Materials reliability in microelectronics VI: symposium held April 8 - 12, 1996, San Francisco, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Soc.
1996
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
428 |
| Schlagworte: | |
| Beschreibung: | XV, 583 S. Ill., graph. Darst. |
| ISBN: | 1558993312 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013220210 | ||
| 003 | DE-604 | ||
| 005 | 20030903 | ||
| 007 | t | ||
| 008 | 000627s1996 ad|| |||| 00||| eng d | ||
| 020 | |a 1558993312 |9 1-55899-331-2 | ||
| 035 | |a (OCoLC)36213786 | ||
| 035 | |a (DE-599)BVBBV013220210 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-29T |a DE-11 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.381 |b M4182, 1996 |2 21 | |
| 084 | |a UD 8400 |0 (DE-625)145545: |2 rvk | ||
| 084 | |a UQ 1100 |0 (DE-625)146473: |2 rvk | ||
| 084 | |a UX 2150 |0 (DE-625)146948: |2 rvk | ||
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 245 | 1 | 0 | |a Materials reliability in microelectronics VI |b symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. |c ed.: William F. Filter ... |
| 264 | 1 | |a Pittsburgh, Pa. |b Materials Research Soc. |c 1996 | |
| 300 | |a XV, 583 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 428 | |
| 650 | 4 | |a Metallizing |v Congresses | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Microelectronics |x Reliability |v Congresses | |
| 650 | 4 | |a Microstructure |v Congresses | |
| 650 | 0 | 7 | |a Mikrostruktur |0 (DE-588)4131028-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1996 |z San Francisco Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Mikrostruktur |0 (DE-588)4131028-7 |D s |
| 689 | 0 | 2 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Filter, William F. |e Sonstige |4 oth | |
| 830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings |v 428 |w (DE-604)BV001899105 |9 428 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009007996 | ||
Datensatz im Suchindex
| _version_ | 1804127977214050304 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013220210 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UD 8400 UQ 1100 UX 2150 ZN 4040 |
| ctrlnum | (OCoLC)36213786 (DE-599)BVBBV013220210 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01984nam a2200493 cb4500</leader><controlfield tag="001">BV013220210</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20030903 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000627s1996 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1558993312</subfield><subfield code="9">1-55899-331-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)36213786</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013220210</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="b">M4182, 1996</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UD 8400</subfield><subfield code="0">(DE-625)145545:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 1100</subfield><subfield code="0">(DE-625)146473:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UX 2150</subfield><subfield code="0">(DE-625)146948:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Materials reliability in microelectronics VI</subfield><subfield code="b">symposium held April 8 - 12, 1996, San Francisco, California, U.S.A.</subfield><subfield code="c">ed.: William F. Filter ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pittsburgh, Pa.</subfield><subfield code="b">Materials Research Soc.</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 583 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">428</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metallizing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microstructure</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikrostruktur</subfield><subfield code="0">(DE-588)4131028-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1996</subfield><subfield code="z">San Francisco Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikrostruktur</subfield><subfield code="0">(DE-588)4131028-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Filter, William F.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">428</subfield><subfield code="w">(DE-604)BV001899105</subfield><subfield code="9">428</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009007996</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1996 San Francisco Calif. gnd-content |
| genre_facet | Konferenzschrift 1996 San Francisco Calif. |
| id | DE-604.BV013220210 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:41:55Z |
| institution | BVB |
| isbn | 1558993312 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009007996 |
| oclc_num | 36213786 |
| open_access_boolean | |
| owner | DE-703 DE-29T DE-11 |
| owner_facet | DE-703 DE-29T DE-11 |
| physical | XV, 583 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings |
| series2 | Materials Research Society: Materials Research Society symposia proceedings |
| spelling | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. ed.: William F. Filter ... Pittsburgh, Pa. Materials Research Soc. 1996 XV, 583 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 428 Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 San Francisco Calif. gnd-content Mikroelektronik (DE-588)4039207-7 s Mikrostruktur (DE-588)4131028-7 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Filter, William F. Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 428 (DE-604)BV001899105 428 |
| spellingShingle | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. Materials Research Society: Materials Research Society symposia proceedings Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Mikrostruktur (DE-588)4131028-7 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4131028-7 (DE-588)4059245-5 (DE-588)4039207-7 (DE-588)1071861417 |
| title | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. |
| title_auth | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. |
| title_exact_search | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. |
| title_full | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. ed.: William F. Filter ... |
| title_fullStr | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. ed.: William F. Filter ... |
| title_full_unstemmed | Materials reliability in microelectronics VI symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. ed.: William F. Filter ... |
| title_short | Materials reliability in microelectronics VI |
| title_sort | materials reliability in microelectronics vi symposium held april 8 12 1996 san francisco california u s a |
| title_sub | symposium held April 8 - 12, 1996, San Francisco, California, U.S.A. |
| topic | Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Mikrostruktur (DE-588)4131028-7 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Metallizing Congresses Microelectronics Materials Testing Congresses Microelectronics Reliability Congresses Microstructure Congresses Mikrostruktur Zuverlässigkeit Mikroelektronik Konferenzschrift 1996 San Francisco Calif. |
| volume_link | (DE-604)BV001899105 |
| work_keys_str_mv | AT filterwilliamf materialsreliabilityinmicroelectronicsvisymposiumheldapril8121996sanfranciscocaliforniausa |