fault Detection 194
6.5.3 Backward Recovery Schemes 196
6.5.4 Forward Recovery Schemes 196
6.6 References 198
Appendix: Markov Models
Index
|
| any_adam_object | 1 |
| author | Lala, Parag K. |
| author_facet | Lala, Parag K. |
| author_role | aut |
| author_sort | Lala, Parag K. |
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| building | Verbundindex |
| bvnumber | BV013416624 |
| callnumber-first | T - Technology |
| callnumber-label | TK7888 |
| callnumber-raw | TK7888.3 |
| callnumber-search | TK7888.3 |
| callnumber-sort | TK 47888.3 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 195 |
| classification_tum | DAT 195f ELT 468f ELT 456f |
| ctrlnum | (OCoLC)40489138 (DE-599)BVBBV013416624 |
| dewey-full | 004.2 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 004 - Computer science |
| dewey-raw | 004.2 |
| dewey-search | 004.2 |
| dewey-sort | 14.2 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik Elektrotechnik |
| format | Book |
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| indexdate | 2024-07-09T18:45:30Z |
| institution | BVB |
| isbn | 0124343708 9780124343702 |
| language | English |
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| spelling | Lala, Parag K. Verfasser aut Self-checking and fault-tolerant digital design Parag K. Lala Self-checking and fault tolerant digital design San Francisco [u.a.] Morgan Kaufmann 2001 XII, 216 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Hier auch spätere, unveränderte Nachdrucke Ordinateur rasuqam Tolérance aux fautes (Informatique) rasuqam Electronic digital computers Design and construction Fault-tolerant computing Logic design Sequential machine theory Digitales System (DE-588)4012300-5 gnd rswk-swf Schaltnetz (DE-588)4052053-5 gnd rswk-swf Selbsttest (DE-588)4054433-3 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Schaltnetz (DE-588)4052053-5 s Fehlertoleranz (DE-588)4123192-2 s DE-604 Digitales System (DE-588)4012300-5 s VLSI (DE-588)4117388-0 s Selbsttest (DE-588)4054433-3 s HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009154963&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Lala, Parag K. Self-checking and fault-tolerant digital design Ordinateur rasuqam Tolérance aux fautes (Informatique) rasuqam Electronic digital computers Design and construction Fault-tolerant computing Logic design Sequential machine theory Digitales System (DE-588)4012300-5 gnd Schaltnetz (DE-588)4052053-5 gnd Selbsttest (DE-588)4054433-3 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| subject_GND | (DE-588)4012300-5 (DE-588)4052053-5 (DE-588)4054433-3 (DE-588)4117388-0 (DE-588)4123192-2 |
| title | Self-checking and fault-tolerant digital design |
| title_alt | Self-checking and fault tolerant digital design |
| title_auth | Self-checking and fault-tolerant digital design |
| title_exact_search | Self-checking and fault-tolerant digital design |
| title_full | Self-checking and fault-tolerant digital design Parag K. Lala |
| title_fullStr | Self-checking and fault-tolerant digital design Parag K. Lala |
| title_full_unstemmed | Self-checking and fault-tolerant digital design Parag K. Lala |
| title_short | Self-checking and fault-tolerant digital design |
| title_sort | self checking and fault tolerant digital design |
| topic | Ordinateur rasuqam Tolérance aux fautes (Informatique) rasuqam Electronic digital computers Design and construction Fault-tolerant computing Logic design Sequential machine theory Digitales System (DE-588)4012300-5 gnd Schaltnetz (DE-588)4052053-5 gnd Selbsttest (DE-588)4054433-3 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| topic_facet | Ordinateur Tolérance aux fautes (Informatique) Electronic digital computers Design and construction Fault-tolerant computing Logic design Sequential machine theory Digitales System Schaltnetz Selbsttest VLSI Fehlertoleranz |
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