Automated optical inspection for industry: theory, technology, and applications II: 16 - 19 September 1998 Beijing, China
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1998
|
| Schriftenreihe: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
3558 |
| Schlagworte: | |
| Beschreibung: | XIII, 656 S. Ill., graph. Darst. |
| ISBN: | 0819430196 |
Internformat
MARC
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| 245 | 1 | 0 | |a Automated optical inspection for industry: theory, technology, and applications II |b 16 - 19 September 1998 Beijing, China |c Shenghua Ye chair/ed. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1998 | |
| 300 | |a XIII, 656 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 1 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 3558 | |
| 650 | 4 | |a Engineering inspection |x Automation |v Congresses | |
| 650 | 4 | |a Optical detectors |x Industrial applications |v Congresses | |
| 650 | 4 | |a Optical measurements |v Congresses | |
| 650 | 4 | |a Quality control |x Optical methods |x Automation |v Congresses | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1998 |z Peking |2 gnd-content | |
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| 700 | 1 | |a Ye, Shenghua |e Sonstige |4 oth | |
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Datensatz im Suchindex
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|---|---|
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| building | Verbundindex |
| bvnumber | BV013278907 |
| callnumber-first | T - Technology |
| callnumber-label | TA1505 |
| callnumber-raw | TA1505 TS156.2 |
| callnumber-search | TA1505 TS156.2 |
| callnumber-sort | TA 41505 |
| callnumber-subject | TA - General and Civil Engineering |
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| dewey-ones | 670 - Manufacturing |
| dewey-raw | 670.42/5 |
| dewey-search | 670.42/5 |
| dewey-sort | 3670.42 15 |
| dewey-tens | 670 - Manufacturing |
| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1998 Peking gnd-content |
| genre_facet | Konferenzschrift 1998 Peking |
| id | DE-604.BV013278907 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:43:01Z |
| institution | BVB |
| isbn | 0819430196 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009053621 |
| oclc_num | 39740241 |
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| physical | XIII, 656 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | SPIE |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China Shenghua Ye chair/ed. Bellingham, Wash. SPIE 1998 XIII, 656 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3558 Engineering inspection Automation Congresses Optical detectors Industrial applications Congresses Optical measurements Congresses Quality control Optical methods Automation Congresses Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 Peking gnd-content Optische Messtechnik (DE-588)4172667-4 s DE-604 Ye, Shenghua Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3558 (DE-604)BV000010887 3558 |
| spellingShingle | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE Engineering inspection Automation Congresses Optical detectors Industrial applications Congresses Optical measurements Congresses Quality control Optical methods Automation Congresses Optische Messtechnik (DE-588)4172667-4 gnd |
| subject_GND | (DE-588)4172667-4 (DE-588)1071861417 |
| title | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China |
| title_auth | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China |
| title_exact_search | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China |
| title_full | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China Shenghua Ye chair/ed. |
| title_fullStr | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China Shenghua Ye chair/ed. |
| title_full_unstemmed | Automated optical inspection for industry: theory, technology, and applications II 16 - 19 September 1998 Beijing, China Shenghua Ye chair/ed. |
| title_short | Automated optical inspection for industry: theory, technology, and applications II |
| title_sort | automated optical inspection for industry theory technology and applications ii 16 19 september 1998 beijing china |
| title_sub | 16 - 19 September 1998 Beijing, China |
| topic | Engineering inspection Automation Congresses Optical detectors Industrial applications Congresses Optical measurements Congresses Quality control Optical methods Automation Congresses Optische Messtechnik (DE-588)4172667-4 gnd |
| topic_facet | Engineering inspection Automation Congresses Optical detectors Industrial applications Congresses Optical measurements Congresses Quality control Optical methods Automation Congresses Optische Messtechnik Konferenzschrift 1998 Peking |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT yeshenghua automatedopticalinspectionforindustrytheorytechnologyandapplicationsii1619september1998beijingchina |