Optoelectronic metrology: 28 - 30 September 1998, Ĺańcut, Poland
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
SPIE
1998
|
Schriftenreihe: | Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE
4018 |
Schlagworte: | |
Beschreibung: | XIV, 152 S. Ill., graph. Darst. |
ISBN: | 0819436445 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV013340904 | ||
003 | DE-604 | ||
005 | 20001106 | ||
007 | t | ||
008 | 000912s1998 ad|| |||| 10||| eng d | ||
020 | |a 0819436445 |9 0-8194-3644-5 | ||
035 | |a (OCoLC)43303569 | ||
035 | |a (DE-599)BVBBV013340904 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-355 | ||
050 | 0 | |a TA1750 | |
082 | 0 | |a 681/.25 |2 21 | |
084 | |a UH 5725 |0 (DE-625)145699: |2 rvk | ||
245 | 1 | 0 | |a Optoelectronic metrology |b 28 - 30 September 1998, Ĺańcut, Poland |c Jan Oswik ... ed. |
264 | 1 | |a Bellingham, Wash. |b SPIE |c 1998 | |
300 | |a XIV, 152 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE |v 4018 | |
650 | 4 | |a Laser beams |x Measurement |v Congresses | |
650 | 4 | |a Optical measurements |v Congresses | |
650 | 4 | |a Optoelectronics |v Congresses | |
650 | 0 | 7 | |a Metrologie |0 (DE-588)4169749-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Optoelektronik |0 (DE-588)4043687-1 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1998 |z /Lańcut |2 gnd-content | |
689 | 0 | 0 | |a Optoelektronik |0 (DE-588)4043687-1 |D s |
689 | 0 | 1 | |a Metrologie |0 (DE-588)4169749-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Owsik, Jan |e Sonstige |4 oth | |
830 | 0 | |a Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE |v 4018 |w (DE-604)BV000010887 |9 4018 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-009097144 |
Datensatz im Suchindex
_version_ | 1804128114412879872 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV013340904 |
callnumber-first | T - Technology |
callnumber-label | TA1750 |
callnumber-raw | TA1750 |
callnumber-search | TA1750 |
callnumber-sort | TA 41750 |
callnumber-subject | TA - General and Civil Engineering |
classification_rvk | UH 5725 |
ctrlnum | (OCoLC)43303569 (DE-599)BVBBV013340904 |
dewey-full | 681/.25 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 681 - Precision instruments and other devices |
dewey-raw | 681/.25 |
dewey-search | 681/.25 |
dewey-sort | 3681 225 |
dewey-tens | 680 - Manufacture of products for specific uses |
discipline | Physik Handwerk und Gewerbe / Verschiedene Technologien |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01532nam a2200421 cb4500</leader><controlfield tag="001">BV013340904</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20001106 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000912s1998 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819436445</subfield><subfield code="9">0-8194-3644-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)43303569</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013340904</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA1750</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681/.25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5725</subfield><subfield code="0">(DE-625)145699:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optoelectronic metrology</subfield><subfield code="b">28 - 30 September 1998, Ĺańcut, Poland</subfield><subfield code="c">Jan Oswik ... ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV, 152 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">4018</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser beams</subfield><subfield code="x">Measurement</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical measurements</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optoelectronics</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optoelektronik</subfield><subfield code="0">(DE-588)4043687-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1998</subfield><subfield code="z">/Lańcut</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optoelektronik</subfield><subfield code="0">(DE-588)4043687-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Metrologie</subfield><subfield code="0">(DE-588)4169749-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Owsik, Jan</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">4018</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">4018</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009097144</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1998 /Lańcut gnd-content |
genre_facet | Konferenzschrift 1998 /Lańcut |
id | DE-604.BV013340904 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:44:06Z |
institution | BVB |
isbn | 0819436445 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009097144 |
oclc_num | 43303569 |
open_access_boolean | |
owner | DE-355 DE-BY-UBR |
owner_facet | DE-355 DE-BY-UBR |
physical | XIV, 152 S. Ill., graph. Darst. |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | SPIE |
record_format | marc |
series | Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE |
series2 | Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE |
spelling | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland Jan Oswik ... ed. Bellingham, Wash. SPIE 1998 XIV, 152 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE 4018 Laser beams Measurement Congresses Optical measurements Congresses Optoelectronics Congresses Metrologie (DE-588)4169749-2 gnd rswk-swf Optoelektronik (DE-588)4043687-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 /Lańcut gnd-content Optoelektronik (DE-588)4043687-1 s Metrologie (DE-588)4169749-2 s DE-604 Owsik, Jan Sonstige oth Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE 4018 (DE-604)BV000010887 4018 |
spellingShingle | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland Society of Photon Optical Instrumentation Engineers: Proceedings of SPIE Laser beams Measurement Congresses Optical measurements Congresses Optoelectronics Congresses Metrologie (DE-588)4169749-2 gnd Optoelektronik (DE-588)4043687-1 gnd |
subject_GND | (DE-588)4169749-2 (DE-588)4043687-1 (DE-588)1071861417 |
title | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland |
title_auth | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland |
title_exact_search | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland |
title_full | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland Jan Oswik ... ed. |
title_fullStr | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland Jan Oswik ... ed. |
title_full_unstemmed | Optoelectronic metrology 28 - 30 September 1998, Ĺańcut, Poland Jan Oswik ... ed. |
title_short | Optoelectronic metrology |
title_sort | optoelectronic metrology 28 30 september 1998 lancut poland |
title_sub | 28 - 30 September 1998, Ĺańcut, Poland |
topic | Laser beams Measurement Congresses Optical measurements Congresses Optoelectronics Congresses Metrologie (DE-588)4169749-2 gnd Optoelektronik (DE-588)4043687-1 gnd |
topic_facet | Laser beams Measurement Congresses Optical measurements Congresses Optoelectronics Congresses Metrologie Optoelektronik Konferenzschrift 1998 /Lańcut |
volume_link | (DE-604)BV000010887 |
work_keys_str_mv | AT owsikjan optoelectronicmetrology2830september1998lancutpoland |