Structure and imperfections in amorphous and crystalline silicon dioxide:
Gespeichert in:
| Format: | Buch |
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| Sprache: | English |
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Chichester [u.a.]
Wiley
2000
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| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXII, 505 S. graph. Darst. |
| ISBN: | 0471975362 |
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| 245 | 1 | 0 | |a Structure and imperfections in amorphous and crystalline silicon dioxide |c ed. by R. A. B. Devine ... |
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| adam_text | STRUCTURE AND IMPERFECTIONS IN AMORPHOUS AND CRYSTALLINE SILICON DIOXIDE
EDITED BY R. A. B. DEVINE UNIVERSITY OF NEW MEXICO, ALBUQUERQUE, USA
J.-P. DURAUD CENTRE D ETUDES NUCLEAIRES DE GRENOBLE, FRANCE AND E.
DOORYHEE CNRS CAEN AND ESRF GRENOBLE, FRANCE JOHN WILEY & SONS, LTD
CHICHESTER * NEW YORK * WEINHEIM * BRISBANE * SINGAPORE * TORONTO
CONTENTS CONTRIBUTORS XVII PREFACE XXI PART I TOPOLOGICAL MODELS FOR THE
CRYSTALLINE AND AMORPHOUS PHASES (A) DESCRIPTION OF THE ATOMIC
ARRANGEMENT IN SI02 POLYMORPHS 1 THE TOPOLOGY OF SILICA NETWORKS 3 L. W.
HOBBS, C. E. JESURUM AND B. BERGER 1 INTRODUCTION 3 2 GRAPH PROPERTIES
OF NETWORKS 6 2.1 PRIMARY AND SECONDARY GRAPH PROPERTIES 6 2.2
TESSELLATIONS 7 2.3 RINGS 9 2.4 LOCAL CLUSTERS 14 3 NETWORK CONSTRAINT
AND STRUCTURAL FREEDOM 16 3.1 STRUCTURAL STABILITY AND RIGIDITY
CONSTRAINTS 16 3.2 STRUCTURAL FREEDOM AND AMORPHIZABILITY 17 4
LOCAL-RULES BASIS FOR STRUCTURAL ASSEMBLY 20 4.1 ASSEMBLING CRYSTALLINE
POLYMORPHS 21 4.1.1 QUARTZ 22 4.1.2 CRISTOBALITE AND TRIDYMITE 25 4.1.3
MOGANITE 27 4.1.4 KEATITE 28 4.1.5 COESITE 29 4.2 GENERATING AMORPHOUS
NETWORKS 29 4.2.1 LOCAL RULES SELF-ASSEMBLY 31 VI CONTENTS 4.2.2
REASSEMBLY OF DISORDERED COLLISION CASCADES 33 4.2.3 REFINEMENT OF
TOPOLOGICAL MODELS 36 4.3 LOCAL CLUSTER ANALYSIS 37 4.3.1 CRYSTALLINE
POLYMORPHS 37 4.3.2 TOPOLOGICALLY DISORDERED SILICAS 39 5 TOPOLOGY OF
SILICA SURFACES 42 6 CONCLUSIONS 43 7 ACKNOWLEDGEMENTS 44 8 REFERENCES
44 2 LOW-PRESSURE CRYSTALLINE PHASES OF SI0 2 49 G. DOLINO 1
INTRODUCTION 49 2 QUARTZ 50 2.1 CRYSTALLINE PROPERTIES AT ROOM
TEMPERATURE 50 2.1.1 OCCURRENCE 50 2.1.2 ATOMIC STRUCTURE 50 2.1.3
CHEMICAL COMPOSITION 51 2.1.4 ELECTROMECHANICAL PROPERTIES 51 2.1.5
OPTICAL PROPERTIES 51 2.1.6 DISLOCATIONS 52 2.1.7 TWINS 52 2.2 A-SS
TRANSITION AND HIGH-TEMPERATURE PROPERTIES 52 2.2.1 ORDER PARAMETER 52
2.2.2 TEMPERATURE VARIATION OF PHYSICAL PROPERTIES IN RJ 2 54 2.2.3
THERMAL PROPERTIES 55 2.2.4 INCOMMENSURATE PHASE 55 2.3 SOFT MODE AND
LATTICE VIBRATIONS OF QUARTZ 56 3 OTHER LOW-PRESSURE POLYMORPHS 58 3.1
CRISTOBALITE 58 3.1.1 STRUCTURE AND PROPERTIES OF THE A PHASE 59 3.1.2
A-SS TRANSITION AND HIGH-TEMPERATURE PROPERTIES 59 3.1.3 DISORDER IN THE
SS PHASE 60 3.2 TRIDYMITE 61 3.2.1 PHASE RELATIONS 61 3.2.2 TEMPERATURE
VARIATION IN PHYSICAL PROPERTIES 64 4 CONCLUSION 65 5 REFERENCES 65
CONTENTS VLL 3 THEORETICAL INVESTIGATIONS OF THE STRUCTURE OF AMORPHOUS
S1O2 AT ELEVATED PRESSURE 69 L. STIXRUDE 1 INTRODUCTION 69 2 THEORETICAL
METHODS 72 2.1 STATISTICAL MECHANICAL SIMULATIONS 72 2.2 ELECTRONIC
STRUCTURE METHODS 74 2.3 SEMI-EMPIRICAL POTENTIALS 75 3 STRUCTURE AND
COMPRESSION MECHANISMS OF TECTOSILICATES .... 83 4 COMPRESSION OF SI0 2
GLASS 87 4.1 OVERVIEW 87 4.2 ELASTIC REGIME 88 4.3 ANELASTIC REGIME 92
4.4 PERMANENT DENSIFICATION 94 4.5 COORDINATION CHANGES 96 5 CONCLUSIONS
AND FUTURE DIRECTIONS 100 6 ACKNOWLEDGMENT 101 7 REFERENCES 101 (B)
EXPERIMENTAL ANALYSIS OF SIC 2 ATOMIC NETWORKS 4 NUCLEAR MAGNETIC
RESONANCE AS A STRUCTURAL PROBE OF SIC 2 107 R. DUPREE 1 INTRODUCTION
107 2 29 SI CHEMICAL SHIFTS IN SI0 2 POLYMORPHS 108 2.1 SHIFT STRUCTURE
CORRELATIONS FOR TETRAHEDRALLY COORDINATED POLYMORPHS 109 2.2 SOME
EXAMPLES OF THE USE OF 29 SI NMR FOR GIVING STRUCTURAL INFORMATION ABOUT
CRYSTALLINE SIC 2 PHASES. . ILL 2.2.1 TRIDYMITE ORTHORHOMBIC PHASE ILL
2.2.2 OXYGEN POSITIONS IN HIGH-TEMPERATURE SI02 PHASES 113 3 29 SI AS A
PROBE OF AMORPHOUS SI0 2 STRUCTURE 114 4 17 0 NMR IN SI0 2 115 4.1
QUADRUPOLAR EFFECTS 115 4.2 17 0 NMR IN CRYSTALLINE SYSTEMS 116 4.2.1
QUARTZ 116 4.2.2 CRISTOBALITE 117 4.2.3 COESITE 118 4.2.4 STISHOVITE 118
4.3 17 0 NMR IN GLASSY SI0 2 118 5 ACKNOWLEDGEMENT 119 6 REFERENCES 119
VIII CONTENTS 5 NEUTRON AND X-RAY SCATTERING STUDIES OF VITREOUS SILICA
121 A. C. WRIGHT AND R. N. SINCLAIR 1 INTRODUCTION 121 1.1 TRADITIONAL
THEORIES OF GLASS STRUCTURE 122 1.2 RANGES OF ORDER 123 2 NEUTRON AND
X-RAY SCATTERING TECHNIQUES 124 3 MODERN DIFFRACTION DATA 125 3.1 X-RAY
DIFFRACTION 125 3.2 NEUTRON DIFFRACTION 126 4 METHODS OF INTERPRETATION
127 4.1 GENERAL DATA CHARACTERISTICS 127 4.2 ACCURACY AND COMPARISON
WITH MODELS 129 5 THE SI0 4 TETRAHEDRAL STRUCTURAL UNIT (RANGE I) 129 6
THE SI-O-SI AND BOND TORSION ANGLES (RANGE II) 132 7 NETWORK TOPOLOGY
AND STRUCTURAL THEORIES/MODELS (RANGE III) 134 7.1 CRYSTAL-BASED MODELS
135 7.2 RANDOM NETWORK MODELS 137 7.3 COMPUTER SIMULATION 139 7.4 FIRST
DIFFRACTION PEAK 141 8 LONG-RANGE DENSITY FLUCTUATIONS (RANGE IV) 142 9
FAST NEUTRON IRRADIATED VITREOUS SILICA 143 10 INELASTIC NEUTRON
SCATTERING STUDIES 144 11 CONCLUSIONS 147 12 REFERENCES 148 PART II
ELECTRONIC STRUCTURE OF THE SI-0 2 BOND AND THE EXTENDED NETWORK (A)
CALCULATIONS AND MODELLING OF THE ELECTRONIC STRUCTURE 6 MOLECULES AS A
BASIS FOR MODELING THE FORCE FIELD OF SILICA 153 G. V. GIBBS, F. C.
HILL, M. B. BOISEN, JR, AND R. T. DOWNS 1 INTRODUCTION 153 2 CONNECTION
BETWEEN THE FORCE FIELD OF SILICA AND SMALL MOLECULES 153 2.1 STRUCTURAL
EVIDENCE 153 2.2 EVIDENCE PROVIDED BY ELECTRON DENSITY DISTRIBUTIONS . .
155 2.3 EVIDENCE PROVIDED BY MOLECULAR MODELING OF THE STRUCTURE OF
SILICA 157 3 GENERATION OF SILICA STRUCTURE TYPES USING A
MOLECULAR-BASED POTENTIAL 158 CONTENTS IX 4 DISCUSSION 162 5 REFERENCES
163 7 FIRST PRINCIPLES CALCULATION OF THE ELECTRONIC STRUCTURES OF
CRYSTALLINE AND AMORPHOUS FORMS OF SI0 2 167 W. Y. CHING 1 INTRODUCTION
167 2 METHOD AND APPROACH 168 3 RESULTS ON CRYSTALLINE PHASES 170 4
RESULTS ON AMORPHOUS PHASES 173 5 CONCLUSIONS 177 6 ACKNOWLEDGEMENTS 178
7 REFERENCES 178 8 THE ELECTRONIC STRUCTURE OF SILICA USING AB INITIO
PSEUDOPOTENTIALS 181 /. R. CHELIKOWSKY AND N. BINGGELI 1 INTRODUCTION
181 2 PSEUDOPOTENTIALS 183 3 CRYSTALLINE FORMS OF SILICA 187 4
STRUCTURAL ENERGIES OF CRYSTALLINE SILICA 188 5 ELECTRONIC STRUCTURE OF
A-QUARTZ 189 6 ELECTRONIC STRUCTURE OF A-QUARTZ AT HIGH PRESSURE 192 7
CONCLUSIONS 196 8 ACKNOWLEDGEMENTS 196 9 REFERENCES 196 (B) EXPERIMENTAL
ANALYSIS OF THE ELECTRONIC STRUCTURE 9 X-RAY ABSORPTION NEAR EDGE
STRUCTURES OF SI0 2 201 F. JOLLET 1 INTRODUCTION 201 2 PRINCIPLE OF
XANES 202 2.1 PRESENTATION OF XANES 202 2.2 DEPENDENCE ON THE ELECTRONIC
STRUCTURE 204 2.3 INTERPRETATION 205 3 THE SI K, SI L 2J3 AND * * XANES
SIGNATURES AND THEIR RELATION TO THE ELECTRONIC STRUCTURE IN SI0 2 207
3.1 CRYSTALLINE SI0 2 207 3.1.1 A-QUARTZ 207 3.1.2 POLARIZATION EFFECTS
IN A-QUARTZ 212 3.1.3 OTHER CRYSTALLINE PHASES 213 X CONTENTS 3.2
AMORPHOUS SI0 2 215 3.3 OTHER SILICON OXIDES 218 4 KNOWLEDGE OF EMPTY
STATES: EXAMPLES 218 4.1 SI0 2 UNDER PRESSURE 218 4.2 RADIATION DAMAGE
PRODUCED BY HIGH ENERGY IONS ... 221 5 CONCLUSION 222 6 ACKNOWLEDGEMENTS
223 7 REFERENCES 223 10 ELECTRON ENERGY LOSS STRUCTURES OF SI02 227 M.
GAUTIER-SOYER 1 INTRODUCTION 227 2 PHYSICAL BASIS OF REELS 228 2.1
DIELECTRIC APPROACH TO REELS 228 2.2 DERIVING THE ELECTRON ENERGY LOSS
FUNCTION FROM THE REELS SPECTRA 229 2.2.1 REMOVING MULTIPLE LOSSES 230
2.2.2 VALIDITY OF THE DIPOLE APPROXIMATION (K ~ 0) . . 231 2.2.3
INFLUENCE OF SURFACE EFFECTS 232 2.2.4 OBTAINING THE COMPLEX DIELECTRIC
FUNCTION FROM THE SINGLE SCATTERING INELASTIC CROSS-SECTION: THE MODEL
OF YUBERO AND TOUGAARD 232 2.3 INTERPRETATION OF THE ELF IN TERMS OF
ELECTRONIC STRUCTURE*COMPARISON WITH OPTICAL DATA 233 3 APPLICATION TO
SI02: OPTICAL PROPERTIES DERIVED FROM OPTICAL MEASUREMENTS, TEELS, REELS
AND ELECTRONIC STRUCTURE CALCULATION 234 4 THE REELS SPECTRUM OF SI0 2
236 4.1 BAND GAP 238 4.2 ORIGIN OF THE STRUCTURES ABOVE THE BAND GAP IN
THE REELS SPECTRUM OF SI0 2 239 4.3 ORIGIN OF THE 5.1 AND 7.2 EV
STRUCTURES OBSERVED IN THE BAND GAP REGION 241 4.3.1 COMPARISON WITH
PREVIOUS OPTICAL ABSORPTION MEASUREMENTS 243 4.3.2 COMPARISON WITH
CALCULATED ELECTRONIC TRANSITIONS 244 4.3.3 ORIGIN OF THE 5.1 AND 7.2
STRUCTURES OBSERVED IN THE REELS SPECTRUM 245 5 CONCLUSION 247 6
ACKNOWLEDGMENTS 247 7 REFERENCES 247 CONTENTS XI PART III MACROSCOPIC
AND POINT DEFECTS 11 THEORY OF ELECTRONIC AND STRUCTURAL PROPERTIES OF
POINT DEFECTS IN SIO Z 253 A. H. EDWARDS, W. B. FOWLER AND J. ROBERTSON
1 INTRODUCTION 253 2 THEORY 254 2.1 GENERAL METHODOLOGICAL REQUIREMENTS
254 2.1.1 EQUILIBRIUM GEOMETRIES AND POTENTIAL ENERGY SURFACES 254 2.1.2
OPTICAL PROPERTIES 254 2.1.3 HYPERFME PARAMETERS 255 2.1.4 ELECTRICAL
LEVEL POSITIONS 256 2.2. SPECIFIC METHODS 256 2.2.1 TERMINATION ISSUES
256 2.2.2 AB INITIO METHODS 257 3 INTRINSIC DEFECTS 258 3.1 E CENTERS
258 3.1.1 CENTERS IN A-QUARTZ 259 3.1.2 E CENTERS IN SILICA GLASS
261 3.1.3 SIMILARITIES AND DIFFERENCES 262 3.2 SUPEROXIDE RADICAL AND
THE NON-BRIDGING OXYGEN IN A-SI0 2 263 3.2.1 THEORETICAL HYPERFME
RESULTS 263 3.2.2 TRANSFORMATION MECHANISMS 265 3.3 METASTABLE STRUCTURE
OF TRANSIENT DEFECTS 266 3.3.1 SELF-TRAPPED HOLE 266 3.3.2 SELF-TRAPPED
EXCITON (STE) 268 3.4 OTHER OXYGEN DEFICIENCY CENTERS 268 3.4.1 TWOFOLD
SILICON 269 3.4.2 OXYGEN DIVACANCY 269 3.4.3 VALENCE-ALTERNATION PAIRS
269 4 EXTRINSIC DEFECTS 270 4.1 PHOSPHORUS DEFECT 270 4.2 GERMANIUM
DEFECT 270 4.3 ALUMINUM DEFECT 271 4.4 NITROGEN DEFECT 271 5 CURRENT
PROBLEMS 272 5.1 E CENTER IN SILICA 272 5.1.1 LELIS EXPERIMENTS AND THE
E CENTER AS A SWITCHING TRAP 272 5.1.2 INTERACTION OF HYDROGEN WITH
DEFECTS IN A-SI0 2 . 279 CONTENTS 5.2 OPTICAL PROPERTIES OF SILICA GLASS
284 5.2.1 2 AND 4.8 EV ABSORPTION AND 1.9 EV LUMINESCENCE 285 5.2.2 5.85
EV ABSORPTION 285 5.2.3 3.8 AND 8 EV ABSORPTION 285 5.2.4 5 AND 7.6 EV
ABSORPTION AND 4.4 AND 2.7 EV EMISSION 285 6 ACKNOWLEDGEMENTS 287 7
REFERENCES 287 RADIATION-INDUCED DEFECTS AND ELECTRONIC MODIFICATION 293
P. PAILLET, J. L. LERAY AND H. J. VON BARDELEBEN 1 INTRODUCTION 293 2
CHARACTERIZATION OF RADIATION-INDUCED DEFECTS BY ELECTRICAL AND OPTICAL
TECHNIQUES 294 2.1 ORIGIN OF HOLE AND ELECTRON TRAPS IN OXIDE LAYERS . .
. 294 2.2 ELECTRICAL CHARACTERIZATION OF DEFECTS 297 2.2.1
POST-IRRADIATION EVOLUTION OF THE NET TRAPPED CHARGE 297 2.2.2 THERMALLY
STIMULATED CURRENT 299 2.2.3 THERMALLY STIMULATED LUMINESCENCE 301 3 EPR
CHARACTERIZATION OF RADIATION-INDUCED POINT DEFECTS IN CRYSTALLINE AND
AMORPHOUS SI02 305 3.1 DEFECTS IN CRYSTALLINE A-SI0 2 307 3.1.1
INTRINSIC DEFECTS 307 3.1.2 IMPURITY RELATED DEFECTS 310 3.2 DEFECTS IN
BULK SILICA 310 3.2.1 INTRINSIC DEFECTS 311 3.3 DEFECTS IN THERMAL
SILICA 318 3.4 DEFECTS AT SI/SI02 INTERFACES: **, PW AN D ** CENTRES .
321 4 CONCLUSIONS 324 5 ACKNOWLEDGEMENTS 325 6 REFERENCES 325 TRANSIENT
DEFECTS AND ELECTRONIC EXCITATION 329 N. ITOH, A. M. STONE HAM AND K.
TANIMURA 1 INTRODUCTION 329 2 ELECTRONS, HOLES AND EXCITONS IN FUSED
SILICA AND A-QUARTZ . 331 2.1 MOBILITY OF ELECTRONS 331 2.2 MOBILITIES
OF HOLES 332 2.3 DYNAMICS OF EXCITONS AND EXCITON FORMATION 332 CONTENTS
XIII 3 SELF-TRAPPING OF EXCITONS AND HOLES IN FUSED SILICA AND A-QUARTZ
334 3.1 THEORY OF THE SELF-TRAPPED EXCITON 335 3.2 IS THE HOLE
SELF-TRAPPED? 336 4 TRANSIENT ATOMIC DEFECTS 337 5 TRANSIENT DEFECTS AT
SURFACES AND INTERFACES 341 5.1 ** CENTRES AT A MOVING SILICON/OXIDE
INTERFACE 342 5.2 DEFECTS ASSOCIATED WITH TELEGRAPH NOISE 342 6
TRANSIENT DEFECTS IN SILICA-BASED GLASSES 343 6.1 CHARGE TRANSFER:
COLOURS OF SILICAS 343 6.2 GRATINGS PRODUCED IN GE-DOPED OPTICAL FIBRES
343 7 REFERENCES 344 14 RADIATION-INDUCED DEFECTS AND STRUCTURAL
MODIFICATIONS 349 E. DOORYHEE, J.-P. DURAUD AND R. A. B. DEVINE 1 BASIC
IRRADIATION PROCESSES AND FORMATION YIELDS OF POINT DEFECTS 349 1.1
INTRODUCTION 349 1.2 BASIC IRRADIATION CONCEPTS 352 1.2.1 MACROSCOPIC
DESCRIPTION OF THE BEAM-SOLID INTERACTION 352 1.2.2 ELASTIC NUCLEAR
SCATTERING 355 1.2.3 INELASTIC SCATTERING 360 1.2.4 EXPERIMENTAL
OBSERVATIONS OF THE DAMAGE .... 361 1.3 DEFECT CREATION BY ELASTIC
COLLISIONS 363 1.3.1 PRIMARY KNOCK-ONS AND COLLISIONAL CASCADES . . 363
1.3.2 IRRADIATION OF SI02 BY FAST NEUTRONS ( 100KEV) 366 1.3.3 ION
IMPLANTATION IN SIUE2 367 1.4 DEFECT CREATION BY INELASTIC PROCESSES 371
1.4.1 HIGH-ENERGY ION IRRADIATION OF SI02 372 1.4.2 ELECTRON IRRADIATION
OF SI02 373 1.5 PHOTON IRRADIATION OF SI0 2 375 1.5.1 HIGH-ENERGY
PHOTOLYSIS 375 1.5.2 SUB-BAND GAP PHOTOLYSIS 379 1.6 POST-IRRADIATION
ANNEALING OF POINT DEFECTS 379 2 EFFECT OF DENSE ELECTRONIC EXCITATIONS
382 2.1 INTRODUCTION 382 2.2 TRACK FORMATION IN SI02 383 2.2.1
MICROSCOPIC AND MACROSCOPIC STUDIES OF TRACKS IN SI0 2 384 2.2.2
MECHANISMS FOR LATENT TRACK FORMATION 388 XIV CONTENTS 2.3 DEFECT
GENERATION IN SI0 2 BY LASER IRRADIATION 390 2.3.1 REMARKS ON ENERGY
ABSORPTION AND RELAXATION BY SI0 2 390 2.3.2 DEFECT FORMATION UNDER
SUBPICOSECOND UV LASER PULSES 391 3 RADIATION-INDUCED STRUCTURAL
MODIFICATION 393 3.1 STRUCTURAL MODIFICATION OF A-QUARTZ 393 3.1.1
AMORPHIZATION UNDER IRRADIATION 393 3.1.2 STRUCTURAL ANALYSIS OF
PARTICLE-AMORPHIZED A-QUARTZ 396 3.1.3 STRUCTURAL EVOLUTION 398 3.1.4
POINT DEFECT MODEL FOR THE METAMICTIZATION OF QUARTZ 400 3.1.5
CONCLUSION 403 3.2 STRUCTURAL MODIFICATIONS OF AMORPHOUS SI0 2 403 3.2.1
THE STRUCTURAL NATURE OF AMORPHOUS SI0 2 .... 403 3.2.2 INFRARED
SPECTROSCOPY AND THE SI-O-SI BRIDGING BOND ANGLE 405 3.2.3
INTERPRETATION OF RADIATION-INDUCED CHANGES . . 407 3.2.4 DOSE
DEPENDENCE OF RADIATION-INDUCED MODIFICATIONS 410 3.2.5 NATURE OF THE
RADIATION-INDUCED DENSIFICATION . 412 3.2.6 DENSIFICATION MAXIMIZATION
AND RADIATION-INDUCED VISCOUS FLOW 415 4 REFERENCES 416 PART IV
PROCESSING AND APPLICATIONS OF CRYSTALLINE AND AMORPHOUS PHASES 15
QUARTZ OSCILLATORS 425 J. R. VIG 1 INTRODUCTION 425 2 APPLICATIONS 426 3
OSCILLATOR BASICS 426 3.1 QUARTZ RESONATORS 427 3.2 EQUIVALENT CIRCUIT
OF CRYSTAL UNIT 430 4 OSCILLATOR CIRCUITS 431 5 FACTORS AFFECTING
FREQUENCY STABILITY 431 5.1 TEMPERATURE 432 5.2 AGING AND DRIFT 434 5.3
SHORT-TERM STABILITY 435 5.4 THERMAL HYSTERESIS AND RETRACE 436 CONTENTS
XV 5.5 DRIVE LEVEL 436 5.6 ACCELERATION, VIBRATION, AND SHOCK 436 5.7
MAGNETIC FIELD EFFECTS 437 5.8 RADIATION EFFECTS 437 5.9 OTHER EFFECTS
ON STABILITY 439 5.10 INTERACTIONS AMONG THE INFLUENCES ON STABILITY 440
6 FILTERS 441 7 SENSORS 441 8 OSCILLATOR COMPARISON : 442 9 FUTURE OF
QUARTZ OSCILLATOR TECHNOLOGY 444 10 REFERENCES 444 SCIENCE AND
TECHNOLOGY OF SILICA LIGHTGUIDES FOR TELECOMMUNICATIONS 449 C. R.
KURKJIAN AND D. M. KROL 1 INTRODUCTION 449 2 HISTORY 451 3 FIRST
LOW-LOSS LIGHTGUIDE FIBER, 1970 453 4 COMPOSITION 454 5 OPTICAL
BEHAVIOUR 457 5.1 OPTICAL LOSS 457 6 LIGHTGUIDE DESIGN 461 7 SOLITONS
462 8 PROCESSING 463 8.1 VAPOUR DEPOSITION PROCESSES 463 8.2 MCVD 463 9
FIBER DRAWING 464 10 DEFECTS 465 11 MECHANICAL PROPERTIES 465 12 NEW
DEVICES 466 12.1 ERBIUM-DOPED FIBER AMPLIFIERS 466 12.2 FIBER BRAGG
GRATINGS 468 12.3 PHOTOINDUCED SECOND HARMONIC (X (2) ) GRATINGS IN
FIBERS 468 12.4 ELECTRIC FIELD POLING OF GLASS 470 13 FEEDBACK OF
LIGHTGUIDE RESULTS TO GLASS SCIENCE 471 14 REFERENCES 471
MICROSTRUCTURE, SURFACE CHEMISTRY, AND PROPERTIES OF SILICA GELS . . .
475 C. J. BRINKER, W. L. WARREN AND S. WALLACE 1 SOL-GEL PROCESSING 475
2 HIGH SURFACE AREA SILICA GELS 477 XVI CONTENTS 3 UNIQUE PROPERTIES OF
HIGH SURFACE AREA, BULK SOL-GEL SILICA AS COMPARED WITH AMORPHOUS SILICA
479 4 THREE-MEMBERED RINGS IN SOL-GEL GLASSES 480 5 CONSEQUENCES OF
THREE-MEMBERED RINGS 482 5.1 ENHANCED SURFACE REACTIVITY 482 5.2
ENHANCED DEFECT CREATION 484 5.3 MEMBRANES 485 6 SOL-GEL THIN FILMS 486
6.1 INTRODUCTION 486 6.2 SOL-GEL FILM DEPOSITION 486 6.3 CONTROL OF
MICROSTRUCTURE 488 6.4 DENSE INSULATING FILMS ON SI 489 6.5 POROUS
SOL-GEL FILMS 490 7 SUMMARY 491 7.1 BULK GELS 491 7.2 THIN FILMS 491 8
ACKNOWLEDGMENTS 491 9 REFERENCES 491 INDEX 495
|
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| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV013298362 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:43:20Z |
| institution | BVB |
| isbn | 0471975362 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009066064 |
| oclc_num | 246596547 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | XXII, 505 S. graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Wiley |
| record_format | marc |
| spelling | Structure and imperfections in amorphous and crystalline silicon dioxide ed. by R. A. B. Devine ... Chichester [u.a.] Wiley 2000 XXII, 505 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Siliciumdioxid - Kristallstruktur Silica Siliciumdioxid (DE-588)4077447-8 gnd rswk-swf Siliciumdioxid (DE-588)4077447-8 s DE-604 Devine, Roderick A. B. Sonstige oth GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009066064&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Structure and imperfections in amorphous and crystalline silicon dioxide Siliciumdioxid - Kristallstruktur Silica Siliciumdioxid (DE-588)4077447-8 gnd |
| subject_GND | (DE-588)4077447-8 |
| title | Structure and imperfections in amorphous and crystalline silicon dioxide |
| title_auth | Structure and imperfections in amorphous and crystalline silicon dioxide |
| title_exact_search | Structure and imperfections in amorphous and crystalline silicon dioxide |
| title_full | Structure and imperfections in amorphous and crystalline silicon dioxide ed. by R. A. B. Devine ... |
| title_fullStr | Structure and imperfections in amorphous and crystalline silicon dioxide ed. by R. A. B. Devine ... |
| title_full_unstemmed | Structure and imperfections in amorphous and crystalline silicon dioxide ed. by R. A. B. Devine ... |
| title_short | Structure and imperfections in amorphous and crystalline silicon dioxide |
| title_sort | structure and imperfections in amorphous and crystalline silicon dioxide |
| topic | Siliciumdioxid - Kristallstruktur Silica Siliciumdioxid (DE-588)4077447-8 gnd |
| topic_facet | Siliciumdioxid - Kristallstruktur Silica Siliciumdioxid |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009066064&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT devineroderickab structureandimperfectionsinamorphousandcrystallinesilicondioxide |