Topics in electron diffraction and microscopy of materials:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Bristol [u.a.]
Inst. of Physics Publ.
1999
|
Schriftenreihe: | Microscopy in materials science series
|
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | XII, 196 S. Ill., graph. Darst. |
ISBN: | 075030538X |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV013188655 | ||
003 | DE-604 | ||
005 | 20090717 | ||
007 | t | ||
008 | 000607s1999 ad|| |||| 00||| eng d | ||
020 | |a 075030538X |9 0-7503-0538-X | ||
035 | |a (OCoLC)41285053 | ||
035 | |a (DE-599)BVBBV013188655 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-703 |a DE-355 |a DE-634 |a DE-11 | ||
050 | 0 | |a QC793.5.E628 | |
082 | 0 | |a 502/.8/25 |2 21 | |
084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
084 | |a UQ 5500 |0 (DE-625)146526: |2 rvk | ||
245 | 1 | 0 | |a Topics in electron diffraction and microscopy of materials |c P. B. Hirsch |
264 | 1 | |a Bristol [u.a.] |b Inst. of Physics Publ. |c 1999 | |
300 | |a XII, 196 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Microscopy in materials science series | |
600 | 1 | 4 | |a Whelan, M. J |
650 | 7 | |a Metalografia |2 larpcal | |
650 | 7 | |a Microscopia eletronica |2 larpcal | |
650 | 7 | |a Électrons - Diffraction |2 ram | |
650 | 4 | |a Electron microscopy | |
650 | 4 | |a Electrons |x Diffraction | |
650 | 0 | 7 | |a Elektronenbeugung |0 (DE-588)4151862-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronenbeugung |0 (DE-588)4151862-7 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Hirsch, Peter B. |d 1925- |e Sonstige |0 (DE-588)124650880 |4 oth | |
856 | 4 | 2 | |m Digitalisierung UB Regensburg |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008987309&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-008987309 |
Datensatz im Suchindex
_version_ | 1804127891255984128 |
---|---|
adam_text | CONTENTS
Foreword
Frontispiece
Preface
Authors addresses
1
microscopy
Ρ Β
1.1
1.2
1.3
on stainless steel
1.4
1.5
early applications
1.6
1.7
References
2
David
16
19
23
24
25
26
26
27
29
30
31
32
2.1
Introduction
2.2
Dislocation dissociation
2.3
Complex dislocation geometries
2.4
Small regions of stacking faults
2.5
Invisibility criteria
2.6
Strained inclusions
2.7
Misfit dislocations
2.8
Weak beam defect analysis
2.9
Superlattice
2.10
Planar defects
2.11
Conclusions
References
vi
3
Alec
References
4
resolution electron microscopy of crystals
Ή
4.1
4.2
4.3
4.4
4.5
4.6
References
5
Colin
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
References
Interpretation of spatially resolved valence loss spectra
A Howie
6.1
6.2
6.3
6.4
6.5
6.6
6.7
Contents
6.8
methods
6.9
References
7
J C H
7.1
7.2
7.3
7.4
7.5
7.6
References
8
and applications
■S L Dudarev
8.1
8.2
8.3
8.4
8.5
8.6
8.7
8.8
References
9
to the in situ monitoring of MBE growth
Lian
9.1
9.2
9.3
9.4
9.5
9.6
References
Index
|
any_adam_object | 1 |
author_GND | (DE-588)124650880 |
building | Verbundindex |
bvnumber | BV013188655 |
callnumber-first | Q - Science |
callnumber-label | QC793 |
callnumber-raw | QC793.5.E628 |
callnumber-search | QC793.5.E628 |
callnumber-sort | QC 3793.5 E628 |
callnumber-subject | QC - Physics |
classification_rvk | UH 6300 UQ 5500 |
ctrlnum | (OCoLC)41285053 (DE-599)BVBBV013188655 |
dewey-full | 502/.8/25 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8/25 |
dewey-search | 502/.8/25 |
dewey-sort | 3502 18 225 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01796nam a2200469 c 4500</leader><controlfield tag="001">BV013188655</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090717 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000607s1999 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">075030538X</subfield><subfield code="9">0-7503-0538-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)41285053</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013188655</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC793.5.E628</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5500</subfield><subfield code="0">(DE-625)146526:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Topics in electron diffraction and microscopy of materials</subfield><subfield code="c">P. B. Hirsch</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bristol [u.a.]</subfield><subfield code="b">Inst. of Physics Publ.</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 196 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Microscopy in materials science series</subfield></datafield><datafield tag="600" ind1="1" ind2="4"><subfield code="a">Whelan, M. J</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Metalografia</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopia eletronica</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Électrons - Diffraction</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrons</subfield><subfield code="x">Diffraction</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hirsch, Peter B.</subfield><subfield code="d">1925-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)124650880</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Regensburg</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008987309&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008987309</subfield></datafield></record></collection> |
id | DE-604.BV013188655 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:40:33Z |
institution | BVB |
isbn | 075030538X |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008987309 |
oclc_num | 41285053 |
open_access_boolean | |
owner | DE-703 DE-355 DE-BY-UBR DE-634 DE-11 |
owner_facet | DE-703 DE-355 DE-BY-UBR DE-634 DE-11 |
physical | XII, 196 S. Ill., graph. Darst. |
publishDate | 1999 |
publishDateSearch | 1999 |
publishDateSort | 1999 |
publisher | Inst. of Physics Publ. |
record_format | marc |
series2 | Microscopy in materials science series |
spelling | Topics in electron diffraction and microscopy of materials P. B. Hirsch Bristol [u.a.] Inst. of Physics Publ. 1999 XII, 196 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microscopy in materials science series Whelan, M. J Metalografia larpcal Microscopia eletronica larpcal Électrons - Diffraction ram Electron microscopy Electrons Diffraction Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Hirsch, Peter B. 1925- Sonstige (DE-588)124650880 oth Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008987309&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Topics in electron diffraction and microscopy of materials Whelan, M. J Metalografia larpcal Microscopia eletronica larpcal Électrons - Diffraction ram Electron microscopy Electrons Diffraction Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4151862-7 (DE-588)4014327-2 |
title | Topics in electron diffraction and microscopy of materials |
title_auth | Topics in electron diffraction and microscopy of materials |
title_exact_search | Topics in electron diffraction and microscopy of materials |
title_full | Topics in electron diffraction and microscopy of materials P. B. Hirsch |
title_fullStr | Topics in electron diffraction and microscopy of materials P. B. Hirsch |
title_full_unstemmed | Topics in electron diffraction and microscopy of materials P. B. Hirsch |
title_short | Topics in electron diffraction and microscopy of materials |
title_sort | topics in electron diffraction and microscopy of materials |
topic | Whelan, M. J Metalografia larpcal Microscopia eletronica larpcal Électrons - Diffraction ram Electron microscopy Electrons Diffraction Elektronenbeugung (DE-588)4151862-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | Whelan, M. J Metalografia Microscopia eletronica Électrons - Diffraction Electron microscopy Electrons Diffraction Elektronenbeugung Elektronenmikroskopie |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008987309&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT hirschpeterb topicsinelectrondiffractionandmicroscopyofmaterials |