Microbeam analysis 2000: proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bristol [u.a.]
Inst. of Physics
2000
|
| Schriftenreihe: | Institute of Physics <London>: Institute of Physics conference series
165 |
| Schlagworte: | |
| Beschreibung: | XXVIII, 498 S. Ill. |
| ISBN: | 0750306858 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013355736 | ||
| 003 | DE-604 | ||
| 005 | 20181030 | ||
| 007 | t | ||
| 008 | 000922s2000 a||| |||| 10||| eng d | ||
| 020 | |a 0750306858 |9 0-7503-0685-8 | ||
| 035 | |a (OCoLC)633803735 | ||
| 035 | |a (DE-599)BVBBV013355736 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 245 | 1 | 0 | |a Microbeam analysis 2000 |b proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 |c ed. by David B. William ... |
| 246 | 1 | 3 | |a IUMAS 2000 |
| 264 | 1 | |a Bristol [u.a.] |b Inst. of Physics |c 2000 | |
| 300 | |a XXVIII, 498 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Institute of Physics <London>: Institute of Physics conference series |v 165 | |
| 650 | 0 | 7 | |a Licht |0 (DE-588)4035596-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Teilchenoptik |0 (DE-588)4184613-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2000 |z Kailua, Kona, Hawaii |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 0 | 1 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 0 | 2 | |a Teilchenoptik |0 (DE-588)4184613-8 |D s |
| 689 | 0 | 3 | |a Licht |0 (DE-588)4035596-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Williams, David B. |e Sonstige |4 oth | |
| 830 | 0 | |a Institute of Physics <London>: Institute of Physics conference series |v 165 |w (DE-604)BV002806317 |9 165 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009109609 | ||
Datensatz im Suchindex
| _version_ | 1804128132888788992 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013355736 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)633803735 (DE-599)BVBBV013355736 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01693nam a2200421 cb4500</leader><controlfield tag="001">BV013355736</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20181030 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000922s2000 a||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0750306858</subfield><subfield code="9">0-7503-0685-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633803735</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013355736</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microbeam analysis 2000</subfield><subfield code="b">proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000</subfield><subfield code="c">ed. by David B. William ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">IUMAS 2000</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bristol [u.a.]</subfield><subfield code="b">Inst. of Physics</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXVIII, 498 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Institute of Physics <London>: Institute of Physics conference series</subfield><subfield code="v">165</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Licht</subfield><subfield code="0">(DE-588)4035596-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Teilchenoptik</subfield><subfield code="0">(DE-588)4184613-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2000</subfield><subfield code="z">Kailua, Kona, Hawaii</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Teilchenoptik</subfield><subfield code="0">(DE-588)4184613-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Licht</subfield><subfield code="0">(DE-588)4035596-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Williams, David B.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Institute of Physics <London>: Institute of Physics conference series</subfield><subfield code="v">165</subfield><subfield code="w">(DE-604)BV002806317</subfield><subfield code="9">165</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009109609</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2000 Kailua, Kona, Hawaii gnd-content |
| genre_facet | Konferenzschrift 2000 Kailua, Kona, Hawaii |
| id | DE-604.BV013355736 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:44:23Z |
| institution | BVB |
| isbn | 0750306858 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009109609 |
| oclc_num | 633803735 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | XXVIII, 498 S. Ill. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Inst. of Physics |
| record_format | marc |
| series | Institute of Physics <London>: Institute of Physics conference series |
| series2 | Institute of Physics <London>: Institute of Physics conference series |
| spelling | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 ed. by David B. William ... IUMAS 2000 Bristol [u.a.] Inst. of Physics 2000 XXVIII, 498 S. Ill. txt rdacontent n rdamedia nc rdacarrier Institute of Physics <London>: Institute of Physics conference series 165 Licht (DE-588)4035596-2 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Teilchenoptik (DE-588)4184613-8 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2000 Kailua, Kona, Hawaii gnd-content Mikroskopie (DE-588)4039238-7 s Mikroanalyse (DE-588)4169804-6 s Teilchenoptik (DE-588)4184613-8 s Licht (DE-588)4035596-2 s DE-604 Williams, David B. Sonstige oth Institute of Physics <London>: Institute of Physics conference series 165 (DE-604)BV002806317 165 |
| spellingShingle | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 Institute of Physics <London>: Institute of Physics conference series Licht (DE-588)4035596-2 gnd Mikroanalyse (DE-588)4169804-6 gnd Teilchenoptik (DE-588)4184613-8 gnd Mikroskopie (DE-588)4039238-7 gnd |
| subject_GND | (DE-588)4035596-2 (DE-588)4169804-6 (DE-588)4184613-8 (DE-588)4039238-7 (DE-588)1071861417 |
| title | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 |
| title_alt | IUMAS 2000 |
| title_auth | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 |
| title_exact_search | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 |
| title_full | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 ed. by David B. William ... |
| title_fullStr | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 ed. by David B. William ... |
| title_full_unstemmed | Microbeam analysis 2000 proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 ed. by David B. William ... |
| title_short | Microbeam analysis 2000 |
| title_sort | microbeam analysis 2000 proceedings of the second conference of the international union of microbeam analysis society held in kailua kona hawaii 9 14 july 2000 |
| title_sub | proceedings of the second Conference of the International Union of Microbeam Analysis Society held in Kailua-Kona, Hawaii, 9 - 14 July 2000 |
| topic | Licht (DE-588)4035596-2 gnd Mikroanalyse (DE-588)4169804-6 gnd Teilchenoptik (DE-588)4184613-8 gnd Mikroskopie (DE-588)4039238-7 gnd |
| topic_facet | Licht Mikroanalyse Teilchenoptik Mikroskopie Konferenzschrift 2000 Kailua, Kona, Hawaii |
| volume_link | (DE-604)BV002806317 |
| work_keys_str_mv | AT williamsdavidb microbeamanalysis2000proceedingsofthesecondconferenceoftheinternationalunionofmicrobeamanalysissocietyheldinkailuakonahawaii914july2000 AT williamsdavidb iumas2000 |