Scanning tunneling microscopy and its applications:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English Chinese |
| Veröffentlicht: |
Berlin [u.a.]
Springer
2000
Shanghai Shanghai Scientific and Technical Publ. |
| Ausgabe: | 2., rev. ed. |
| Schriftenreihe: | Springer series in surface sciences
32 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturverz. S. 345 - 364 |
| Beschreibung: | XIV, 368 S. Ill., graph. Darst. |
| ISBN: | 3540657150 7532327876 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013387909 | ||
| 003 | DE-604 | ||
| 005 | 20041111 | ||
| 007 | t | ||
| 008 | 001010s2000 gw ad|| |||| 00||| eng d | ||
| 016 | 7 | |a 956573304 |2 DE-101 | |
| 020 | |a 3540657150 |9 3-540-65715-0 | ||
| 020 | |a 7532327876 |9 7-5323-2787-6 | ||
| 035 | |a (OCoLC)41606265 | ||
| 035 | |a (DE-599)BVBBV013387909 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 1 | |a eng |h chi | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-703 |a DE-19 |a DE-29 |a DE-1043 |a DE-384 |a DE-M347 |a DE-355 |a DE-20 |a DE-526 |a DE-11 | ||
| 050 | 0 | |a QC173.4.S94 | |
| 082 | 0 | |a 502/.8/25 |2 21 | |
| 084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
| 084 | |a UP 1100 |0 (DE-625)146344: |2 rvk | ||
| 100 | 1 | |a Bai, Chunli |e Verfasser |4 aut | |
| 240 | 1 | 0 | |a Saomiao-suidao-xianweishu-ji-qi-yingyong |
| 245 | 1 | 0 | |a Scanning tunneling microscopy and its applications |c Chunli Bai |
| 250 | |a 2., rev. ed. | ||
| 264 | 1 | |a Berlin [u.a.] |b Springer |c 2000 | |
| 264 | 1 | |a Shanghai |b Shanghai Scientific and Technical Publ. | |
| 300 | |a XIV, 368 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in surface sciences |v 32 | |
| 490 | 0 | |a Physics and astronomy online library | |
| 500 | |a Literaturverz. S. 345 - 364 | ||
| 650 | 7 | |a Microscopie tunnel à balayage |2 ram | |
| 650 | 7 | |a Scanning tunneling microscopy |2 gtt | |
| 650 | 4 | |a Scanning tunneling microscopy | |
| 650 | 4 | |a Surface chemistry | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 0 | 7 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 830 | 0 | |a Springer series in surface sciences |v 32 |w (DE-604)BV000600785 |9 32 | |
| 856 | 4 | 2 | |m HEBIS Datenaustausch Darmstadt |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009132665&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009132665 | ||
Datensatz im Suchindex
| _version_ | 1804128169132818433 |
|---|---|
| adam_text | CHUNLI BAI SCANNING TUNNELING MICROSCOPY AND ITS APPLICATIONS SECOND,
REVISED EDITION WITH 208 FIGURES ^ SHANGHAI SPRINGER SCIENTIFIC*
TECHNICAL PUBLISHERS CONTENTS 1. INTRODUCTION 1 1.1 ADVANTAGES OF STM
COMPARED WITH OTHER TECHNIQUES 1 1.2 FROM OPTICAL MICROSCOPY TO SCANNING
TUNNELING MICROSCOPY . 3 1.2.1 ELECTRON MICROSCOPES 3 1.2.2 FIELD ION
MICROSCOPE 5 1.2.3 SCANNING TUNNELING MICROSCOPE 5 1.3 OVERVIEW . 7 2.
THE TUNNELING EFFECT , 11 2.1 HISTORICAL REMARKS 12 2.2
TUNNELING-CURRENT THEORY 17 2.2.1 TUNNELING CURRENT 18 2.2.2 PRACTICAL
TIP AND SURFACE WAVE FUNCTIONS 22 2.3 TIP-SURFACE INTERACTION MODEL 25
2.3.1 TUNNELING CURRENT 25 2.3.2 TUNNEL CONDUCTANCE 29 2.3.3 TUNNELING
ACTIVE ORBITAL AT THE TIP 30 2.3.4 DOUBLE-TIP AND INTERFERENCE EFFECTS
32 3. SPECTROSCOPY, AND SPECTROSCOPIC IMAGING 37 3.1 CONCEPTS OF
TUNNELING SPECTROSCOPIES 38 3.1.1 SOLID-STATE-BARRIER TUNNELING 38 3.1.2
METAL-VACUUM-METAL TUNNELING 40 3.2 EXPERIMENTAL MODES 42 3.2.1
CURRENT-VOLTAGE CHARACTERISTICS 43 3.2.2 CURRENT-SEPARATION AND
SEPARATION-VOLTAGE CHARACTERISTICS 44 3.2.3 CONSTANT-CURRENT TOPOGRAPHY
46 3.2.4 CURRENT-IMAGING TUNNELING SPECTROSCOPY 46 3.3 ENERGY RESOLUTION
47 3.4 EXAMPLES 49 3.4.1 SURFACE STATES 50 3.4.2 ADSORBATE-COVERED
SURFACES 56 3.4.3 SUPERCONDUCTIVITY 57 3.4.4 OUTLOOK 60 IX A) INFLUENCE
OF THE TIP 60 B) INTERPRETATION OF SPECTROSCOPY RESULTS 60 4. STM
INSTRUMENTATION 63 4.1 THE VIBRATION ISOLATION SYSTEM 63 4.2 MECHANICAL
DESIGNS 67 4.2.1 PIEZOELECTRIC CERAMICS 70 4.2.2 THREE-DIMENSIONAL
SCANNERS 71 4.2.3 COARSE SAMPLE POSITIONING 74 4.2.4 STMS FOR OPERATION
IN VARIOUS ENVIRONMENTS 76 4.3 TIP PREPARATION 80 4.3.1 PREPARATION OF
TUNGSTEN TIPS 80 4.3.2 PREPARATION OF PT-IR TIPS 84 4.3.3 OTHER WAYS TO
PREPARE STM TIPS 87 4.3.4 TIP TREATMENT 89 4.4 ELECTRONICS 92 4.5
COMPUTER AUTOMATION 96 4.5.1 HARDWARE 97 4.5.2 SOFTWARE 98 4.5.3 IMAGE
PROCESSING 100 A) HISTOGRAM EQUALIZATION 101 B) CONVOLUTION FILTER 101
C) STATISTICAL DIFFERENCING 102 D) THREE-DIMENSIONAL REPRESENTATION 102
5. OTHER RELATED SCANNING PROBE MICROSCOPES 105 5.1 ATOMIC FORCE
MICROSCOPE 105 5.1.1 THE FORCE SENSOR 107 5.1.2 DEFLECTION DETECTION 112
5.1.3 ILLUSTRATING AFM APPLICATIONS 114 5.2 OTHER SCANNING-FORCE
MICROSCOPIES 121 5.2.1 LATERAL FORCE MICROSCOPE 121 5.2.2 FORCE
MICROSCOPE OPERATING IN THE NONCONTACT MODE . 112 5.2.3 FORCE MICROSCOPE
OPERATING IN THE TAPPING MODE ... 126 5.2.4 MAGNETIC FORCE MICROSCOPE
127 5.2.5 ELECTROSTATIC FORCE MICROSCOPE 130 5.3
BALLISTIC-ELECTRON-EMISSION MICROSCOPY 133 5.3.1 THE PRINCIPLE OF BEEM
133 5.3.2^THE BEEM EXPERIMENT 135 5.3.3 THE APPLICATION OF BEEM 136
5.3.4 BALLISTIC-HOLE SPECTROSCOPY OF INTERFACES 140 5.3.5 INTERFACIAL
MODIFICATION WITH BEEM 144 5.4 SCANNING ION-CONDUCTANCE MICROSCOPE 145
5.5 SCANNING THERMAL MICROSCOPE 147 5.6 SCANNING TUNNELING POTENTIOMETRY
AND SCANNING NOISE MICROSCOPY 149 5.7 PHOTON SCANNING TUNNELING
MICROSCOPY AND SCANNING PLASMON NEAR-FIELD MICROSCOPY 151 5.8 NEAR-FIELD
SCANNING OPTICAL MICROSCOPY AND SPECTROSCOPY . . 153 5.8.1 PRINCIPLES OF
NEAR-FIELD OPTICS 155 5.8.2 OPTICAL PROBES FOR NEAR-FIELD OPTICS 156
5.8.3 NSOM OPERATION 157 5.8.4 NEAR-FIELD SCANNING OPTICAL SPECTROSCOPY
158 5.8.5 NEAR-FIELD OPTICAL CHEMICAL SENSORS 161 5.8.6 SCANNING EXCITON
MICROSCOPY . . 162 5.8.7 SINGLE-MOLECULE DETECTION BY NEAR-FIELD OPTICS
163 6. STM STUDIES OF CLEAN SURFACES 165 6.1 METAL SURFACES 165 6.1.1
GEOMETRIC STRUCTURES 166 6.1.2 ELECTRONIC STRUCTURES 168 6.1.3 SURFACE
DIFFUSION 172 6.2 ELEMENTAL SEMICONDUCTOR SURFACES 173 6.2.1 THE SI(LLL)
SURFACE 173 . A) SI(LLL)-7X7 173 B) SI(LLL)-2XL 175 6.2.2 THE SI(OOL)
SURFACE - 177 A) GEOMETRIC STRUCTURE 178 B) ELECTRONIC STRUCTURE 180 C)
THE 2XN STRUCTURE 182 6.2.3 OTHER SILICON-SURFACE STRUCTURES 183 6.2.4
THE GE SURFACES 184 A) GE(LLL) 184 B) GE(001) 185 6.2.5 THE GESI(LLL)
SURFACE 186 6.3 COMPOUND SEMICONDUCTORS AND LAYERED COMPOUNDS 187 6.3.1
GAAS SURFACES 188 A) GAAS(LLO) 188 B) GAAS(LOO) 190 C)
GAAS(LLL)ANDGAAS(LII) 191 D) GAAS-ALGAAS 192 6.3.2 LAYERED COMPOUNDS 193
6.3.3 CHARGE-DENSITY WAVES IN COMPOUND SEMICONDUCTORS . 195 A) CDW
PHASES OF LT-TAS 2 196 B) CHARGE-DENSITY WAVE DEFECTS 200 6.3.4 HIGH-T C
OXIDES 200 XI 7. SURFACE ADSORBATES AND SURFACE CHEMISTRY 205 7.1
ADSORPTION ON METAL SURF ACES 205 7.1.1 CU(110)-O 206 7.1.2 CU(100)-O
208 7.1.3 DYNAMICS 209 7.1.4 AG(110)-O 211 7.1.5 NI(110)-HANDNI(LLL)-H
213 7.1.6 SULFUR ADSORPTION 215 7.1.7 CU(LLL)-S 216 7.1.8 NI(LLL)-S 219
7.1.9 CU(110)-S 221 7.1.10 NI(110)-S 224 7.1.11 MO(001)-S ANDRE(0001)-S
227 7.1.12 OTHER NON-METAL ADSORBATES ON METALS 228 7.1.13 METALLIC
ADSORBATES 228 7.2 ADSORPTION ON SEMICONDUCTOR SURF ACES 229 7.2.1
AG/SI(LLL) 230 7.2.2 AU/SI(LLL) 231 7.2.3 CU/SI(LLL) 232 7.2.4
GROUP-ILL METALS ON SI(L 11) 233 7.2.5 B/SI(LLL) 234 7.2.6 CL/SI(LLL)
235 7.2.7 BI ON SI(100) AND SI(L 11) SURFACES 235 7.2.8 NA/SI(LLL) 236
7.2.9 NA/GAAS(110)ANDCS/GAAS(110) 238 7.2.10 ALKALI METALS ON
SI(100)-2XL 241 7.3 MOLECULES, AND MOLECULAR ADSORBATES 242 7.3.1
MOLECULAR CRYSTALS 242 7.3.2 CHEMISORBED AROMATIC MOLECULES IN ULTRAHIGH
VACUUM 243 7.3.3 PHYSISORBED MOLECULES IN ULTRAHIGH VACUUM 245 7.3.4
PHYSISORBED LONG-CHAIN MOLECULES 246 7.3.5 CHEMISORPTION OF LONG-CHAIN
MOLECULES 249 7.3.6 FULLERENES 252 A) C 60 ON GAAS(LLO) 252 B) C 60 ON
SI(100) 254 C) C 60 ON SI(LLL) 254 D) C 60 ON MOS 2 (0001) 254 E) C 60
ON CU(LLL) 255 F) C 60 ONAU(LLL)ANDAG(LLL) 255 7.3.7 LANGMUIR-BLODGETT
FILMS 256 7.4 OBSERVATION OF CLUSTERS 257 7.4.1 METAL CLUSTERS 257 7.4.2
SEMICONDUCTOR CLUSTERS 260 7.5 NUCLEATION AND GROWTH 260 XII 7.5.1
EPITAXIAL GROWTH OF METAL FILMS 261 7.5.2 GROWTH OF SIONSI(OOL) 262 7.6
CHEMICAL REACTIONS ON METALS 265 7.6.1 REACTION ON NI( 110) . 265 7.6.2
REACTION ON CU(110) 268 7.6.3 CHEMICAL IDENTITY WITH STM 269 7.7
CHEMICAL REACTION ON SEMICONDUCTORS 271 7.7.1 REACTION OF NH 3 WITH
SI(LLL)-7X7 SURFACES 271 7.7.2 REACTION OF NH 3 WITH B/SI(L 11)- VLXVL
SURFACE ... 273 7.7.3 REACTION OF NH 3 WITH CLEAN SI(001) SURFACE 274
7.7.4 SI(LLL)-7X7 OXIDATION. . 274 7.7.5 SI(100)-2XL OXIDATION 276 7.7.6
REACTION OF H WITH SI(LLL)-7X7 276 7.7.7 REACTION OF SB 4 WITHSI(LOO)
277 8. BIOLOGICAL APPLICATIONS 279 8.1 ADVANTAGES AND PROBLEMS 279
8.1.1 SUBSTRATES 280 8.1.2 FIXATION OF SAMPLES ONTO SUBSTRATES 280 8.1.3
FLEXIBILITY OF BIOLOGICAL SAMPLES 281 8.1.4 IDENTIFICATION AND
INTERPRETATION OF STM IMAGES .... 281 8.2 PREPARATION 282 8.2.1
DISPERSION OF SAMPLES ON SUBSTRATES 282 8.2.2 FIXATION OF SAMPLES 283 A)
SAMPLE COATINGS 283 B) COVALENTLY BINDING SAMPLES WITH STRONGLY
ABSORBENT GROUPS 283 C) BINDING SAMPLES TO THE SUBSTRATE COVALENTLY 284
8.2.3 STM IMAGING IN ACQUEOUS SOLUTIONS 284 8.2.4 HOPPING TECHNIQUE 284
8.2.5 STM DIRECTED BY AN OPTICAL MICROSCOPE 286 8.3 NUCLEIC ACIDS 287
8.3.1 DNA IN AIR AND IN VACUUM 287 8.3.2 DNA STUDIES UNDER WATER WITH AN
ELECTROLYTE 289 8.3.3 DNA-PROTEIN COMPLEX 292 8.3.4 DNA BASES 292 8.3.5
DNA SEQUENCING BY SCANNING-PROBE MICROSCOPES ... 294 8.4 PROTEINS 296
8.4.1 ANIMO ACIDS AND PEPTIDES 296 8.4.2 STRUCTURAL PROTEINS 298 8.4.3
FUNCTIONAL PROTEINS -. 299 8.5 BIOLOGICAL MEMBRANES 301 8.6 IMAGING
CELLS AND OTHER APPLICATIONS 302 8.7 FORCE SPECTRUM ANALYSIS OF
BIOLOGICAL MATERIALS 306 XIII 9. SURFACE MODIFICATION 309 9.1 OVERVIEW
309 9.2 DIRECT INDENTATION WITH THE TUNNELING TIP 310 9.2.1 MODIFICATION
OF METAL SURF ACES 311 9.2.2 MODIFICATION OF SEMICONDUCTOR SURF ACES 317
9.3 NANOLITHOGRAPHY ON RESIST FILMS 321 9.4 NANOFABRICATION IN SOLUTION
AND IN GASEOUS ENVIRONMENTS . . . 324 9.4.1 NANOFABRICATION IN SOLUTION
324 9.4.2 NANOFABRICATION IN GASEOUS ENVIRONMENTS 325 9.5 ATOMIC-SCALE
MANIPULATION 327 9.5.1 MANIPULATION OF ATOMS 327 A) XENON ATOMS 327 B)
IRON ATOM 330 C) SILICON ATOM 331 D) SULFER ATOMS 333 9.5.2 MANIPULATION
OF MOLECULES AND CLUSTERS 333 A) CARBON MONOXIDE 333 B) ANTIMONY
MOLECULES 333 C) DECABORANE AND OTHER ORGANIC MOLECULES 336 D) H 2 O
MOLECULES 336 9.6 QUANTIZATION OF CONDUCTANCE IN NANO-CONTACTS PRODUCED
BY STM 338 9.7 FABRICATION WITH OTHER SCANNING-PROBE MICROSCOPES 339
9.7.1 MACHINING THIN FILMS 339 9.7.2 CHARGE STORAGE 340 9.7.3 MAGNETIC
STRUCTURES AND WRITING INTO AN INTERFACE . . . 343 9.8 THE FUTURE 343
REFERENCES 345 SUBJECT INDEX 367 XIV
|
| any_adam_object | 1 |
| author | Bai, Chunli |
| author_facet | Bai, Chunli |
| author_role | aut |
| author_sort | Bai, Chunli |
| author_variant | c b cb |
| building | Verbundindex |
| bvnumber | BV013387909 |
| callnumber-first | Q - Science |
| callnumber-label | QC173 |
| callnumber-raw | QC173.4.S94 |
| callnumber-search | QC173.4.S94 |
| callnumber-sort | QC 3173.4 S94 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 6320 UP 1100 |
| ctrlnum | (OCoLC)41606265 (DE-599)BVBBV013387909 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 2., rev. ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02063nam a2200529 cb4500</leader><controlfield tag="001">BV013387909</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20041111 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">001010s2000 gw ad|| |||| 00||| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">956573304</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540657150</subfield><subfield code="9">3-540-65715-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">7532327876</subfield><subfield code="9">7-5323-2787-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)41606265</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013387909</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="1" ind2=" "><subfield code="a">eng</subfield><subfield code="h">chi</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-526</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC173.4.S94</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6320</subfield><subfield code="0">(DE-625)145762:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 1100</subfield><subfield code="0">(DE-625)146344:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bai, Chunli</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="240" ind1="1" ind2="0"><subfield code="a">Saomiao-suidao-xianweishu-ji-qi-yingyong</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning tunneling microscopy and its applications</subfield><subfield code="c">Chunli Bai</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2., rev. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2000</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Shanghai</subfield><subfield code="b">Shanghai Scientific and Technical Publ.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV, 368 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer series in surface sciences</subfield><subfield code="v">32</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Physics and astronomy online library</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 345 - 364</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopie tunnel à balayage</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Scanning tunneling microscopy</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning tunneling microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer series in surface sciences</subfield><subfield code="v">32</subfield><subfield code="w">(DE-604)BV000600785</subfield><subfield code="9">32</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HEBIS Datenaustausch Darmstadt</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009132665&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009132665</subfield></datafield></record></collection> |
| id | DE-604.BV013387909 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:44:58Z |
| institution | BVB |
| isbn | 3540657150 7532327876 |
| language | English Chinese |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009132665 |
| oclc_num | 41606265 |
| open_access_boolean | |
| owner | DE-703 DE-19 DE-BY-UBM DE-29 DE-1043 DE-384 DE-M347 DE-355 DE-BY-UBR DE-20 DE-526 DE-11 |
| owner_facet | DE-703 DE-19 DE-BY-UBM DE-29 DE-1043 DE-384 DE-M347 DE-355 DE-BY-UBR DE-20 DE-526 DE-11 |
| physical | XIV, 368 S. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Springer Shanghai Scientific and Technical Publ. |
| record_format | marc |
| series | Springer series in surface sciences |
| series2 | Springer series in surface sciences Physics and astronomy online library |
| spelling | Bai, Chunli Verfasser aut Saomiao-suidao-xianweishu-ji-qi-yingyong Scanning tunneling microscopy and its applications Chunli Bai 2., rev. ed. Berlin [u.a.] Springer 2000 Shanghai Shanghai Scientific and Technical Publ. XIV, 368 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in surface sciences 32 Physics and astronomy online library Literaturverz. S. 345 - 364 Microscopie tunnel à balayage ram Scanning tunneling microscopy gtt Scanning tunneling microscopy Surface chemistry Surfaces (Physics) Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 Springer series in surface sciences 32 (DE-604)BV000600785 32 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009132665&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Bai, Chunli Scanning tunneling microscopy and its applications Springer series in surface sciences Microscopie tunnel à balayage ram Scanning tunneling microscopy gtt Scanning tunneling microscopy Surface chemistry Surfaces (Physics) Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4252995-5 |
| title | Scanning tunneling microscopy and its applications |
| title_alt | Saomiao-suidao-xianweishu-ji-qi-yingyong |
| title_auth | Scanning tunneling microscopy and its applications |
| title_exact_search | Scanning tunneling microscopy and its applications |
| title_full | Scanning tunneling microscopy and its applications Chunli Bai |
| title_fullStr | Scanning tunneling microscopy and its applications Chunli Bai |
| title_full_unstemmed | Scanning tunneling microscopy and its applications Chunli Bai |
| title_short | Scanning tunneling microscopy and its applications |
| title_sort | scanning tunneling microscopy and its applications |
| topic | Microscopie tunnel à balayage ram Scanning tunneling microscopy gtt Scanning tunneling microscopy Surface chemistry Surfaces (Physics) Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | Microscopie tunnel à balayage Scanning tunneling microscopy Surface chemistry Surfaces (Physics) Rastertunnelmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009132665&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000600785 |
| work_keys_str_mv | AT baichunli saomiaosuidaoxianweishujiqiyingyong AT baichunli scanningtunnelingmicroscopyanditsapplications |